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Email: jpare-at-emory.edu Name: Jeff Pare
Organization: Emory University\Yerkes National Primate Center
Title-Subject: [Filtered] SBF/SEM
Message: Good morning everybody. Happy New Year to all! I am a lab supervisor at Yerkes and we are using a company to perform "serial face block scanning electron microscopy" of brain tissue. We are interested in finding other companies who perform that type of work. Do you know of groups or companies that do SBF/SEM? If so please contact me at jpare-at-emory.edu
Thanks
Jeff
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Message: If you still have the 1988 Proceedings, may I ask you to do me a favour, please, and scan the following abstract by Dr. Gordon W. Ellis who is no longer alive:
We have multiple open positions in the NUANCE Center here at Northwestern University. Please see brief position descriptions and application info below. Feel free to reach out if you want more information and please forward to anyone who may be interested.
Regards, Ben
1. SEM Facility Manager The SEM Facility Manager is responsible for all aspects of the SEM/FIB Facility. This includes: equipment purchasing, upgrades and maintenance; supervision of Microscopy and Imaging Specialist; user training and technical support on all SEM instruments and related equipment; course development and teaching of laboratory components of SEM related courses; development of new analytical techniques and capabilities; providing analytical services for both internal NU and external industrial clients; conducting facility tours and demonstrations. In addition, this position has primary technical responsibility for the dual-beam Focused Ion Beam (FIB) instrument and assists in sample preparation for all electron microscopy, including Transmission Electron Microscopy (TEM).
MS/PhD, 4-5+ years hands-on characterization experience (post-degree) and 2+ years facility management/user training experience preferred.
2. TEM Facility Manager The TEM Facility Manager is responsible for training and assisting users on conventional and advanced Scanning-Transmission and Transmission Electron Microscopy (S/TEM), facilitating laboratory sessions for microscopy courses, and conducting analysis and characterization using advanced electron microscopes.
The successful candidate will develop an informed and well-trained user base in advanced microscopy and related sample preparation and characterization instruments. The incumbent will participate in user training, hands-on assistance, development of professional and short-courses, and overall facility development. Essential to the success of this position is enhancing both the visibility and advanced utilization of the S/TEM instruments to promote scholarly activities among the faculty, student and staff user base.
The selected candidate will regularly operate conventional and advanced S/TEM analysis, consult and collaborate with users on experiment design & research in electron microscopy, sample preparation and general lab equipment. There are ample opportunities for independent and collaborative research utilizing advanced S/TEM. With the recent installation of an advanced aberration-corrected S/TEM instrument, prior experience with AC-S/TEM is desirable, but not required.
Materials should be submitted as a single PDF to mailto:nuance-at-northwestern.edu. Complete applications will include: Introduction letter, Curriculum Vitae, Statement of plans for research (3 to 5 pages), Contact information for three references (names, postal & email addresses, phone number).
3. TEM Postdoctoral Research Associate Under supervision of Dr. Xiaobing Hu, the selected candidate will develop advanced TEM applications and in-situ TEM methods on various materials system including engineering alloys, battery materials, thermoelectric materials and organic perovskite solar cells. The incumbent will oversee training of NUANCE users and collaborate with many excellent research groups in the department of Material Science and Engineering and Chemistry. As there will be ample opportunity to publish in top journals and assist in writing research and equipment proposals, the candidate must have excellent written and oral communication skills.
Research - Work closely with TEM manager to design and implement research methods in support of advanced materials research projects. Training - Design and implement training curriculum for new, intermediate and advanced TEM users (students, postdocs, research staff). Collaboration - Work with other faculty groups to design and implement TEM experiements specific to their research needs.
Applicants should send as a single PDF, 1. introduction letter (including research goals), 2. CV, 3. three references to Dr. Xiaobing Hu (mailto:xbhu-at-northwestern.edu).
----------------------------------------------------------------------------------------------------------- Ben Myers, PhD
Director of Operations SHyNE Resource, NUANCE Center
Northwestern University 2220 Campus Dr. Evanston, IL 60208 (847) 467-1081 shyne.northwestern.edu
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Email: unocicrr-at-ornl.gov Name: Ray Unocic
Organization: Oak Ridge National Laboratory
Title-Subject: [Filtered] Postdoctoral Position at ORNL on in situ microscopy/atomic manipulation
We are seeking a Postdoctoral Research Associate to support the development and application of directed atomic manipulation of materials using aberration corrected scanning transmission electron microscopy (STEM). The specific focus of your research will be to understand and control electron beam interactions to understand factors that will guide the directed fabrication and atomic manipulation of 1D, 2D, and 3D materials. You will contribute to the development of novel electron beam scan control and feedback strategies, perform in situ microscopy experiments under controlled environmental conditions and as a function of external stimuli, and you will work closely with Oak Ridge National Laboratory (ORNL) scientists on materials characterization, synthesis, and theory to experimentally validate predictive models. You will also collaborate with machine learning experts at ORNL to provide experimental data input.
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Email: mcconkie.thomas-at-gmail.com Name: Thomas McConkie
Organization: The Design Knowledge Company
Title-Subject: [Filtered] SEM simulation programs.
Message: I am looking for either opensource or for purchase SEM simulation programs. I am not looking for a virtual SEM for training but one that I can use to create theoretical images from known substrate patterns of varying materials like integrated circuits. I am new to the simulation SEM field and any information would be helpful.
Thank you.
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Email: roger.ristau-at-uconn.edu Name: Roger Ristau
Organization: University of Connecticut
Title-Subject: [Filtered] TEM apertures
Message: While describing the operation of the TEM to students, I note that all the conventional textbooks depict the objective aperture as below the objective lens, that is, they show the sequence in ray diagrams as: specimen, lower objective lens, objective aperture coincident with the back focal plane. The problem is that the objective aperture is phycically located above the lower objective lens in our TEM: i.e. specimen, objective aperture, lower objective lens. The thing I can't get my head around is how the back focal plane can be coincident with the objective lens in the second case? Or is this a case of a virtual aperture?
Confused in Connecticut
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Email: info-at-bpi.de Name: Susanne Wolf
Organization: Bavarian Polymer Institute
Title-Subject: [Filtered] Job Offer, University of Bayreuth, Bavarian Polymer Institute
Message: Dear All,
In the KeyLab "Electron and Optical Microscopy" of the Bavarian Polymer Institute of the University of Bayreuth, the following full-time position is to be filled as soon as possible, initially for a limited period:
Research Associate For the future Director of Electron Microscopy pay grade: 13 TV-L (100%)
Application Deadline: 15. February 2019
If you are interested, you can find more information at:
The OL is essentially an immersion lens; focusing occurs over an extended region between the top and bottom pole pieces that contains the specimen. The top pole piece contributes to forming parallel illumination on the specimen, and a crossover occurs above the lower pole piece, so an objective aperture can be situated below the specimen plane, but above the lower pole piece. A second crossover occurs below the OL, so our JEOL has apertures both within the lens and below the lens.
I wish the apertures were closer to the true back focal plane(s), though. They tend to limit the field of view at low magnifications.
-Phil -----Original Message----- X-from: microscopy.listserver-at-gmail.com {microscopy.listserver-at-gmail.com} Sent: Tuesday, January 8, 2019 4:29 PM To: Ahrenkiel, Phil {Phil.Ahrenkiel-at-sdsmt.edu}
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Email: roger.ristau-at-uconn.edu Name: Roger Ristau
Organization: University of Connecticut
Title-Subject: [Filtered] TEM apertures
Message: While describing the operation of the TEM to students, I note that all the conventional textbooks depict the objective aperture as below the objective lens, that is, they show the sequence in ray diagrams as: specimen, lower objective lens, objective aperture coincident with the back focal plane. The problem is that the objective aperture is phycically located above the lower objective lens in our TEM: i.e. specimen, objective aperture, lower objective lens. The thing I can't get my head around is how the back focal plane can be coincident with the objective lens in the second case? Or is this a case of a virtual aperture?
Confused in Connecticut
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Email: Ursel.Bangert-at-ul.ie Name: Ursel Bangert
Organization: Bernal Institute, University of Limerick
Title-Subject: [Filtered] Instrument Scientist (Electron Microscopy) position
Message: We have a job vacancy for an Instrument Scientist in Electron Microscopy at UL (see below), and we would appreciate very much if you could bring this to the attention of people (in your institution or elsewhere) who might be interested, and generally spread the word.
Title: Instrument Scientist (Electron Microscopy)
Job Description: The Bernal Institute at UL requires an Instrument Scientist to support the research activities of the Institute with focus on the area of transmission electron microscopy. The Institute has a double aberration corrected, monochromated FEI Titan Cubed Themis TEM with analytical facilities (SuperEDX and QuantumEELS) and sample holders for in-situ TEM measurements under heating, biasing, in liquids and gases as well as under cryo-conditions. This Titan has furthermore an ultra-fast and-sensitive (K2-IS) camera, for ultra-high resolution as well as in-situ imaging and spectroscopic analysis of materials. Requirements: PhD in materials science/electron microscopy/chemistry/physics/ engineering or a related discipline OR equivalent experience in a research environment (equivalent 4 years fulltime research after primary degree). The full description and information for the position can be found at the following link : http://www.ul.ie/hrvacancies/ . For additional information contact Prof Ursel Bangert (ursel.bangert-at-ul.ie).
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The second objective aperture on JEOL microscopes with an ultra high resolution pole-piece is actually not below the lens, but is introduced through a hole drilled in the lower pole piece, substantially below the gap.
A. John Mardinly, Ph.D., P.E.
} On Jan 9, 2019, at 4:45 PM, Phil.Ahrenkiel-at-sdsmt.edu wrote: } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- https://urldefense.proofpoint.com/v2/url?u=http-3A__www.microscopy.com_MicroscopyListserver&d=DwIBAg&c=l45AxH-kUV29SRQusp9vYR0n1GycN4_2jInuKy6zbqQ&r=VLPJ8OE-c_C6joGeE1ftlvxMmQPq9N6mpKZONBRt90E&m=W6eM-3dTJ7K8KaqJ7YGk_RyEiyzil-bCp99PoJGDg-U&s=Wkw4zGKdXd5EvzLrjYnTIdyMvtQG3ziwgjAflAmS__Y&e= } On-Line Help https://urldefense.proofpoint.com/v2/url?u=http-3A__www.microscopy.com_MicroscopyListserver_FAQ.html&d=DwIBAg&c=l45AxH-kUV29SRQusp9vYR0n1GycN4_2jInuKy6zbqQ&r=VLPJ8OE-c_C6joGeE1ftlvxMmQPq9N6mpKZONBRt90E&m=W6eM-3dTJ7K8KaqJ7YGk_RyEiyzil-bCp99PoJGDg-U&s=z9T3ciafx2nXamEUVHaRA9rZWu6gXurtEMpglti3lvI&e= } ---------------------------------------------------------------------------- } } The OL is essentially an immersion lens; focusing occurs over an extended region between the top and bottom pole pieces that contains the specimen. The top pole piece contributes to forming parallel illumination on the specimen, and a crossover occurs above the lower pole piece, so an objective aperture can be situated below the specimen plane, but above the lower pole piece. A second crossover occurs below the OL, so our JEOL has apertures both within the lens and below the lens. } } I wish the apertures were closer to the true back focal plane(s), though. They tend to limit the field of view at low magnifications. } } -Phil } -----Original Message----- } X-from: microscopy.listserver-at-gmail.com {microscopy.listserver-at-gmail.com} } Sent: Tuesday, January 8, 2019 4:29 PM } To: Ahrenkiel, Phil {Phil.Ahrenkiel-at-sdsmt.edu} } Subject: [EXT] [Microscopy] viaWWW:TEM apertures } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America To Subscribe/Unsubscribe -- https://urldefense.proofpoint.com/v2/url?u=http-3A__www.microscopy.com_MicroscopyListserver&d=DwIBAg&c=l45AxH-kUV29SRQusp9vYR0n1GycN4_2jInuKy6zbqQ&r=VLPJ8OE-c_C6joGeE1ftlvxMmQPq9N6mpKZONBRt90E&m=W6eM-3dTJ7K8KaqJ7YGk_RyEiyzil-bCp99PoJGDg-U&s=Wkw4zGKdXd5EvzLrjYnTIdyMvtQG3ziwgjAflAmS__Y&e= } On-Line Help https://urldefense.proofpoint.com/v2/url?u=http-3A__www.microscopy.com_MicroscopyListserver_FAQ.html&d=DwIBAg&c=l45AxH-kUV29SRQusp9vYR0n1GycN4_2jInuKy6zbqQ&r=VLPJ8OE-c_C6joGeE1ftlvxMmQPq9N6mpKZONBRt90E&m=W6eM-3dTJ7K8KaqJ7YGk_RyEiyzil-bCp99PoJGDg-U&s=z9T3ciafx2nXamEUVHaRA9rZWu6gXurtEMpglti3lvI&e= } ---------------------------------------------------------------------------- } } } } } -------- Forwarded Message -------- } } } X-from: roger.ristau-at-uconn.edu } } } This Question/Comment was submitted to the Microscopy Listserver using the WWW based Form at https://urldefense.proofpoint.com/v2/url?u=http-3A__www.microscopy.com_MLFormMail.html&d=DwIBAg&c=l45AxH-kUV29SRQusp9vYR0n1GycN4_2jInuKy6zbqQ&r=VLPJ8OE-c_C6joGeE1ftlvxMmQPq9N6mpKZONBRt90E&m=W6eM-3dTJ7K8KaqJ7YGk_RyEiyzil-bCp99PoJGDg-U&s=Hq9CyOPyBmg97G5ClaRX4_LcZ5Ui3u18R0PCu05mXVc&e= } --------------------------------------------------------------------------- } Remember this posting is most likely not from a Subscriber, so when replying please copy to both } roger.ristau-at-uconn.edu, Microscopy-at-Microscopy.com so that all Microscopy Listserver Subscribers } can benefit from our collective wisdom } --------------------------------------------------------------------------- } } Email: roger.ristau-at-uconn.edu Name: Roger Ristau } } Organization: University of Connecticut } } Title-Subject: [Filtered] TEM apertures } } Message: While describing the operation of the TEM to students, I note that all the conventional textbooks depict the objective aperture as below the objective lens, that is, they show the sequence in ray diagrams as: specimen, lower objective lens, objective aperture coincident with the back focal plane. The problem is that the objective aperture is phycically located above the lower objective lens in our TEM: i.e. specimen, objective aperture, lower objective lens. } The thing I can't get my head around is how the back focal plane can be coincident with the objective lens in the second case? Or is this a case of a virtual aperture? } } Confused in Connecticut } } Login Host: 137.99.158.135 } Listserver Email Form V - 20120416 } --------------------------------------------------------------------------- } } } } ==============================Original Headers============================== } 16, 53 -- From microscopy.listserver-at-gmail.com Tue Jan 8 17:24:40 2019 16, 53 -- Received: from mail-io1-f50.google.com (mail-io1-f50.google.com [209.85.166.50]) } 16, 53 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x08NOe3u022178 } 16, 53 -- for {microscopy-at-microscopy.com} ; Tue, 8 Jan 2019 17:24:40 -0600 } 16, 53 -- Received: by mail-io1-f50.google.com with SMTP id c2so4555803iom.12 } 16, 53 -- for {microscopy-at-microscopy.com} ; Tue, 08 Jan 2019 15:31:02 -0800 (PST) } 16, 53 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 16, 53 -- d=gmail.com; s=20161025; } 16, 53 -- h=subject:references:to:from:message-id:date:user-agent:mime-version } 16, 53 -- :in-reply-to:content-language:content-transfer-encoding; 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Email: mike.toalson-at-elementpi.com Name: Mike Toalson
Organization: element Pi, LLC
Title-Subject: [Filtered] TEM sample for Outreach
Message: Would anyone be willing to donate a few prepared TEM samples like interesting tissue or bacteria or other cellular specimens ready for analysis? These would be used for educational outreach at the high school and undergrad level. They would need to work with STEM mode in a 30kV max SEM so tissue sections would need to be fairly thin.
Or does anyone know where you can buy such sample standards? None of the EM consumable suppliers seem to carry anything like this.
Any questions or to provide a few samples, please contact me.
Much Appreciated!!
Mike Toalson element Pi, LLC 833-314-1593
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does anyone have the manuals "A", "B" and "C" (user-manuals and alignment procedures) - preferably in German language or even electronic schematics of the ZEISS EM 109 transmission electron microscope available in PDF or can copy the manuals ? I would happily compensate for the costs...
Best wishes,
Stefan
--
----------------------------------------------------- Stefan Diller - Scientific Photography Arndtstrasse 22 D - 97072 Wuerzburg Germany ++49-931-7848700 Phone ++49-931-7848701 Fax ++49-175-7177051 Mobile
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Title-Subject: [Filtered] QMA 2019 abstract submission open
Message: Hello
Abstract submission for Quantitative Microanalysis 2019 is open! QMA 2019 is an MAS Topical Conference focused on topics related to quantitative microanalysis by wavelength-dispersive (WDS) and energy-dispersive (EDS) spectrometry.
The conference will be held June 24-27, 2019 at the University of Minnesota, Minneapolis. For a list of programmatic topics, registration, abstract template, and submission please visit our website: https://the-mas.org/events/topical-conferences/qma-2019/
We look forward to your contribution, QMA 2019 Organizing Committee
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We need a new stereomicroscope and I'm not current on what's available. Anyone with a recommendation?
I'd like: Apochromatic lenses, Trans illuminated base, Trinocular head and camera, something with good color and resolution, Computer software with easy file tracking, image processing, measurements and annotation, Magnification range from about 1 to100-ish X (with high NA objectives, of course).
We'd like if possible, fine focus as well as coarse, flat field, good mechanical stability.
I feel a little like that commercial where the neighbor ask his buddy to do all the leg work to hire a contractor. Sorry.
I'm very much open to responses from dealers.
Thanks in advance!
Stay safe...........
Frank Karl Microscopist Akron Rubber Development Laboratory 2887 Gilchrist Road Akron, Ohio 44305
Check out Mager Scientific - Nikon http://www.magersci.com/nikonmicroscopes/ and Nusbaum - Leica https://nuhsbaum.com/nuhsbaum-products/
They're the dealers for Nikon & Leica your (our) area, and both have what you're looking for. There are others, like Olympus https://www.olympus-lifescience.com/en/ and Zeiss, distributed in the Midwest by Lukas lukasmicroscope.com
Plus industrial inspection stereoscopes, but I don't have URLs handy for those.
Phil ------------- Philip Oshel Imaging Facility Director Biology Department 1304 Biosciences 1455 Calumet Ct. Central Michigan University Mt. Pleasant, MI 48859 989 774-3576 office 989 774-7567 lab
I always check to see what BidService has in pre-owned stereo scopes.
Get Outlook for iOS {https://aka.ms/o0ukef} ---------------------------------------------------------------------------------------------------- *From:* microscopy.listserver-at-gmail.com *Sent:* Wednesday, January 16, 2019 08:41 *To:* Basgall,Edward *Subject:* [Microscopy] Fwd: needs a new Stereomicroscope.................
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We need a new stereomicroscope and I'm not current on what's available. Anyone with a recommendation?
I'd like: Apochromatic lenses, Trans illuminated base, Trinocular head and camera, something with good color and resolution, Computer software with easy file tracking, image processing, measurements and annotation, Magnification range from about 1 to100-ish X (with high NA objectives, of course).
We'd like if possible, fine focus as well as coarse, flat field, good mechanical stability.
I feel a little like that commercial where the neighbor ask his buddy to do all the leg work to hire a contractor. Sorry.
I'm very much open to responses from dealers.
Thanks in advance!
Stay safe...........
Frank Karl Microscopist Akron Rubber Development Laboratory 2887 Gilchrist Road Akron, Ohio 44305
Hi Frank, If you want a branded one, get a quote from your local microscope sales rep (Leica, Olympus, Nikon or Carl Zeiss or other good companies which I would have missed out). You can google the company names and find the local reps contact in your area. There are other microscope dealers (like http://precisionmicroscopesales.com/index.php?route=product/category&path=59_63). With a few modifications and attachments, you can convert your bright field stereo microscope into a fluorescence microscope (eg. http://www.nightsea.com/. If you are not bothered too much on image resolution). Depends on what you are looking for. There is also the Echo Revolve (https://discover-echo.com/revolve) where you can use them as upright and inverted with bright field and fluorescence capability. You can also check out the adapters for microscope where you can convert a simple microscope into digital using your cell phone camera - https://novagrade.com/shop/phone-adapter-microscope-edition/ (Resolution is the criteria again). The range and price is so wide, it should be decided by what you want the microscope for. Ask the vendors to bring in and show how it can be applied for your use (You will be surprised by some of the features including the software - make sure if the images generated using the microscope software can be opened and annotated using other software and the cost for the full version - if a free version is available, support, etc.). No commercial interest and the order of the companies is nothing to do with the quality or my preference - I love all the microscopes from any vendor.
Good luck
Sathya Srinivasan Director Imaging and Morphology Support Core ONPRC Beaverton, OR 97006
On Wed, Jan 16, 2019 at 5:42 AM {microscopy.listserver-at-gmail.com {mailto:microscopy.listserver-at-gmail.com} } wrote:
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X-from: Frank Karl {frank_karl-at-ardl.com {mailto:frank_karl-at-ardl.com} }
We need a new stereomicroscope and I'm not current on what's available. Anyone with a recommendation?
I'd like: Apochromatic lenses, Trans illuminated base, Trinocular head and camera, something with good color and resolution, Computer software with easy file tracking, image processing, measurements and annotation, Magnification range from about 1 to100-ish X (with high NA objectives, of course).
We'd like if possible, fine focus as well as coarse, flat field, good mechanical stability.
I feel a little like that commercial where the neighbor ask his buddy to do all the leg work to hire a contractor. Sorry.
I'm very much open to responses from dealers.
Thanks in advance!
Stay safe...........
Frank Karl Microscopist Akron Rubber Development Laboratory 2887 Gilchrist Road Akron, Ohio 44305
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Email: mbrazil-at-vergason.com Name: Michael Brazil
Message: I have recently acquired a Hitachi S-570 SEM (1984 vintage). Scope works well, however it arrived missing the holder for the fixed objective aperture. Hitachi service does not offer these parts. If anyone is parting out a similar model, I'm a customer. If anyone has a such a scope, I would be grateful for careful measurements that would allow a machine shop to duplicate the holder.
Thanks,
Michael Brazil Senior Scientist Vergason Technology mbrazil-at-vergason.com
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Title-Subject: [Filtered] Paper submission for M&M 2019 Symposium P10: Microscopy and microanalysis techniques in characterizing natural and synthetic materials
Message: Dear colleagues, We would like to draw your attention to the following M&M 2019 session, August 4-8, 2019, Portland, Oregon: The submission portal is open! Submit your 2-page paper as soon as possible at https://www.microscopy.org/MandM/2019/. The deadline is Friday, February 15. M&M 2019 Symposium P10: Applications of integrated electron probe microscopy and microanalysis techniques in characterizing natural and synthetic materials
Description: Electron microbeam techniques, such as SEM/ESEM, EPMA and TEM/STEM, use a focused electron probe or a small parallel electron beam to bombard a specimen and generate signals at a scale from micrometer down to Angstrom level. These signals include secondary electron (SE), backscattered electron (BSE), characteristic X-ray, cathodoluminescence (CL), transmitted electron, diffracted or scattered electron, etc. Information acquired using these signals includes image, chemistry and crystal structure of a specimen at micrometer, nanometer and sub-Angstrom levels. We welcome contributions covering the entire range of electron probe microscopy and microanalysis of natural and synthetic materials, such as: Imaging from SE, BSE, X-ray, CL, charge contrast, transmitted electron, diffracted or scattered electron, etc. Qualitative and quantitative determination of chemistry of natural and synthetic materials Repeatability, reproducibility and compatibility of quantitative microanalysis standards Crystal structure determination using electron diffraction or electron backscattered diffraction (EBSD)
Feel free to share this information to other potentially interested colleagues. We are very much looking forward to seeing you in Portland, Oregon! Best Regards,
Organizers:
Donggao Zhao Email: zhaodo-at-umkc.edu Affiliation: University of Missouri-Kansas City Phone 1: 816-235-2072 (W) Phone 2: 803-732-6280 (M)
Minghua Ren Email: minghua.ren-at-unlv.edu Affiliation: University of Nevada, Las Vegas Phone 1: 702-774-1465 (W) Phone 2: 915-217-4392 (M)
Owen Neill Email: okneill-at-umich.edu Affiliation: University of Michigan Phone 1: 734-615-6657 (W) Phone 2: (207) 653-6331 (M)
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Email: fei.long-at-queensu.ca Name: Fei Long
Organization: Queen's University
Title-Subject: [Filtered] EDS mapping on bacteria cell embedded in epoxy resin
Message: I am trying to do EDS elemental analysis on microtome sesctioned bacteria cells embedded in epoxy resion with TEM at 200kV in STEM mode. However, the electron beam burn the sample instantly. Does anyone have good experience in doing chemical analysis on biology samples with TEM by EDX? Is there any irradiation resistant epoxy that I can use for the bacteria embedding? Lastly, if I cool the sample to low temperatures with liquid nitrogen by using a cooling holder in TEM, does it help to reduce the beam burning?
Any suggestions will be much appreciated!
Best,
Fei
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X-from: Gemming, Dr. Thomas {T.Gemming-at-ifw-dresden.de}
Dear Representatives of the (Electron) Microscopy Societies and otherwise involved microscopists,
please find attached the announcement of the Harald Rose Distinguished Lecture 2019 award of the German Society for Electron Microscopy. Please distribute the announcement within your society and interested colleagues. The application deadline is February 28th. The distinguished lecture will take place at the microscopy conference MC2019 in Berlin in the first week of September 2019.
Best regards and thank you for your help in spreading this announcement,
Thomas Gemming Executive secretary of the German Society for Electron Microscopy
Dr. Thomas Gemming Act. Director of Institute for Complex Materials Leibniz-Institut fr Festkrper- und Werkstoffforschung Dresden e.V. Helmholtzstr. 20, 01069 Dresden
In my experience, most of the epoxy resins designed for (ultra)microtomy are reasonably durable under electron beams, even up to 300kV. You didn't mention whether you are using a FEG or thermionic microscope, so I'm not exactly sure what mechanism might be causing the damage you are experiencing. With thermionic microscopes, you probably don't have enough current density in STEM mode to literally drill through your sample and most of the damage you are seeing is likely from charging. Coating your sample with a few angstroms or a nanometer of carbon can completely eliminate the charging and stabilize the sample. Sometimes you need to coat both sides with a particularly ornery sample.
For a FEG, you can easily have enough current density in STEM mode to sputter through your sample. You'll need to adjust your condenser illumination conditions and condenser aperture to reduce current density. If you're using reasonable settings that have worked well with previous similar samples, then the problem is probably charging. A small coating of carbon, as mentioned above, can eliminate that issue.
It's still possible that the epoxy used is not one recommended for electron microscopy. I'll let the more experienced microtomy and biological TEM people address those concerns.
Good luck, Chris
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However, the electron beam burn the sample instantly. } Does anyone have good experience in doing chemical analysis on biology samples with TEM by EDX? Is } there any irradiation resistant epoxy that I can use for the bacteria embedding? Lastly, if I cool } the sample to low temperatures with liquid nitrogen by using a cooling holder in TEM, does it help } to reduce the beam burning? } } Any suggestions will be much appreciated! } } Best, } } Fei } } Login Host: 142.169.78.78 } Listserver Email Form V - 20120416 } --------------------------------------------------------------------------- } } } } ==============================Original Headers============================== } 18, 53 -- From microscopy.listserver-at-gmail.com Fri Jan 18 05:10:13 2019 } 18, 53 -- Received: from mail-it1-f180.google.com (mail-it1-f180.google.com [209.85.166.180]) } 18, 53 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x0IBADcB031294 } 18, 53 -- for {microscopy-at-microscopy.com} ; Fri, 18 Jan 2019 05:10:13 -0600 } 18, 53 -- Received: by mail-it1-f180.google.com with SMTP id c9so5314199itj.1 } 18, 53 -- for {microscopy-at-microscopy.com} ; Fri, 18 Jan 2019 03:17:05 -0800 (PST) } 18, 53 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 18, 53 -- d=gmail.com; s=20161025; } 18, 53 -- h=subject:references:to:from:message-id:date:user-agent:mime-version } 18, 53 -- :in-reply-to:content-language:content-transfer-encoding; } 18, 53 -- bh=kSD2ndbREtoIAQZeG2abLeONM2tXrOIGKga0bCBN7lU=; } 18, 53 -- b=UhJ/kCzE8QzrtIGTfbRWv4NrNapDTlAa6Q1klhMGhuyQwakB2vXREqJpkhspQ9N+C5 } 18, 53 -- o34bWQSo/NdJg4Myjq+QhwW2XsimDiBFZ+y0YQQFEB9THQ1vJFebT506k+W5Vk+wZiV6 } 18, 53 -- 5j+x71oAAGZDT+1ktueGWL1Lp5ks2+SwhDquAw1jQhaCUF0a5UgmyBXfsA66awxx7P/X } 18, 53 -- moBXdHFxN9pKYXuBd3Ljs4JPj1mAz+WcgSQWWEUgYpmIYyF39ZdLk344m/DDM8sJBABY } 18, 53 -- xv5+pWDUwP4bLnZ/bi7v79zmDheCh9EXVBmBq3ocQvcKni0bse5ZxpF+CFWJVPpSp1wy } 18, 53 -- y6XA== } 18, 53 -- X-Google-DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 18, 53 -- d=1e100.net; s=20161025; } 18, 53 -- h=x-gm-message-state:subject:references:to:from:message-id:date } 18, 53 -- :user-agent:mime-version:in-reply-to:content-language } 18, 53 -- :content-transfer-encoding; } 18, 53 -- bh=kSD2ndbREtoIAQZeG2abLeONM2tXrOIGKga0bCBN7lU=; } 18, 53 -- b=LyyxNkRYgA9RiunM2zoO6pSnLodrb5AbHENA+NaEDALSk1uZ6HS4NdrG0KXmIsIRIk } 18, 53 -- CsMZ22ZkAMRjgflK5iKFBRRKrJysbes8CulRiJP54lmtu/4+/1PptC+BFjZACrUwU2ce } 18, 53 -- aMykM/UQLEJgN01e1d8l51KX3ZMdIeqhv7jrQ2JhPBgqnbPAUtZAmaI3IiRAlMLNVv/q } 18, 53 -- 8p5dZNYNUl+JBwvbz7hScPezRyTkxLz8ukQEOTevNY4IU6j8jmyH42Szk/LU0qPd+xoo } 18, 53 -- /OsNxCA7aayd0ken3qe5sFawwQ1ggzzGOfNIWtRPehEB9hcziO8gGCPinkrhNhf7hKMb } 18, 53 -- 9AHg== } 18, 53 -- X-Gm-Message-State: AJcUukesDR3H4Azq86Q7ASphVAxJxpUkly2bntB7SmccRWxsxgD2GIIL } 18, 53 -- 6l3IRFEsEZyhZKjJyK247oE3jSw0 } 18, 53 -- X-Google-Smtp-Source: ALg8bN7yTRcED2iYff7BkMsp65NgdvaJo16coTp/KM7z8xYJvO/mBwTx8b7QzhxG3Dhcc8mt9e4a4w== } 18, 53 -- X-Received: by 2002:a24:70d2:: with SMTP id f201mr10395381itc.127.1547810225381; } 18, 53 -- Fri, 18 Jan 2019 03:17:05 -0800 (PST) } 18, 53 -- Received: from 96-65-115-77-static.hfc.comcastbusiness.net ([2603:300a:f04:7100:595a:5ca1:6ede:1a88]) } 18, 53 -- by smtp.googlemail.com with ESMTPSA id m7sm1840209itk.38.2019.01.18.03.17.04 } 18, 53 -- for {microscopy-at-microscopy.com} } 18, 53 -- (version=TLS1_2 cipher=ECDHE-RSA-AES128-GCM-SHA256 bits=128/128); } 18, 53 -- Fri, 18 Jan 2019 03:17:04 -0800 (PST) } 18, 53 -- Subject: viaWWW:EDS mapping on bacteria cell embedded in epoxy resin } 18, 53 -- References: {201901171753.x0HHrEfF027061-at-microscopy.com} } 18, 53 -- To: MicroscopyListServer-Forward {microscopy-at-microscopy.com} } 18, 53 -- From: MIcroscopyListserver {microscopy.listserver-at-gmail.com} } 18, 53 -- X-Forwarded-Message-Id: {201901171753.x0HHrEfF027061-at-microscopy.com} } 18, 53 -- Message-ID: {b710e902-a2d2-f6bf-cc6f-0c0a20a8bf88-at-gmail.com} } 18, 53 -- Date: Fri, 18 Jan 2019 05:17:03 -0600 } 18, 53 -- User-Agent: Mozilla/5.0 (Macintosh; Intel Mac OS X 10.14; rv:60.0) } 18, 53 -- Gecko/20100101 Thunderbird/60.4.0 } 18, 53 -- MIME-Version: 1.0 } 18, 53 -- In-Reply-To: {201901171753.x0HHrEfF027061-at-microscopy.com} } 18, 53 -- Content-Type: text/plain; charset=windows-1252; format=flowed } 18, 53 -- Content-Language: en-US } 18, 53 -- Content-Transfer-Encoding: 7bit } ==============================End of - Headers==============================
From ralpzand8wo-at-gmail.com Fri Jan 18 10:47:23 2019 Return-Path: {ralpzand8wo-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.148] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x0IGlLvY004678 for {microscopylistserverarchive7-at-microscopy.com} ; Fri, 18 Jan 2019 10:47:22 -0600 Received: from [134.209.42.110] by mxs.perenter.com with NNFMP; Fri, 18 Jan 2019 14:43:22 -0200 Received: from unknown (148.244.134.221) by snmp.otwaloow.com with SMTP; Fri, 18 Jan 2019 14:23:46 -0200 Message-ID: {9660C8C9.D142AF3B-at-gmail.com}
Fei; There are several ways to reduce damage, but they come with reduced spatial resolution: 1) Reduce beam current (Spot size) and/or slightly defocus the beam. You will have less signal, requiring longer acquisition time and drift will be a factor. 2) Use a thicker section. Due to beam spreading, resolution may be reduced. 3) Cooling. Cold stages have inherently more drift. 4) Sputter a carbon or aluminum coating on the EXIT surface of the specimen. That will reduce charging and conduct heat away from the beam spot but will add some background to the spectra. 5) Some combination of the previous 4.
A. John Mardinly, Ph.D., P.E.
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However, the electron beam burn the sample instantly. } Does anyone have good experience in doing chemical analysis on biology samples with TEM by EDX? Is } there any irradiation resistant epoxy that I can use for the bacteria embedding? Lastly, if I cool } the sample to low temperatures with liquid nitrogen by using a cooling holder in TEM, does it help } to reduce the beam burning? } } Any suggestions will be much appreciated! } } Best, } } Fei } } Login Host: 142.169.78.78 } Listserver Email Form V - 20120416 } --------------------------------------------------------------------------- } } } } ==============================Original Headers============================== } 18, 53 -- From microscopy.listserver-at-gmail.com Fri Jan 18 05:10:13 2019 } 18, 53 -- Received: from mail-it1-f180.google.com (mail-it1-f180.google.com [209.85.166.180]) } 18, 53 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x0IBADcB031294 } 18, 53 -- for {microscopy-at-microscopy.com} ; Fri, 18 Jan 2019 05:10:13 -0600 } 18, 53 -- Received: by mail-it1-f180.google.com with SMTP id c9so5314199itj.1 } 18, 53 -- for {microscopy-at-microscopy.com} ; Fri, 18 Jan 2019 03:17:05 -0800 (PST) } 18, 53 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 18, 53 -- d=gmail.com; s=20161025; } 18, 53 -- h=subject:references:to:from:message-id:date:user-agent:mime-version } 18, 53 -- :in-reply-to:content-language:content-transfer-encoding; } 18, 53 -- bh=kSD2ndbREtoIAQZeG2abLeONM2tXrOIGKga0bCBN7lU=; } 18, 53 -- b=UhJ/kCzE8QzrtIGTfbRWv4NrNapDTlAa6Q1klhMGhuyQwakB2vXREqJpkhspQ9N+C5 } 18, 53 -- o34bWQSo/NdJg4Myjq+QhwW2XsimDiBFZ+y0YQQFEB9THQ1vJFebT506k+W5Vk+wZiV6 } 18, 53 -- 5j+x71oAAGZDT+1ktueGWL1Lp5ks2+SwhDquAw1jQhaCUF0a5UgmyBXfsA66awxx7P/X } 18, 53 -- moBXdHFxN9pKYXuBd3Ljs4JPj1mAz+WcgSQWWEUgYpmIYyF39ZdLk344m/DDM8sJBABY } 18, 53 -- xv5+pWDUwP4bLnZ/bi7v79zmDheCh9EXVBmBq3ocQvcKni0bse5ZxpF+CFWJVPpSp1wy } 18, 53 -- y6XA== } 18, 53 -- X-Google-DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 18, 53 -- d=1e100.net; s=20161025; } 18, 53 -- h=x-gm-message-state:subject:references:to:from:message-id:date } 18, 53 -- :user-agent:mime-version:in-reply-to:content-language } 18, 53 -- :content-transfer-encoding; } 18, 53 -- bh=kSD2ndbREtoIAQZeG2abLeONM2tXrOIGKga0bCBN7lU=; } 18, 53 -- b=LyyxNkRYgA9RiunM2zoO6pSnLodrb5AbHENA+NaEDALSk1uZ6HS4NdrG0KXmIsIRIk } 18, 53 -- CsMZ22ZkAMRjgflK5iKFBRRKrJysbes8CulRiJP54lmtu/4+/1PptC+BFjZACrUwU2ce } 18, 53 -- aMykM/UQLEJgN01e1d8l51KX3ZMdIeqhv7jrQ2JhPBgqnbPAUtZAmaI3IiRAlMLNVv/q } 18, 53 -- 8p5dZNYNUl+JBwvbz7hScPezRyTkxLz8ukQEOTevNY4IU6j8jmyH42Szk/LU0qPd+xoo } 18, 53 -- /OsNxCA7aayd0ken3qe5sFawwQ1ggzzGOfNIWtRPehEB9hcziO8gGCPinkrhNhf7hKMb } 18, 53 -- 9AHg== } 18, 53 -- X-Gm-Message-State: AJcUukesDR3H4Azq86Q7ASphVAxJxpUkly2bntB7SmccRWxsxgD2GIIL } 18, 53 -- 6l3IRFEsEZyhZKjJyK247oE3jSw0 } 18, 53 -- X-Google-Smtp-Source: ALg8bN7yTRcED2iYff7BkMsp65NgdvaJo16coTp/KM7z8xYJvO/mBwTx8b7QzhxG3Dhcc8mt9e4a4w== } 18, 53 -- X-Received: by 2002:a24:70d2:: with SMTP id f201mr10395381itc.127.1547810225381; } 18, 53 -- Fri, 18 Jan 2019 03:17:05 -0800 (PST) } 18, 53 -- Received: from 96-65-115-77-static.hfc.comcastbusiness.net ([2603:300a:f04:7100:595a:5ca1:6ede:1a88]) } 18, 53 -- by smtp.googlemail.com with ESMTPSA id m7sm1840209itk.38.2019.01.18.03.17.04 } 18, 53 -- for {microscopy-at-microscopy.com} } 18, 53 -- (version=TLS1_2 cipher=ECDHE-RSA-AES128-GCM-SHA256 bits=128/128); } 18, 53 -- Fri, 18 Jan 2019 03:17:04 -0800 (PST) } 18, 53 -- Subject: viaWWW:EDS mapping on bacteria cell embedded in epoxy resin } 18, 53 -- References: {201901171753.x0HHrEfF027061-at-microscopy.com} } 18, 53 -- To: MicroscopyListServer-Forward {microscopy-at-microscopy.com} } 18, 53 -- From: MIcroscopyListserver {microscopy.listserver-at-gmail.com} } 18, 53 -- X-Forwarded-Message-Id: {201901171753.x0HHrEfF027061-at-microscopy.com} } 18, 53 -- Message-ID: {b710e902-a2d2-f6bf-cc6f-0c0a20a8bf88-at-gmail.com} } 18, 53 -- Date: Fri, 18 Jan 2019 05:17:03 -0600 } 18, 53 -- User-Agent: Mozilla/5.0 (Macintosh; Intel Mac OS X 10.14; rv:60.0) } 18, 53 -- Gecko/20100101 Thunderbird/60.4.0 } 18, 53 -- MIME-Version: 1.0 } 18, 53 -- In-Reply-To: {201901171753.x0HHrEfF027061-at-microscopy.com} } 18, 53 -- Content-Type: text/plain; charset=windows-1252; format=flowed } 18, 53 -- Content-Language: en-US } 18, 53 -- Content-Transfer-Encoding: 7bit } ==============================End of - Headers==============================
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Email: jennifer.cookman-at-ul.ie Name: Jennifer
Organization: University of Limerick
Title-Subject: [Filtered] Installing GMS3 on Mac?
Message: Dear All,
I want to ask the community if anyone has tried to installed GMS3 on a Mac?
I have tried to use wine and brew to install the right components but GMS3 seems to be incompatible with Windows XP which is what wine is simulating.
Any help on this would be great! I do need the in situ portion of GMS3!
Best,
Jenn
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Email: elena.belluso-at-unito.it Name: Elena Belluso
Organization: I-University of Torino -Dept of Earth Sciences and "G. Scansetti" Interdepartmental Center for Studies on Asbestos and other Toxic Particulates,
Title-Subject: [Filtered] FROM ATOMIC- TO MICRO-SCALE PROCESSES: call for abstracts
Message: Dear Colleague, We are pleased to invite you to submit an abstract for an oral presentation (or a poster) to the session 4g MINERAL TRANSFORMATIONS IN MEDICAL AND ENVIRONMENTAL MINERALOGY: FROM ATOMIC- TO MICRO-SCALE PROCESSES at Goldschmidt 2019, the international conference on geochemistry and related subjects, scheduled from 18 to 23 August 2019 in Barcelona (E). The key-note speaker of the session is Mihly Psfai (University of Pannonia).
The purpose of this session is to spread the more recent investigations dealing with the relationship between minerals, environment, and human body.
This topic includes the study of naturally occurring minerals, their transformation in the environment and within the human body, and minerals synthesized by living organism themselves.
Thus, the session covers a broad interdisciplinary field positioned between geology, mineralogy, geochemistry, material science, and medicine.
Particular attention will be dedicated (but not limited) to contributions investigating the synthesis, transformation and function of minerals in the environment, in living organisms, and those minerals with an active role in human disease development.
This session welcomes contributions related to the study and the comprehension of the complex relationships occurring between natural or anthropogenic environments and different minerals.
Among various targets, this session aims to present the state-of-the-art in this multifaceted and complex topic and to develop interdisciplinary collaborations.
Note that the abstract deadline is March 29th (23:59 CET) (https://goldschmidt.info/2019/abstracts/instructions#who) We look forward to seeing you in Barcelona in August! With ours best wishes for the New Year, the convenors Elena Belluso (elena.belluso-at-unito.it) and Ruggero Vigliaturo (ruggero-at-sas.upenn.edu) PS The Goldschmidt Grant Program provides waived registration fees and travel support for early career delegates residents of specific countries and for US students. See at https://goldschmidt.info/2019/grants for details.
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I'm working with a student who has metal samples with a ~1um thick layer of amorphous silicon oxynitride on the surface, and they want to prepare cross section TEM samples. We have tried gluing the sample sandwich together with Epo-Tek 353ND (also known as Gatan G1) and MBond 610, and both stacks fell apart on cutting.
I assumed that the SiON layers were delaminating, but a visual inspection using the optical microscope convinced me this was not likely the underlying cause of the problem. Both epoxies used are not expired and were cured according to the manufacturer's cure schedule. I have had no issues with cross sections of other sample systems and these exact same epoxies, so I wonder if we need to use a different epoxy chemistry than these standards. Does anyone have experience with the SiON sample system? Is there a better epoxy to use, like Araldite? We would like to try to create a sample stack before giving up and switching to attempting tripod/wedge polishing.
We have launched a new online course on Transmission Electron Microscopy for Materials Science, by EPFL on the Coursera platform:
https://www.coursera.org/learn/microscopy
In this course, we provide a comprehensive introduction to TEM theory, including: - the instrument and its optics - the basics of electron diffraction and dynamical scattering - the theory of phase contrast imaging.
Built from the ground up, the course is intended to be a starting point for understanding and working with TEM; to be used either as a stand alone resource, or in complement to books and in person teaching or coaching. We hope that it proves useful to our electron microscopy community.
Course registration is open to all and can be made at any time. For any questions about the course either PM me directly or use the course forums.
With regards Duncan Alexander
EPFL-SB-IPHYS-LSME
==============================Original Headers============================== 7, 32 -- From duncan.alexander-at-epfl.ch Wed Jan 23 13:54:38 2019 7, 32 -- Received: from smtp4.epfl.ch (smtp4.epfl.ch [128.178.224.219]) 7, 32 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x0NJsbZG013482 7, 32 -- for {microscopy-at-microscopy.com} ; Wed, 23 Jan 2019 13:54:38 -0600 7, 32 -- Received: (qmail 38610 invoked by uid 107); 23 Jan 2019 20:01:47 -0000 7, 32 -- Received: from ax-snat-224-180.epfl.ch (HELO ewa09.intranet.epfl.ch) (192.168.224.180) (TLS, AES256-GCM-SHA384 cipher) 7, 32 -- by mail.epfl.ch (AngelmatoPhylax SMTP proxy) with ESMTPS; Wed, 23 Jan 2019 21:01:47 +0100 7, 32 -- X-EPFL-Auth: /3zp2ZrSb6IPNQtEl7KkU+xUyuefjgDRcQWFfu9GjVQE/X4LVcg= 7, 32 -- Received: from ewa01.intranet.epfl.ch (128.178.224.158) by 7, 32 -- ewa09.intranet.epfl.ch (128.178.224.180) with Microsoft SMTP Server 7, 32 -- (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_128_GCM_SHA256) id 7, 32 -- 15.1.1591.10; Wed, 23 Jan 2019 21:01:46 +0100 7, 32 -- Received: from ewa01.intranet.epfl.ch ([fe80::5832:f4e:2e6b:15dc]) by 7, 32 -- ewa01.intranet.epfl.ch ([fe80::5832:f4e:2e6b:15dc%3]) with mapi id 7, 32 -- 15.01.1591.008; Wed, 23 Jan 2019 21:01:46 +0100 7, 32 -- From: Duncan Alexander {duncan.alexander-at-epfl.ch} 7, 32 -- To: "Microscopy-at-microscopy.com" {Microscopy-at-microscopy.com} 7, 32 -- Subject: New online course on TEM 7, 32 -- Thread-Topic: New online course on TEM 7, 32 -- Thread-Index: AQHUs1Z4adLvyLUr4UqqoVyzkEsGoQ== 7, 32 -- Date: Wed, 23 Jan 2019 20:01:46 +0000 7, 32 -- Message-ID: {90B865DD-AB5E-4C5C-AA97-4AF469F124A8-at-epfl.ch} 7, 32 -- Accept-Language: en-GB, fr-CH, en-US 7, 32 -- Content-Language: en-US 7, 32 -- X-MS-Has-Attach: 7, 32 -- X-MS-TNEF-Correlator: 7, 32 -- x-originating-ip: [80.218.92.125] 7, 32 -- Content-Type: text/plain; charset="us-ascii" 7, 32 -- Content-ID: {6FF1CB06B1AC28469B1694AA96FA48DA-at-intranet.epfl.ch} 7, 32 -- MIME-Version: 1.0 7, 32 -- Content-Transfer-Encoding: 8bit 7, 32 -- X-MIME-Autoconverted: from quoted-printable to 8bit by microscopy.com id x0NJsbZG013482 ==============================End of - Headers==============================
Please consider submitting an abstract for our session on Quantitative Microscopy in Earth, Archaeological and Planetary Sciences at the Microscience Microscopy Congress (mmc2019) on July 4th 2019 in Manchester, UK. The deadline for submission is February 15th and we welcome contributions from as wide a field as possible in these disciplines.
Session description ******************************************************************* Quantitative microscopic investigation is critical for advancing our understanding of scientific problems today. Researchers have access to a broad range of analytical equipment including, but not limited to, light, electron and gas ion microscopy, secondary ion mass spectrometry, 3-D correlative microscopy, X-ray tomography and associated spectroscopic techniques. We invite presentations on examples from Earth, Planetary and Archaeological Sciences where novel microscopy techniques have beenused to help construct quantitative datasets preferably with practical outcomes and applications which advance scientific and/or technical understanding.
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Email: gcanzalo-at-mtu.edu Name: Jerry Anzalone
Organization: Michigan Tech
Title-Subject: [Filtered] Aberrations: Electron Optics
Message: Good day, Microscopists:
I'm developing an online SEM demonstrator/simulator as an instructional aid and have come to realize I know next to nothing about electron optics. Goldstein, et al., and others, make the categorical claim that minimizing the working distance yields a probe least affected by lens aberrations, yet the equation for the diameter of the spherical aberration disk of least confusion indicates the diameter increases as the cube of convergence angle. What am I missing?
While I understand the interaction volume is order(s) of magnitude larger than the beam, largely obviating the utility of calculating the effects of aberrations on probe diameter, I nonetheless wish to produce an accurate simulation, at least within an order of magnitude. Any assistance, including papers (that don't include triple integrals) is much appreciated. Ikea-like drawings might be best.
Cheers and thanks,
Jerry
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Topics Include: Electron Microscopy, Cryo-SIMS and SIMS Imaging, NanoSIMS, Atom Probe Tomography and Cryo-Spectroscopies
Chairs: Dr Paula Rakowska (National Physical Laboratory, UK) and Dr Kirsty MacLellan-Gibson (National Institute for Biological Standards and Control, UK).
Best Wishes,
Dr Anwen Bullen (on behalf of Dr MacLellan-Gibson)
I have summarized the replies I received regarding this issue below:
1. "Since the SiON is ~1umthick, top monolayers probably do not matter. I can suggest to try the following : 1. Plasma clean the sample just before applying epoxy. We are using 4-5 min of pure Ar at 50W forward RF with range 5W in our GATAN Solarus plasma cleaner. or 2. Sputter ~1-2 nm of Cr or Fe on the top surface before applying epoxy. We use GATAN PECS to do that. Sputtering with any reactive metal available in your lab, if Fe or Cr targets are not available, should also work."
2. Many are concerned the film is delaminating from the metal substrate. We should probably check this using the SEM, but we don't see any evidence of delamination in the optical microscope (when comparing failed glue specimen with pristine specimen).
3. Many suggested FIB. The student prefers a conventional xtem sample preparation to generate a larger electron transparent region than the FIB would provide, but if all else fails then we can fall back to the FIB.
4. "A simple suggestion that, perhaps, might work (this is how we work): Why don’t you inverse the order of operations? I mean: first, cut the small pieces and then, glue them as a sandwich. Hopefully, the glued pieces will hold together during the grinding steps. Good luck with the ion milling, afterwards."
5. "I have used Devcon 5-minute epoxy for many years on all sorts of samples with success. It is much more viscous than the other usual TEM epoxies but, you know, the sample is ready for the next step in 5 minutes..."
Thanks for all of your help!
Cheers, Chris
On Wed, Jan 23, 2019 at 2:30 PM {microwink-at-gmail.com} wrote: } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html } ---------------------------------------------------------------------------- } } Hello all, } } I'm working with a student who has metal samples with a ~1um thick } layer of amorphous silicon oxynitride on the surface, and they want to } prepare cross section TEM samples. We have tried gluing the sample } sandwich together with Epo-Tek 353ND (also known as Gatan G1) and } MBond 610, and both stacks fell apart on cutting. } } I assumed that the SiON layers were delaminating, but a visual } inspection using the optical microscope convinced me this was not } likely the underlying cause of the problem. Both epoxies used are not } expired and were cured according to the manufacturer's cure schedule. } I have had no issues with cross sections of other sample systems and } these exact same epoxies, so I wonder if we need to use a different } epoxy chemistry than these standards. Does anyone have experience with } the SiON sample system? Is there a better epoxy to use, like Araldite? } We would like to try to create a sample stack before giving up and } switching to attempting tripod/wedge polishing. } } Thanks for any advice, } Chris } } ==============================Original Headers============================== } 4, 39 -- From microwink-at-gmail.com Wed Jan 23 13:21:53 2019 } 4, 39 -- Received: from mail-wr1-f51.google.com (mail-wr1-f51.google.com [209.85.221.51]) } 4, 39 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x0NJLrhx005869 } 4, 39 -- for {Microscopy-at-microscopy.com} ; Wed, 23 Jan 2019 13:21:53 -0600 } 4, 39 -- Received: by mail-wr1-f51.google.com with SMTP id v13so3858423wrw.5 } 4, 39 -- for {Microscopy-at-microscopy.com} ; Wed, 23 Jan 2019 11:29:03 -0800 (PST) } 4, 39 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 4, 39 -- d=gmail.com; s=20161025; } 4, 39 -- h=mime-version:from:date:message-id:subject:to:cc; } 4, 39 -- bh=973WgAPuCv6b6NA2IaF1iEbj9rGKlO+JTHT92/PfQiI=; } 4, 39 -- b=LRqQUzYEXDPxHuj3MzcyI7uYMiK1lVbI6QeMAu+x0ttPnr23/IP7r/OEju1TKTFqAW } 4, 39 -- g1mKS4gjbvBX28DcsqY0iwVFO3gBvhbV7wlJL8doseWAW8Ejr3aO+eebc7C6mz1ogQbe } 4, 39 -- j9r+s3TZq6Ia0HpEfVs8E+Q+mplUIqmPnGVunMstNWiViLsAIol09WdOYXqpmzO7iu41 } 4, 39 -- jwRb/xw5k6y8GE/Z9uYBnThgyYju4Gvt5iRp1Ntd4dCHXiaXsHwg48KMllyIfu4QecDV } 4, 39 -- jwo7d9P1RzmO4R2TNO8G8aB2r2RT2MvAdUnGLdIqJVpQjF42xCTU3aCUGNhZcRGSIeXv } 4, 39 -- JqPg== } 4, 39 -- X-Google-DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 4, 39 -- d=1e100.net; s=20161025; } 4, 39 -- h=x-gm-message-state:mime-version:from:date:message-id:subject:to:cc; } 4, 39 -- bh=973WgAPuCv6b6NA2IaF1iEbj9rGKlO+JTHT92/PfQiI=; } 4, 39 -- b=pUGA2r1PE9dqxFjktsw2nRvpCUejTe+7qDgF5u6J0gfNi4MvlXJ1EXttONSfMPOkVG } 4, 39 -- IG1jOXWAwMW+afGhGGwZ5ewsNvdTCBU1rTcPeF6rF68jbftBtF/r/LqnNC4n5newm0q1 } 4, 39 -- H7lCpr8LGscXe+ldCqE/nCriGO0cwj6/khGGsaxu2qhrka5mCZ3G60uUhzEiT83wX04J } 4, 39 -- Dxn1Zc0CEUQpLa5PtLhF0MXP5vJTANtY98z+9lM/zD+tUhgPD6rK8hJIGJDs893YV/a7 } 4, 39 -- areABsts+DuV02WcshohYl4BlWTM1UFGmDyCGOzuqqgQbkmcA0IbVP44rNX0XcTqhAXb } 4, 39 -- j8hQ== } 4, 39 -- X-Gm-Message-State: AJcUukeSpxc+tUYu4PyGj5IUgVJu3jMSQJ6/g3TR5Prpddvq+WuHDzjW } 4, 39 -- ZyV98jmV5m0q2W3K9+A0vQ4oXl3NNDf3OyW49YHc9OHW } 4, 39 -- X-Google-Smtp-Source: ALg8bN7GjXUCJh7Zt3PCB2A4+s2YOKNpqHlf+fT8BvkEfwtu25QmOCUBe9zgVjDZIjQONRY18WQAfas4BZyBghtDnrA= } 4, 39 -- X-Received: by 2002:a5d:550f:: with SMTP id b15mr4235392wrv.330.1548271742333; } 4, 39 -- Wed, 23 Jan 2019 11:29:02 -0800 (PST) } 4, 39 -- MIME-Version: 1.0 } 4, 39 -- From: Christopher Winkler {microwink-at-gmail.com} } 4, 39 -- Date: Wed, 23 Jan 2019 14:28:51 -0500 } 4, 39 -- Message-ID: {CAA8T2PPoF2psxockj2iiLsaYMJOQA6OjG9raJ3kdHDQFPeCSHA-at-mail.gmail.com} } 4, 39 -- Subject: TEM xsect sample preparation - repeated glue failure } 4, 39 -- To: Microscopy-at-microscopy.com } 4, 39 -- Cc: Kaustubh Bawane {kauskb7-at-vt.edu} } 4, 39 -- Content-Type: text/plain; charset="UTF-8" } ==============================End of - Headers==============================
From harremme142vue-at-gmail.com Fri Jan 25 18:00:28 2019 Return-Path: {harremme142vue-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.147] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x0Q00R7M006438 for {microscopylistserverarchive7-at-microscopy.com} ; Fri, 25 Jan 2019 18:00:28 -0600 Received: from unknown (HELO mailout.endmonthnow.com) (Fri, 25 Jan 2019 15:59:42 -0800) by mail.webhostings4u.com with QMQP; Fri, 25 Jan 2019 15:59:42 -0800 Received: from unknown (147.182.132.244) by asx121.turbo-inline.com with SMTP; Fri, 25 Jan 2019 15:55:01 -0800 Message-ID: {6B489ADE.7CB4A018-at-gmail.com}
Dear All, may I ask if anyone has any experience is using some 3rd Party makeshift controller to duplicate some functionality of the TEM control panel such as brightness and focus knob? And probably its for JEOL TEM with TEMCenter software.
I come across https://www.3dconnexion.eu/ for CAD software but wonder if one could tweak it for TEM control application.
Any pieces of advice are greatly appreciated!
Cheers, Yee Yan, Tay FACTS, NTU
==============================Original Headers============================== 4, 32 -- From rongchigram79-at-yahoo.com.sg Sat Jan 26 09:26:06 2019 4, 32 -- Received: from sonic304-20.consmr.mail.sg3.yahoo.com (sonic304-20.consmr.mail.sg3.yahoo.com [106.10.242.210]) 4, 32 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x0QFQ5sj008497 4, 32 -- for {Microscopy-at-microscopy.com} ; Sat, 26 Jan 2019 09:26:06 -0600 4, 32 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; d=yahoo.com.sg; s=s2048; t=1548516803; bh=zrzWBX4yqWVHlg91/99RoBbJHGG8tqdcMYdlN0JPNSU=; h=Date:From:To:Subject:References:From:Subject; b=XPLwxVlVaVRhEo3oYoEXr0JxFBYwIWzqpp+kb8h01zlIBGGvQ0uO0Frq+oNsQmW54V3QQ+Del3LQnYoH57kQmFn3UTdtrImmrvbnnFtQ4p9cLGRKVhAAKLxe65lv7I7hfUhxtVvoqJSzg7U9DzUtFOUEh9BvEhQ/De19RuIuQt5JXfeOVIzcD5XY+HPUYSEl5ACA4dWf6o4osc8b4pWF/JQEwlxL24cY8Sc7EcTbLmBH+h4+KJkWOwkLcC3HZnvC3EN5gDILo0CYlnqEtaxei+uTl8d0mziMf6lpdjSpyMsYhfne5Q1qI7UGSWzN4JHfH3FRwhA8Ee7PqS6jEq07jA== 4, 32 -- X-YMail-OSG: mQ5uTjoVM1ktrB4N2o1503XTQLXod4fYQ_zxMv8MvP0mxFoFbgGqiekxVgwg6Nd 4, 32 -- tjk0ViA92eIyfJUCtTiwI_NuwwDqt75dYwAmsTT4DkE.KzhPszwh2wL7DGAe5d_pFwDBp4haLmj5 4, 32 -- Obl7.neEXjTGTyC5SvmWBT882ubhTNkPtcI9Ru4BHFG8yWb7u9CjJ_osAcRMazEG1rO9f2vvd2QI 4, 32 -- SLTVgMGr2jyr4I84Z9s4IjPmEpLF0zg.3Sllp6sHYRsJXGXIuZRT5BCEDJ44At1api2BKDYtlsVR 4, 32 -- yJPagpTcMiGw0ySz7hpclqlJmUAQdYqXu9QOyj7LpLDmob1D68ZS7.AVfEw3h.xQITmIzeGUFn9R 4, 32 -- mOromtZzEkKRv4KA9YGvURkPXnIiat.TfUWXjasrUZYYA94V8RQ5juNf0XwH.JBV0.o_2OucYTGr 4, 32 -- iDvAWeItln7B3s3ti0G6eZdH5NFffPsJowiP9npuAZNHxNIaUNKCGcjeIcT.QbhNV34PYzdkIVq. 4, 32 -- 532r6bBwn1AKJexjVd0J8al2VOtFHXjWeovEYfRH7BEz7PcH_y2MkT666mLm3sSUUgRH_Fv1MONP 4, 32 -- 109xlzUU87Ggs0ZqeGOlbHmxlveXJJo2qF2cIh02a3qps6UPxXH4bfdqBOjsI9eRztGwCrqm8wUU 4, 32 -- 4lLPWL8M9N0DHiojIiCzv4dG48Vtpza3tozbwPvrK_mLYKIt2dFz8ACrGf2gHJzq3wdy.39aH_xP 4, 32 -- BXl_Vm2j53sBsZjYd0E9fXMsQfukcqleMXsHtEZ3I33wnBJ65g0ydWFz4ShWrP1M_X1eJ9wr0nTy 4, 32 -- xvOIXC1O71l8T8tLKOpNnApb3fEdNQRPTRSVf028xkvJK.Jfz4pnCh_IMnR0FKJE198UL2uGVjjz 4, 32 -- 7c5Sk1hoBSkN1HuvL9F3XqnSMDpyzAAq2xk8pgpG4B4vvISf0eStZdQLZFDfWyQ1DPab_28GmOA1 4, 32 -- d1XgsPhR_TdRkBPuZs4yVWCD_0sx4GUvzPn9E4vZ5DxPoJgKXfzk5zvjvDfOGc67yHraMIyA5tel 4, 32 -- 9fWz2RM2WY_o_imiPVAkqoGy9WWY5.Q-- 4, 32 -- Received: from sonic.gate.mail.ne1.yahoo.com by sonic304.consmr.mail.sg3.yahoo.com with HTTP; Sat, 26 Jan 2019 15:33:23 +0000 4, 32 -- Date: Sat, 26 Jan 2019 15:33:21 +0000 (UTC) 4, 32 -- From: YY YY {rongchigram79-at-yahoo.com.sg} 4, 32 -- To: "Microscopy-at-microscopy.com" {Microscopy-at-microscopy.com} 4, 32 -- Message-ID: {1955747967.1355647.1548516801979-at-mail.yahoo.com} 4, 32 -- Subject: 3rd Party Makeshift Controller to duplicate some functionality of 4, 32 -- TEM Control Panel? 4, 32 -- MIME-Version: 1.0 4, 32 -- Content-Type: text/plain; charset=UTF-8 4, 32 -- Content-Transfer-Encoding: 7bit 4, 32 -- References: {1955747967.1355647.1548516801979.ref-at-mail.yahoo.com} 4, 32 -- X-Mailer: WebService/1.1.13027 YMailNorrin Mozilla/5.0 (Windows NT 10.0; Win64; x64; rv:64.0) Gecko/20100101 Firefox/64.0 ==============================End of - Headers==============================
From traialet662euxzu-at-gmail.com Mon Jan 28 14:52:39 2019 Return-Path: {traialet662euxzu-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.142] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x0SKqbRx016897 for {microscopylistserverarchive7-at-microscopy.com} ; Mon, 28 Jan 2019 14:52:38 -0600 Received: from unknown (201.214.168.218) by smtp.doneohx.com with NNFMP; Tue, 29 Jan 2019 07:47:27 +1100 Message-ID: {2799B192.C0587729-at-gmail.com}
-------- Forwarded Message --------
X-from: chrisbrantner-at-gwu.edu
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Email: chrisbrantner-at-gwu.edu Name: Chris Brantner
Organization: George Washington University Title-Subject: [Filtered] GWNIC CLEM Workshop June 10-14, 2019
Message: Calling all microscopists!
The George Washington University Nanofabrication and Imaging Center would like to present the 3rd Annual GWNIC Correlative Light and Electron Microscopy Workshop.
Join us June 10-14, 2019 in the nation's capital to learn about this exciting technique and how we are applying it to biological specimens.
https://nic.gwu.edu/clem-workshop
Chris Brantner GWNIC Electron Microscopist Login Host: 161.253.36.203 Listserver Email Form V - 20120416 ---------------------------------------------------------------------------
I am pleased to announce a new staff position at the Marine Biological Laboratory.Those interested in the position should submit an application, including a CV, a cover letter, and the names and contact information for three references to mbl.edu/RESEA01039
We will begin reviewing applications on February 11, 2019.
**
*Imaging Research Specialist/Senior Research Specialist*
*MBL Microscopy and Imaging Facility*
The Marine Biological Laboratory (MBL) invites applications for a research specialist in the MBLs Microscopy and Imaging Facility. Responsibilities include technical support and training for specimen preparation, image acquisition, and computational processing and analysis using advanced imaging techniques such as light sheet microscopy and scanning electron microscopy array tomography. The successful candidate will receive training on these and other cutting-edge systems from their respective instrument developers, commercial vendors, and resident staff.
This position is integral to MBLs strategic initiative to develop a Center for Imaging and Image Analysis.
Key Areas of Responsibility:
* Support a broad variety of microscopy imaging projects and educational courses * Help implement and refine novel imaging technologies * Provide routine maintenance and troubleshooting on the imaging systems * Provide training in specimen preparation and image processing and analysis * Learn proper specimen preparation and image processing such as segmentation, particle tracking, and shape analysis. * Report to the Director Imaging Services within the Division of Research
Can anybody provide me with some upper limits for the charge density achievable in the focus of a focussed
electron (or ion) beam. The focal point doesn't have to be very small, 100 nm would be easily sufficient.
The speed of the electrons isn't important either.
Another interesting question is the largest possible convergence angle.
Regards.
Philip
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Has anybody ever recorded a transmission image of an electron beam using TEM, STEM or some holographic method?
All the best,
Philip
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What I'm looking for is an actual image of an electron beam. The electron beam should be the specimen and probably orthogonal to the beam used for imaging it. Obviously this requires some sort of dual column setup.
All the best,
Philip
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What's the point? Everhart did this in SEM about 50 years ago. ******************************************************* Chaoying Ni, PhD Director, W. M. Keck Center for Advanced Microscopy and Microanalysis Professor, Materials Science and Engineering http://www.camm.udel.edu; http://www.mseg.udel.edu (302) 831-6359 (Phone); (302) 831-4545 (Fax)
Facility location: 154-174 Harker Laboratory 221 Academy Street, Newark, DE 19716
Mailing address: University of Delaware 201 duPont Hall, Newark, DE 19716 *******************************************************
-----Original Message----- X-from: Philip.Koeck-at-ki.se {Philip.Koeck-at-ki.se} Sent: Friday, February 8, 2019 4:53 AM To: Ni, Chaoying {cni-at-udel.edu}
Hi again.
What I'm looking for is an actual image of an electron beam. The electron beam should be the specimen and probably orthogonal to the beam used for imaging it. Obviously this requires some sort of dual column setup.
All the best,
Philip
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I believe I have an issue with scan rotation calibration. When the image is in focus and the stage is moved, the image does not move in a strait horizontal or vertical direction. The offset is about 3 degrees. I have to under focus by about 10mm to have the image move strait. The "Scan Rotation" button is off and I have never had to use it before. Turing it on and adjusting it to 3 degrees adds some x motion if i am moving y to correct the twist but this isn't precise enough to use stage automation features. Is there a way to adjust the scan rotation calibration on a 5600? -Josh
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I actually mean there should be two beams in the microscope, the electron beam you are imaging with and an additional electron or ion beam that you are taking an image of. Ideally the second beam would be orthogonal to the first. In a TEM this would mean sending in the second beam through the specimen port.
A ronchigram doesn't require two beams, does it?
All the best,
Philip ________________________________________ X-from: John Mardinly [John.Mardinly-at-asu.edu] Sent: 08 February 2019 18:46 To: Philip Kck; MSA
Hi,
do you have a reference to this paper by any chance?
All the best,
Philip
________________________________________ X-from: Ni, Chaoying [cni-at-udel.edu] Sent: 08 February 2019 15:56 To: Philip Köck; Microscopy-at-microscopy.com
Hi again.
What I'm looking for is an actual image of an electron beam. The electron beam should be the specimen and probably orthogonal to the beam used for imaging it. Obviously this requires some sort of dual column setup.
All the best,
Philip
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“To see something” is fundamentally philosophical (remember the Schrodinger’s cat?)
When you use an orthogonal 2nd e-beam or any 2nd beam at any angle to shoot or watch the 1st beam, the resulting “1st“ beam will no longer be the 1st beam when it was not peeked, not to mention if such an experiment would even be possibly reliably realizable in the case of TEM.
In fact, Ronchigram is a good answer, and CBED can be another, I think. By choosing “different amorphous materials or crystals”, i.e. “2nd beams” or “instruments”, together with different focus and beam dose, the beam trajectory information can likely be extracted.
People also use Monte Carlo Methods
The reference is "T. Everhart, P. Hoff, J. Appl. Phys. 42, 5837 (1971)"
Curious at what you actually want to achieve. Can you share?
Good luck! ******************************************************* Chaoying Ni, PhD Director, W. M. Keck Center for Advanced Microscopy and Microanalysis Professor, Department of Materials Science and Engineering http://www.camm.udel.edu; http://www.mseg.udel.edu (302) 831-6359 (Phone); (302) 831-4545 (Fax)
Facility location: 154-174 Harker Laboratory 221 Academy Street, Newark, DE 19716
Mailing address: University of Delaware 201 duPont Hall, Newark, DE 19716 *******************************************************
-----Original Message----- X-from: Philip.Koeck-at-ki.se {Philip.Koeck-at-ki.se} Sent: Saturday, February 9, 2019 3:42 AM To: Ni, Chaoying {cni-at-udel.edu}
Hi,
do you have a reference to this paper by any chance?
All the best,
Philip
________________________________________ X-from: Ni, Chaoying [cni-at-udel.edu] Sent: 08 February 2019 15:56 To: Philip Köck; Microscopy-at-microscopy.com
Hi again.
What I'm looking for is an actual image of an electron beam. The electron beam should be the specimen and probably orthogonal to the beam used for imaging it. Obviously this requires some sort of dual column setup.
All the best,
Philip
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From irapier044ey-at-gmail.com Sat Feb 9 14:21:27 2019 Return-Path: {irapier044ey-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.132] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x19KLP9Y031015 for {microscopylistserverarchive7-at-microscopy.com} ; Sat, 9 Feb 2019 14:21:26 -0600 Received: from unknown (HELO mail.naihautsui.co.kr) (Sat, 09 Feb 2019 12:28:24 -0800) by mail.webhostings4u.com with LOCAL; Sat, 09 Feb 2019 12:28:24 -0800 Received: from unknown (138.213.77.177) by smtp.mixedthings.net with ESMTP; Sat, 09 Feb 2019 12:17:48 -0800 Received: from unknown (148.48.106.15) by public.micromail.com.au with QMQP; Sat, 09 Feb 2019 12:03:32 -0800 Message-ID: {4640409F.CFAA8F40-at-gmail.com}
I think it's worth mentioning that this is basically what particle colliders are, except the two beams aren't orthogonal, and people more often use protons--so Phillip isn't crazy to ask. I couldn't quickly find any paper where somebody reconstructed a beam profile based on detected particles, but I'm sure someone has done that. The closest I could quickly find was a paper where someone used braking radiation to image a proton beam: https://doi.org/10.1016/0029-554X(81)90734-5 Not quite what you're looking for, Phillip, but I'm sure it's there. Seems that high-energy physicists are the right people to ask. Tyler
On Sat, Feb 9, 2019 at 2:34 PM cni-at-udel.edu {cni-at-udel.edu} wrote: } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html } ---------------------------------------------------------------------------- } } “To see something” is fundamentally philosophical (remember the Schrodinger’s cat?) } } When you use an orthogonal 2nd e-beam or any 2nd beam at any angle to shoot or watch the 1st beam, the resulting “1st“ beam will no longer be the 1st beam when it was not peeked, not to mention if such an experiment would even be possibly reliably realizable in the case of TEM. } } In fact, Ronchigram is a good answer, and CBED can be another, I think. By choosing “different amorphous materials or crystals”, i.e. “2nd beams” or “instruments”, together with different focus and beam dose, the beam trajectory information can likely be extracted. } } People also use Monte Carlo Methods } } The reference is "T. Everhart, P. Hoff, J. Appl. Phys. 42, 5837 (1971)" } } Curious at what you actually want to achieve. Can you share? } } Good luck! } ******************************************************* } Chaoying Ni, PhD } Director, W. M. Keck Center for Advanced Microscopy and Microanalysis } Professor, Department of Materials Science and Engineering } http://www.camm.udel.edu; http://www.mseg.udel.edu } (302) 831-6359 (Phone); (302) 831-4545 (Fax) } } Facility location: } 154-174 Harker Laboratory } 221 Academy Street, Newark, DE 19716 } } Mailing address: } University of Delaware } 201 duPont Hall, Newark, DE 19716 } ******************************************************* } } -----Original Message----- } X-from: Philip.Koeck-at-ki.se {Philip.Koeck-at-ki.se} } Sent: Saturday, February 9, 2019 3:42 AM } To: Ni, Chaoying {cni-at-udel.edu} } Subject: [Microscopy] RE: (electron microscopy) clarification: image of an } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html } ---------------------------------------------------------------------------- } } Hi, } } do you have a reference to this paper by any chance? } } All the best, } } Philip } } ________________________________________ } X-from: Ni, Chaoying [cni-at-udel.edu] } Sent: 08 February 2019 15:56 } To: Philip Köck; Microscopy-at-microscopy.com } Subject: RE: [Microscopy] (electron microscopy) clarification: image of an electron beam } } What's the point? Everhart did this in SEM about 50 years ago. } ******************************************************* } Chaoying Ni, PhD } Director, W. M. Keck Center for Advanced Microscopy and Microanalysis Professor, Materials Science and Engineering http://www.camm.udel.edu; http://www.mseg.udel.edu } (302) 831-6359 (Phone); (302) 831-4545 (Fax) } } Facility location: 154-174 Harker Laboratory } 221 Academy Street, Newark, DE 19716 } } Mailing address: } University of Delaware } 201 duPont Hall, Newark, DE 19716 } ******************************************************* } } -----Original Message----- } X-from: Philip.Koeck-at-ki.se {Philip.Koeck-at-ki.se} } Sent: Friday, February 8, 2019 4:53 AM } To: Ni, Chaoying {cni-at-udel.edu} } Subject: [Microscopy] (electron microscopy) clarification: image of an electron beam } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html } ---------------------------------------------------------------------------- } } Hi again. } } What I'm looking for is an actual image of an electron beam. } The electron beam should be the specimen and probably orthogonal to the beam used for imaging it. } Obviously this requires some sort of dual column setup. } } All the best, } } Philip } } } När du skickar e-post till Karolinska Institutet (KI) innebär detta att KI kommer att behandla dina personuppgifter. Här finns information om hur KI behandlar personuppgifter {https://ki.se/medarbetare/integritetsskyddspolicy} . } } } Sending email to Karolinska Institutet (KI) will result in KI processing your personal data. 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-- Dr. Tyler Harvey Georg-August-Universität Göttingen IV. Physical Institute Friedrich-Hund-Platz 1 37077 Göttingen Germany
Hi Dennis, Harvey, John, Alwyn, Ni, Reinhard and everybody following this.
There seems to be agreement that two beams will intersect each other at right angles seemingly unaffected since the particle density in both is so small.
I'm thinking of the situation with a different model: I treat the "specimen beam" as a charge distribution along a line (roughly speaking). As an example: For a beam of 1keV electrons with about 100 nA focused to about 1 micron beam diameter I get a charge distribution corresponding to about 1 electron every 20 or so microns. This charge distribution along a line produces an electrostatic potential which I approximate as smooth (on average). The electron beam used for imaging this specimen, on the other hand, I describe as a monochromatic, plane wave. This wave should be phase shifted as it travels through the potential. The phase shift is proportional to the projected potential. The relative phase shift I get for 200 keV electrons is in the range of pi, but it's a very slowly varying spatial distribution. To see this as an image would require a true phase contrast technique that has a good contrast transfer at very low spatial frequencies. Maybe off-axis holography would work. This fits very well with the observation that two beams visibly hardly influence each other. Most scattering is restricted to very small angles, since the phase shift varies very slowly. (I know I'm jumping around between the wave and particle picture.)
Just to clarify: I'm not planning to do this experiment. I have something else in mind.
About the specimen beam current I mention (100 nA): It seems high, I guess, but I've been told this is easily achievable in e-beam lithography systems. I haven't found a paper confirming this, though.
Here's another interesting paper I got via a colleague on Research Gate: https://arxiv.org/ftp/arxiv/papers/1610/1610.05602.pdf
I think it's worth mentioning that this is basically what particle colliders are, except the two beams aren't orthogonal, and people more often use protons--so Phillip isn't crazy to ask. I couldn't quickly find any paper where somebody reconstructed a beam profile based on detected particles, but I'm sure someone has done that. The closest I could quickly find was a paper where someone used braking radiation to image a proton beam: https://doi.org/10.1016/0029-554X(81)90734-5 Not quite what you're looking for, Phillip, but I'm sure it's there. Seems that high-energy physicists are the right people to ask. Tyler
On Sat, Feb 9, 2019 at 2:34 PM cni-at-udel.edu {cni-at-udel.edu} wrote: } } To see something is fundamentally philosophical (remember the Schrodingers cat?) } } When you use an orthogonal 2nd e-beam or any 2nd beam at any angle to shoot or watch the 1st beam, the resulting 1st beam will no longer be the 1st beam when it was not peeked, not to mention if such an experiment would even be possibly reliably realizable in the case of TEM. } } In fact, Ronchigram is a good answer, and CBED can be another, I think. By choosing different amorphous materials or crystals, i.e. 2nd beams or instruments, together with different focus and beam dose, the beam trajectory information can likely be extracted. } } People also use Monte Carlo Methods } } The reference is "T. Everhart, P. Hoff, J. Appl. Phys. 42, 5837 (1971)" } } Curious at what you actually want to achieve. Can you share? } } Good luck! } ******************************************************* } Chaoying Ni, PhD } ******************************************************* } } -----Original Message----- } ---------------------------------------------------------------------------- } } Hi again. } } What I'm looking for is an actual image of an electron beam. } The electron beam should be the specimen and probably orthogonal to the beam used for imaging it. } Obviously this requires some sort of dual column setup. } } All the best, } } Philip
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A lot of interest is beginning (here at UNMC) in the morphology of mitochondria under normal and experimental conditions. Now we all know that it is easy to get artifacts in mitochondria during fixation. Some of the questions from our various researchers involve looking for what I would consider slight or subtle changes. Things that any artifacts would complicate the interpretation of in the images.
So, I'm asking, does anyone out there have a fixative that will give preserved, artifact free mitochondria? If you have a favorite recipe, I would like you to share it with me. I should point out that the most likely type of fixation will be immersion fixation not perfusion.
Bonus question, can anyone explain what I would call the current fad, this interest in morphological changes in mitochondria? I'm sure we are not the only EM Lab getting these questions about mitochondria which seems to be an up and coming topic in medical research. All help is appreciated. Thank you.
Tom Bargar UNMC Electron Microscopy Core Facility 986395 Nebraska Medical Center Omaha, NE 68198-6395 402-559-7347 tbargar-at-unmc.edu
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From ronaldfaust205xd-at-gmail.com Wed Feb 13 01:26:42 2019 Return-Path: {ronaldfaust205xd-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.131] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x1D7Qffi023626 for {microscopylistserverarchive7-at-microscopy.com} ; Wed, 13 Feb 2019 01:26:41 -0600 Received: from unknown (164.63.30.235) by relay37.vosimerkam.net with NNFMP; Wed, 13 Feb 2019 01:16:13 -0600 Received: from smtp18.yenddx.com ([Wed, 13 Feb 2019 01:08:38 -0600]) by asx121.turbo-inline.com with ESMTP; Wed, 13 Feb 2019 01:08:38 -0600 Message-ID: {0888917C.2F714F84-at-gmail.com}
Dear Listers,
Could you, please, point me to the good and reliable source of secondary antibodies conjugated to colloidal gold (5-10-15nm) in UK or Europe?
Previously, we used BBI a lot but it seems that now they have very limited variety.
Thank you in advance!
Sincerely,
Alex
-- Dr. Aleksandr Mironov MD, PhD Senior Experimental Officer D.1527, M.Smith Building EM Core Facility School of Biological Sciences, Faculty of Biology Medicine and Health University of Manchester Oxford Road Manchester M13 9PT UK
==============================Original Headers============================== 9, 31 -- From Aleksandr.Mironov-at-manchester.ac.uk Wed Feb 13 04:46:37 2019 9, 31 -- Received: from clarity.mcc.ac.uk (clarity.mcc.ac.uk [130.88.200.144]) 9, 31 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1DAkaei000527 9, 31 -- for {Microscopy-at-microscopy.com} ; Wed, 13 Feb 2019 04:46:37 -0600 9, 31 -- Received: from asmtp2.its.manchester.ac.uk ([130.88.13.150]:52530) 9, 31 -- by clarity.mcc.ac.uk with esmtps (TLSv1.2:ECDHE-RSA-AES256-GCM-SHA384:256) 9, 31 -- (Exim 4.91 (FreeBSD)) 9, 31 -- (envelope-from {Aleksandr.Mironov-at-manchester.ac.uk} ) 9, 31 -- id 1gtsBp-0000vj-Ru 9, 31 -- for Microscopy-at-microscopy.com; Wed, 13 Feb 2019 10:54:53 +0000 9, 31 -- Received: from [10.242.61.228] (port=52767) 9, 31 -- by asmtp2.its.manchester.ac.uk with esmtpsa (TLSv1.2:ECDHE-RSA-AES128-GCM-SHA256:128) 9, 31 -- (Exim 4.91) 9, 31 -- (envelope-from {Aleksandr.Mironov-at-manchester.ac.uk} ) 9, 31 -- id 1gtsBp-0002bD-Q8 9, 31 -- for Microscopy-at-microscopy.com; Wed, 13 Feb 2019 10:54:53 +0000 9, 31 -- To: Microscopy-at-microscopy.com 9, 31 -- From: Aleksandr Mironov {Aleksandr.Mironov-at-manchester.ac.uk} 9, 31 -- Subject: TEM: secondary gold conjugates 9, 31 -- Message-ID: {bbcddcf6-d173-1ddb-d27f-26313b6424d3-at-manchester.ac.uk} 9, 31 -- Date: Wed, 13 Feb 2019 10:54:53 +0000 9, 31 -- User-Agent: Mozilla/5.0 (Windows NT 6.1; WOW64; rv:52.0) Gecko/20100101 9, 31 -- Thunderbird/52.9.1 9, 31 -- MIME-Version: 1.0 9, 31 -- Content-Type: text/plain; charset=utf-8; format=flowed 9, 31 -- Content-Transfer-Encoding: 7bit 9, 31 -- Content-Language: en-US 9, 31 -- X-Authenticated-Sender: Aleksandr Mironov from ([10.242.61.228]) [10.242.61.228]:52767 9, 31 -- X-Authenticated-From: Aleksandr.Mironov-at-manchester.ac.uk 9, 31 -- X-Spam-Score: -5.0(?) 9, 31 -- X-Spam-Flag: NO ==============================End of - Headers==============================
From ketcdutj170si-at-gmail.com Wed Feb 13 13:18:47 2019 Return-Path: {ketcdutj170si-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.146] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x1DJIjDq032262 for {microscopylistserverarchive7-at-microscopy.com} ; Wed, 13 Feb 2019 13:18:47 -0600 Received: from unknown (212.84.232.52) by public.micromail.com.au with QMQP; Wed, 13 Feb 2019 08:11:03 -1100 Message-ID: {54D070FE.9D3FF798-at-gmail.com}
Hi everyone.
we have a strange result in an FFT of a hi res stem image.
We have a series of vertical lines that seem to be noise from somewhere. I can send the original image and/or the FFT if someone would be kind enough to offer to take a look!
Thanks!
Chris
Christopher J. Gilpin Ph.D. Campus-wide Coordinator for Electron Microscopy Director, Life Science Microscopy Facility Purdue University Whistler Hall of Agriculture Research, Room S052 170 S. University St West Lafayette, IN 47907 765-494-7750 gilpin-at-purdue.edu lsmf-at-purdue.edu reaches everyone in the facility. http://ag.purdue.edu/arp/Microscopy/Pages/default.aspx skype cjgilpin
==============================Original Headers============================== 10, 32 -- From gilpin-at-purdue.edu Wed Feb 13 17:20:46 2019 10, 32 -- Received: from xppmailspam02.itap.purdue.edu (xppmailspam02.itap.purdue.edu [128.210.5.13]) 10, 32 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1DNKjuU013543 10, 32 -- for {microscopy-at-microscopy.com} ; Wed, 13 Feb 2019 17:20:46 -0600 10, 32 -- X-IronPort-Anti-Spam-Filtered: true 10, 32 -- X-IronPort-AV: E=Sophos;i="5.58,366,1544504400"; 10, 32 -- d="scan'208";a="214514972" 10, 32 -- Received: from exchange.purdue.edu ([128.210.1.29]) 10, 32 -- by xppmailspam02.itap.purdue.edu with ESMTP/TLS/AES256-SHA; 13 Feb 2019 18:29:05 -0500 10, 32 -- Received: from wppexc07.purdue.lcl (172.30.136.180) by WPPEXC16.purdue.lcl 10, 32 -- (172.30.136.189) with Microsoft SMTP Server (TLS) id 15.0.1367.3; Wed, 13 Feb 10, 32 -- 2019 18:29:04 -0500 10, 32 -- Received: from wppexc07.purdue.lcl ([fe80::49db:3fa0:d668:8da4]) by 10, 32 -- wppexc07.purdue.lcl ([fe80::49db:3fa0:d668:8da4%14]) with mapi id 10, 32 -- 15.00.1365.000; Wed, 13 Feb 2019 18:29:04 -0500 10, 32 -- From: "Gilpin, Christopher J" {gilpin-at-purdue.edu} 10, 32 -- To: "microscopy-at-microscopy.com" {microscopy-at-microscopy.com} 10, 32 -- Subject: help with stem FFT interpretation 10, 32 -- Thread-Topic: help with stem FFT interpretation 10, 32 -- Thread-Index: AdTD8z3ca5gi4GgeTMGi/8Ku4QZsjA== 10, 32 -- Date: Wed, 13 Feb 2019 23:29:04 +0000 10, 32 -- Message-ID: {69003d5ab7ed4588b2662f8014ad90d4-at-wppexc07.purdue.lcl} 10, 32 -- Accept-Language: en-US 10, 32 -- Content-Language: en-US 10, 32 -- X-MS-Has-Attach: 10, 32 -- X-MS-TNEF-Correlator: 10, 32 -- x-ms-exchange-transport-fromentityheader: Hosted 10, 32 -- x-originating-ip: [10.163.23.200] 10, 32 -- Content-Type: text/plain; charset="utf-8" 10, 32 -- MIME-Version: 1.0 10, 32 -- Content-Transfer-Encoding: 8bit 10, 32 -- X-MIME-Autoconverted: from base64 to 8bit by microscopy.com id x1DNKjuU013543 ==============================End of - Headers==============================
This Question/Comment was submitted to the Microscopy Listserver using the WWW based Form at --------------------------------------------------------------------------- Remember this posting is most likely not from a Subscriber, so when replying please copy to both dlowry-at-asu.edu, Microscopy-at-Microscopy.com so that all Microscopy Listserver Subscribers can benefit from our collective wisdom ---------------------------------------------------------------------------
Email: dlowry-at-asu.edu Name: David Lowry
Organization: Arizona State University
Title-Subject: [Filtered] negative staining and protein chemistry question
Message: A grad student working in our lab has encountered a problem involving TEM negative staining of 2 different protein molecules. The proteins are purified commercial products and are clearly distinct from one another. In her experiments, the 2 proteins stain well (uranyl acetate) and are easily resolved when they are applied individually to glow-discharged grids. However, in experiments when the 2 proteins are pre-mixed, one of them acquires stain and is resolved normally, but the other one cannot be resolved, it either does not stain correctly or does not bind to the grid surface. The buffer used for all of her trials is the same (5 mM HEPES, pH 7.2). We are looking for possible explanations for why this may be occurring from list users who are knowledgeable of protein chemistry thank you- Login Host: 149.169.80.88 Listserver Email Form V - 20120416 ---------------------------------------------------------------------------
Hi all, Does anyone have the schematics for a Ted Pella vibratome 3000? If yes, can you send them to me?The vibratome is not advancing or retreatingnormally. It does advance and retreatbut super slowly and the normal noises it makes aren't happening. If you can troubleshoot this problem with me I would greatly appreciate it! Ted Pella will not service it nor will Leica (who bought out Vibratome) and the quote from Southeast Pathology Services is more than we can afford at this time. With your help I am ready to dissect this machine. SPS suggested that the barrel might be stuck. The foot pedal is not attached. Have a Happy Valentine's Day, Beth at Georgia Electron Microscopy, UGA, Athens, GA
We've recently hosted a Plunge freezing Leica GP2, and I'm getting used of it. We've got very high viscosity samples to do CryoTEM and I'm wondering whether multiple blots would work better then single blot.
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From gunnclar77uwnf-at-gmail.com Sun Feb 17 02:34:50 2019 Return-Path: {gunnclar77uwnf-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.133] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x1H8YmTn021927 for {microscopylistserverarchive7-at-microscopy.com} ; Sun, 17 Feb 2019 02:34:49 -0600 Received: from unknown (212.140.130.71) by qrx.quickslick.com with ESMTP; Sun, 17 Feb 2019 18:26:17 +1000 Received: from asx121.turbo-inline.com [129.54.236.249] by mail.naihautsui.co.kr with ASMTP; Sun, 17 Feb 2019 18:08:50 +1000 Received: from webmail.halftomorrow.com ([88.133.212.187]) by smtp4.cyberemailings.com with NNFMP; Sun, 17 Feb 2019 18:08:41 +1000 Message-ID: {11ECA1D4.0DA19F2F-at-gmail.com}
We have a project working on cyanobacteria and have discovered a need to do freeze-etch EM. We don't have the equipment to do this, so we are looking for a lab that can do freeze-etch on a contract basis.
Phil ------------- Philip Oshel Imaging Facility Director Biology Department 1304 Biosciences 1455 Calumet Ct. Central Michigan University Mt. Pleasant, MI 48859 989 774-3576 office 989 774-7567 lab
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Title-Subject: [Filtered] microwaving large samples in osmium
Message: Hello. Does anyone have any experience with microwaving large samples( 1.2 mm thick or larger) in osmium? I am wondering about time and wattage to increase the penetration of osmium. So far I have only tried 6 min at 400 w. thanks in advance JoAnn
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Title-Subject: [Filtered] Tips for TEM SAED JEOL 2100F
Message: Hello,
I would like to ask some practical tips on performing SAED on a JEOL 2100F TEM. I am a complete newbie to TEM diffraction and the 2100 user manual diffraction chapter is rather limited in describing influence of various settings (or recommendation of it) on the outcome of the diffraction patterns i.e. use of condenser lenses, alpha, spot values, required/suggested alignment/correction procedures. I usually (1)focus on the sample in question at about 100kx, (2) perform voltage centering alignment (HT WOB), (3) WOB Y/X correction. And then switch to the SAED procedure in chapter 5.5.1 of the manual.
My samples are micron sized fly ash particles (silicates, aluminosilicates). Fixed on holey carbon films on copper mesh. The TEM is operated at 200kV. So far one of the most notable problems I have is: (1)After selecting/centering the area of interest on the fluorescent screen (SA MAG mode, field limiting aperture inserted) I switch to SA DIFF mode and the beam shifts position to the top left (midway radius) on the fluorescent screen which makes navigation on the sample very difficult. (2)Using the DIFF FOCUS knob to focus the beam into a small spot, the diffraction patterns do not appear completely spherical (mild ellipse).
Any practical tips/steps on setting up the scope for the best SAED experience would be greatly appreciated.
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You are performing the basic procedures involved in selected area diffraction just fine. Regarding the issues you are having, (1) I'm not sure what you mean by the beam shifting when you switch to diffraction mode. Is the area you are selecting in MAG mode physically shifting outside the aperture (if so, you can adjust the image shifts to correct this), or is the under/overfocused image simply shifting on the green screen? To correct the later, turn on your projector shifts (PLA on JEOL) and adjust the image back to the center of the green screen.
(2)To correct astigmatism in the intermediate lenses, you'll need to use your intermediate lens stigmator. On the JEOL, this is only accessible through the alignment panel in the TEMCON software. You can obtain the caustic spot in diffraction mode and correct using that, or use an amorphous area of your sample.
Contact me directly if you need more detailed procedures.
Good luck, Chris
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I am a complete newbie to TEM diffraction and the “2100 user } manual” diffraction chapter is rather limited in describing influence of } various settings (or recommendation of it) on the outcome of the } diffraction patterns i.e. use of condenser lenses, alpha, spot values, } required/suggested alignment/correction procedures. } I usually (1)focus on the sample in question at about 100kx, (2) perform } voltage centering alignment (HT WOB), (3) WOB Y/X correction. And then } switch to the SAED procedure in chapter 5.5.1 of the manual. } } My samples are micron sized fly ash particles (silicates, } aluminosilicates). Fixed on holey carbon films on copper mesh. The TEM } is operated at 200kV. So far one of the most notable “problems” I have is: } (1)After selecting/centering the area of interest on the fluorescent } screen (SA MAG mode, field limiting aperture inserted) I switch to SA } DIFF mode and the beam shifts position to the top left (midway radius) } on the fluorescent screen which makes navigation on the sample very } difficult. (2)Using the DIFF FOCUS knob to focus the beam into a small } spot, the diffraction patterns do not appear completely spherical (mild } ellipse). } } } Any practical tips/steps on setting up the scope for the best SAED } experience would be greatly appreciated. } } Login Host: 193.167.228.180 } Listserver Email Form V - 20120416 } --------------------------------------------------------------------------- } } } } ==============================Original Headers============================== } 18, 53 -- From microscopy.listserver-at-gmail.com Mon Feb 18 19:09:33 2019 } 18, 53 -- Received: from mail-pf1-f176.google.com (mail-pf1-f176.google.com [209.85.210.176]) } 18, 53 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1J19WD7024698 } 18, 53 -- for {microscopy-at-microscopy.com} ; Mon, 18 Feb 2019 19:09:33 -0600 } 18, 53 -- Received: by mail-pf1-f176.google.com with SMTP id q17so9376234pfh.10 } 18, 53 -- for {microscopy-at-microscopy.com} ; Mon, 18 Feb 2019 17:18:09 -0800 (PST) } 18, 53 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 18, 53 -- d=gmail.com; s=20161025; } 18, 53 -- h=subject:references:to:from:message-id:date:user-agent:mime-version } 18, 53 -- :in-reply-to:content-language:content-transfer-encoding; } 18, 53 -- bh=hxHJEHumJGbYROGT2C4m52y50N+kw6/bzQ7hh2LKYEs=; } 18, 53 -- b=p+BjzHlDgkahm7ixcWcgR8x6Euzo/P7FtR587nVNf5RlyrHqgQnqPqzoL8Slkg4yD8 } 18, 53 -- gVrCoOmiCqWGNpEfhHGF+2mI/7TbSfr20pvOdQNFGOSPuoYAgX7wKjMT3+u8k8sV5PL7 } 18, 53 -- XLpGTlPY4R/u/7CScKnQFPqfas98KPO+th1yaiuQya3N3x4JtPqyz5njK8LCHHNecYq2 } 18, 53 -- hYPqgfshgJeo+SGszQZ4PnsHpaK0qP5YVpWNIT1B48BoxD+dpFpiXzVZXdz6FSf5P/XV } 18, 53 -- I59QkQOvjLq1IUKFfO5EwwPu7RbRWfO0g90IHfQm9RUZrgvHsl9DrFUScGVqEXbEfW7f } 18, 53 -- DFkA== } 18, 53 -- X-Google-DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 18, 53 -- d=1e100.net; s=20161025; } 18, 53 -- h=x-gm-message-state:subject:references:to:from:message-id:date } 18, 53 -- :user-agent:mime-version:in-reply-to:content-language } 18, 53 -- :content-transfer-encoding; } 18, 53 -- bh=hxHJEHumJGbYROGT2C4m52y50N+kw6/bzQ7hh2LKYEs=; } 18, 53 -- b=P7UVp/EvB+sfNIRhY7Bf7mmlN+xeb7s38loKT0yYlbyS5Ign62+5zoht779Le9e3oP } 18, 53 -- 7Wuk2X5aLUK+rtr1ZJXRDGVWvke8GRXANVQ2GJ3ofLBf3fdTq8GBsKKHyjGkA6x6szBe } 18, 53 -- MrsvSagcf2Mx2r5eoDQc21oLmzNj2s2JrEZTqbjieaNcjMIscAMFgmNTTW8X2aYAT/S9 } 18, 53 -- x7eeGQ/mjfivlDPljZaL/dHed7JigeR24rjMEPmb9yz2DC+iqsLoYGSOkEcsa7+3NUZb } 18, 53 -- pdH9+iS5wkHKre0I6bN7XADCVbyy8lU6wth9rtLksQZxLFNWxxVOMnYi1wHU+ntKPUjd } 18, 53 -- qKPg== } 18, 53 -- X-Gm-Message-State: AHQUAuYMAdRYMy+8u9aiTCSMNKN/Eod6HHgVQjX3HNn3D9ZaEdgKxpwQ } 18, 53 -- MCcNwGt8VgRtNMnuINVlpnOIX2GX } 18, 53 -- X-Google-Smtp-Source: AHgI3IbNBr3fRu5TTVBhIpdDe6XpKDIEgVUgjdm0Q7+BH3j6Dya+8FG5gDr/fnwDMeqEFH4bciHG7g== } 18, 53 -- X-Received: by 2002:a62:be0c:: with SMTP id l12mr26337801pff.51.1550539088539; } 18, 53 -- Mon, 18 Feb 2019 17:18:08 -0800 (PST) } 18, 53 -- Received: from vlan-2696-10-17-143-100.guest.wireless.sydney.edu.au (natp-s01-129-78-56-212.gw.usyd.edu.au. 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Dear JoAnn, it would be interesting to get info about the type of MW-apparatus (brand) you are using....and how.....(water-load, intermittent on-off, etc.-, etc.). Could you - please - tell "us" any experiences regarding ultrastructural tissue preservation or obvious alterations due to your MW-procedere?
Unfortunately -in former times - I only sometimes used MW for (RAPID) osmication of specimens (up to 4-6 mm) - .... always with a waterload to prevent boiling of the OsO4-solution (I promise: not only a really great mess if 'exploding' out from the vial but also hazardous-especially to health...!) and just intermittently irradiated for say 5-10x 1-2 seconds (rotary table/disk in action, full power)
- when I tried to RAPIDLY process for diagnostic purposes...(but always processed specimens also in parallel as usual by immersion into 1% buffered OsO4-solution + permanent rotation of vials).
These times of practical experience or "doing osmication myself" were a long time ago....
so:
(Full bibliographic info and abstracts in part added only for convenience of reading....or choice...../.
you might read: https://www.ncbi.nlm.nih.gov/pubmed/7730590 = https://journals.sagepub.com/doi/pdf/10.1177/43.5.7730590 J Histochem Cytochem. 1995 May;43(5):515-23. Rapid primary microwave-aldehyde and microwave-osmium fixation: improved detection of rat parotid acinar cell secretory granule alpha-amylase using a post-embedding immunogold ultrastructural morphometric analysis. Login GR1, Ku TC, Dvorak AM. Author information Abstract Studies of methods for improved fixation are becoming increasingly important in the field of quantitative immunocytochemistry. We used microwave (MW)-assisted chemical fixation to show improved retention of salivary gland acinar cell secretory granule alpha-amylase detected by a quantitative immunogold method. Blocks (4-mm) of rat parotid gland were fixed by the following methods: (a) MW irradiation in an aldehyde fixative (AF) for 6 sec; (b) immersion in AF for 1.5 hr; (c) MW irradiation in osmium tetroxide (OT) for 9 sec; (d) immersion in OT for 1.5 hr; or (e) Sequential MW AF, 10 sec, MW OT rapid treatment (SMAORT), 10 sec. Specimens were processed routinely for transmission electron microscopy. Thin sections of Epon-embedded tissues were exposed first to rabbit IgG anti-human salivary alpha-amylase and second to gold-conjugated goat anti-rabbit IgG. Granule area was obtained by a point counting method. Labeling density was calculated as the number of gold particles/micron 2 +/- SD. Specimens fixed in seconds by MW-AF, MW-OT, or SMAORT showed ultrastructural preservation similar to immersion fixation in AF or OT for 1.5 hr. Immunogold labeling density of granule alpha-amylase was highest for SMAORT (874 microns 2) compared to MW-AF (295 microns 2), MW-OT (248 microns 2), routine sequential immersion in AF and OT (229 microns 2), or immersion in OT (no aldehyde) (190 microns 2). This study establishes the improved retention of salivary gland acinar cell secretory granule alpha-amylase and markedly enhanced fixation speed for ultrastructural studies made possible by MW-chemical fixation protocols that use aldehydes and osmium. https://journals.sagepub.com/doi/pdf/10.1177/43.5.7730590
https://journals.sagepub.com/doi/pdf/10.1177/38.6.2335738 Rapid Primary Microwave-Osmium Fixation. I. Preservation of Structure for Electron Microscopy in Seconds GARY R.LOGIN,2 BARBARA K.DWYER, and ANN M.DVORAK The Journal of Histochemistry and Cytochemistry Copyright1990 by The Histochemical Society, Inc. Vol.38. No.6, pp.755-762, 1990 Microwave irradiation(MWIr) of tissues immersed in aldeydes has been used to preserve fine structure in seconds. The purpose of this study was to extend these findings to include rapid primary osmium fixation in a microwave (MW ) device with a high volume exhaust. Blocks of rat heart and liver were trimmed to 4mm and exposed to 0.2M sym-collidine-buffered 2% osmium tetroxide for a period of 6 -7 sec during MWIr (final solution temperature ~45 C).We also evaluated rapid fixation of tissues exposed to MWIr simultaneously with immersion in dilute Karnovskys fixative (6-7 sec to ~ 50C) followed by MWIr of spec imens immersed in osmium (7 sec to ~45 C] ....... https://journals.sagepub.com/doi/pdf/10.1177/38.6.2335738
www.uic.umn.edu/sites/uic.umn.edu/files/mw_em_protocol_mas.pdf = http://uic.umn.edu/sites/uic.umn.edu/files/mw_em_protocol_mas.pdf Microwave Processing Protocol for Electron Microscopyusing the PELCO BioWaveLaboratory Tissue Processing System Getting Started ... ... Osmium Tetroxide Fixation (see Fig. 1 for set-up) Osmium Wattage Time Vacuum 80W 2min. on - 2 min. off - 2min. on Yes Cool to 20C and Repeat Time SequenceNotes: 1. Osmium is best used in concentrations of 1% or less. Aqueous works well and is our choice. 2. Reduced osmium works well also (3% potassium ferricyanide mixed with an equal volume of 2% osmium justbefore use). 3. Higher concentrations of osmium will retard penetration of fixative into tissues in a microwave environment
https://pubs.acs.org/doi/abs/10.1021/om701099p?journalCode=orgnd7 Preparation of Ruthenium and Osmium Carbonyl Complexes Using Microwave Heating: Demonstrating the Use of a Gas-Loading Accessory and Real-Time Reaction Monitoring by Means of a Digital Camera Nicholas E. Leadbeater* and Krista M. Shoemaker Department of Chemistry, University of Connecticut, 55 North Eagleville Road, Storrs, Connecticut 06269-3060 Organometallics, 2008, 27 (6), pp 12541258 DOI: 10.1021/om701099p Publication Date (Web): February 22, 2008 Copyright 2008 American Chemical Society * To whom correspondence should be addressed. E-mail: nicholas.leadbeater-at-uconn.edu.
Berst wishes and regards, and Good luck !
Wolfgang
============================================================= MUSS Wolfgang Dr. phil. (PhD) [OR i. R. / en retraite / retired]
FRMS, Retired Member of MSA Scientific Profile at ResearchGate: http://www.researchgate.net/profile/Wolfgang_MUSS Former Head of Electron Microscopy Lab at Institute of Pathology SALK-LKH / Salzburger Landeskliniken | General Hospital and PMU (private) PARACELSUS MEDICAL UNIVERSITY of SALZBURG
Former Secretary and (until June2017) Board Member of the
SCUR {The Society for Cutaneous Ultrastructure Research} The Skin Imaging Society { www.scur.org }
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Title-Subject: [Filtered] microwaving large samples in osmium
Message: Hello. Does anyone have any experience with microwaving large samples( 1.2 mm thick or larger) in osmium? I am wondering about time and wattage to increase the penetration of osmium. So far I have only tried 6 min at 400 w. thanks in advance JoAnn
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==============================Original Headers============================== 53, 21 -- From wij.muss-at-aon.at Mon Feb 18 20:21:13 2019 53, 21 -- Received: from bsmtp7.bon.at (bsmtp7.bon.at [213.33.87.19]) 53, 21 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1J2LD46012317 53, 21 -- for {Microscopy-at-Microscopy.com} ; Mon, 18 Feb 2019 20:21:13 -0600 53, 21 -- Received: from MussTHINK (unknown [93.83.25.98]) 53, 21 -- by bsmtp7.bon.at (Postfix) with ESMTPSA id 443Pp457dCz5tlB; 53, 21 -- Tue, 19 Feb 2019 03:29:48 +0100 (CET) 53, 21 -- From: "MUSS Wolfgang Dr. phil./PhD \(OR i.R, retired\)" {wij.muss-at-aon.at} 53, 21 -- To: {Microscopy-at-Microscopy.com} 53, 21 -- Cc: {buchsmith-at-gmail.com} 53, 21 -- Subject: Re [Microscopy] microwaving large samples in osmium 53, 21 -- Date: Tue, 19 Feb 2019 03:29:48 +0100 53, 21 -- Message-ID: {001401d4c7fa$fc3462b0$f49d2810$-at-aon.at} 53, 21 -- MIME-Version: 1.0 53, 21 -- Content-Type: text/plain; 53, 21 -- charset="iso-8859-1" 53, 21 -- X-Mailer: Microsoft Outlook 15.0 53, 21 -- Thread-Index: AdTH9WUcKCo3IwtHShG/qATDA1t4oQ== 53, 21 -- Content-Language: de 53, 21 -- Content-Transfer-Encoding: 8bit 53, 21 -- X-MIME-Autoconverted: from quoted-printable to 8bit by microscopy.com id x1J2LD46012317 ==============================End of - Headers==============================
From janiceking866i-at-gmail.com Mon Feb 18 23:11:00 2019 Return-Path: {janiceking866i-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.144] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x1J5AxPg025253 for {microscopylistserverarchive7-at-microscopy.com} ; Mon, 18 Feb 2019 23:11:00 -0600 Received: from rly04.hottestmile.com ([126.223.98.167]) by smtp-server1.cfdenselr.com with SMTP; Tue, 19 Feb 2019 01:01:03 -0400 Message-ID: {BE130275.822293F5-at-gmail.com}
Arunas, If your TEM is on service contract request a service visit and ask the engineer to demonstrate on a standard sample how they qualify that the TEM is functioning properly.
It is important that the beam and gun shifts and tilts are the same in imaging and diffraction modes (so the beam is where you think). This should be visible on a diagnostic page. On JEOL 2010 and older scopes it was pages 4 and 5 on the display. If alignments were done in "engineer mode" properly this should all be good. (I've been around 3 decades and have seen strange things; mistakes happen, people get distracted.)
In general I agree with the advice that Chris already provided.
Title-Subject: [Filtered] Tips for TEM SAED JEOL 2100F
Message: Hello,
I would like to ask some practical tips on performing SAED on a JEOL 2100F TEM. I am a complete newbie to TEM diffraction and the "2100 user manual" diffraction chapter is rather limited in describing influence of various settings (or recommendation of it) on the outcome of the diffraction patterns i.e. use of condenser lenses, alpha, spot values, required/suggested alignment/correction procedures. I usually (1)focus on the sample in question at about 100kx, (2) perform voltage centering alignment (HT WOB), (3) WOB Y/X correction. And then switch to the SAED procedure in chapter 5.5.1 of the manual.
My samples are micron sized fly ash particles (silicates, aluminosilicates). Fixed on holey carbon films on copper mesh. The TEM is operated at 200kV. So far one of the most notable "problems" I have is: (1)After selecting/centering the area of interest on the fluorescent screen (SA MAG mode, field limiting aperture inserted) I switch to SA DIFF mode and the beam shifts position to the top left (midway radius) on the fluorescent screen which makes navigation on the sample very difficult. (2)Using the DIFF FOCUS knob to focus the beam into a small spot, the diffraction patterns do not appear completely spherical (mild ellipse).
Any practical tips/steps on setting up the scope for the best SAED experience would be greatly appreciated.
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YES, I have been having trouble with resharpened knives from Diatome!
I sent three knives to be resharpened in July of 2018 (resharpen 2, get one free). I received the first one back and a coworker began using it immediately. When I received the other two back, I found several knife marks on both knives and returned them both. I received a "new" knife in return, which I also found had knife marks. This was returned, and another one was sent. There were a few very faint marks on this one as well, but I was desperate and kept it. It seems to me that it is much more prone to damage from normal use than any knife I have had before, and I am very disappointed in it as well.
Thanks for the vent! I think I will try Microstar again.
Sharon
-----Original Message----- X-from: microscopy.listserver-at-gmail.com {microscopy.listserver-at-gmail.com} Sent: Wednesday, February 20, 2019 6:18 PM To: Matthews,Sharon W {Sharon.Matthews-at-medicine.ufl.edu}
Oh My Dear Claudia,
Don't get me going on this subject. I am so disappointed in Diatome, a company I have been dealing with for 40+ years. The quality of their knives has declined over the years and I don't know why - maybe it's because they think they're the only game in town? I swapped an old knife and a considerable sum of money for a new one. There wasn't a single mm without scratches or knife marks on this "new" knife, and all sections showed chatter. I sent the knife back to them and, in their defense, they had another knife on my desk the following day. This knife seemed to be useful on the far left, but when I got to the middle of the blade, same stuff started happening - scratches and knife marks. I move to the far right and it was OK, but it looks like I'm stuck with a 3/4 of a knife. I don't have time to go 'round and 'round with Diatome. Diatome used to be a great company, producing very high quality knives that were great across the entire edge. Not so much anymore. Tried Pella knives - they're even worse. Tried DDK - useless. Microstar is the only one left. I had a loaner knife when I first took this job and the only thing I didn't like about the Microstar knives was that the boat seemed really hydrophobic; other than that, the edge was darned good. BTW, you should be hearing from my friend Lita, who works across the street at the Hughes Institute. She and I have been disappointed in Diatome for several years.
Best to you, Debra Townley Baylor College of Medicine
-----Original Message----- X-from: microscopy.listserver-at-gmail.com [mailto:microscopy.listserver-at-gmail.com] Sent: Wednesday, February 20, 2019 5:17 PM To: Townley, Debra
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Claudia Same trouble ! (France) We received a resharpened one" with many marks at the first use (on animal tissues embedded in Epoxy resin) I sent them TEM images of the marks! They told me that it was impossible that a such damaged diamant knife escaped the vigilance of the quality control of the Diatome factory! We did not succeed to have a new one! Best regards Jeannine ________________________________________ De : debrat-at-bcm.edu {debrat-at-bcm.edu} Envoy : jeudi 21 fvrier 2019 16:11 : Jeannine Lherminier Objet : [Microscopy] RE: viaWWW:Resharpened knife quality
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Oh My Dear Claudia,
Don't get me going on this subject. I am so disappointed in Diatome, a company I have been dealing with for 40+ years. The quality of their knives has declined over the years and I don't know why - maybe it's because they think they're the only game in town? I swapped an old knife and a considerable sum of money for a new one. There wasn't a single mm without scratches or knife marks on this "new" knife, and all sections showed chatter. I sent the knife back to them and, in their defense, they had another knife on my desk the following day. This knife seemed to be useful on the far left, but when I got to the middle of the blade, same stuff started happening - scratches and knife marks. I move to the far right and it was OK, but it looks like I'm stuck with a 3/4 of a knife. I don't have time to go 'round and 'round with Diatome. Diatome used to be a great company, producing very high quality knives that were great across the entire edge. Not so much anymore. Tried Pella knives - they're even worse. Tried DDK - useless. Microstar is the only one left. I had a loaner knife when I first took this job and the only thing I didn't like about the Microstar knives was that the boat seemed really hydrophobic; other than that, the edge was darned good. BTW, you should be hearing from my friend Lita, who works across the street at the Hughes Institute. She and I have been disappointed in Diatome for several years.
Best to you, Debra Townley Baylor College of Medicine
-----Original Message----- X-from: microscopy.listserver-at-gmail.com [mailto:microscopy.listserver-at-gmail.com] Sent: Wednesday, February 20, 2019 5:17 PM To: Townley, Debra
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==============================Original Headers============================== 27, 41 -- From jeannine.lherminier-at-inra.fr Thu Feb 21 10:38:05 2019 27, 41 -- Received: from smtp-edge.dcidf.inra.fr (smtp-edge.dcidf.inra.fr [138.102.156.154]) 27, 41 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1LGc4fG027255 27, 41 -- for {Microscopy-at-Microscopy.com} ; Thu, 21 Feb 2019 10:38:05 -0600 27, 41 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; 27, 41 -- s=s1024; d=inra.fr; 27, 41 -- h=from:to:cc:subject:date:message-id:in-reply-to:content-type: 27, 41 -- mime-version; 27, 41 -- bh=/62qbr4suoNkHIenUR1WrLxm36whCi6naBI+jEnNDpA=; 27, 41 -- b=YwZYsGLq7tkhAeQBl1iC5GzwPJ5bCKVdg1L3GG+PSMciJ1VIdJMBP/jGZYT+OC 27, 41 -- SlpD7DH9lB3jDtqZ2hIqIyz4vBngSCa7TPzbC2L8v62hbqGlqd709G4eVU7t7e 27, 41 -- kqfxb9KwrlOJu/kAobOQiIqYFbMvbyKVyL3ZMh9XHRUin3k= 27, 41 -- Received: from idfdcpripexmu03.inra.local (138.102.152.153) by 27, 41 -- IDFDCPUBEXEDG01.inra.local (138.102.156.154) with Microsoft SMTP Server (TLS) 27, 41 -- id 15.0.1395.4; Thu, 21 Feb 2019 17:46:48 +0100 27, 41 -- Received: from idfdcpripexmu03.inra.local (138.102.152.153) by 27, 41 -- idfdcpripexmu03.inra.local (138.102.152.153) with Microsoft SMTP Server (TLS) 27, 41 -- id 15.0.1395.4; Thu, 21 Feb 2019 17:46:48 +0100 27, 41 -- Received: from idfdcpripexmu03.inra.local ([fe80::7964:d04c:1360:fb50]) by 27, 41 -- idfdcpripexmu03.inra.local ([fe80::7964:d04c:1360:fb50%22]) with mapi id 27, 41 -- 15.00.1395.000; Thu, 21 Feb 2019 17:46:48 +0100 27, 41 -- From: Jeannine Lherminier {jeannine.lherminier-at-inra.fr} 27, 41 -- To: "lopezcl-at-ohsu.edu" {lopezcl-at-ohsu.edu} 27, 41 -- CC: "Microscopy-at-Microscopy.com" {Microscopy-at-Microscopy.com} 27, 41 -- Subject: RE: [Microscopy] RE: viaWWW:Resharpened knife quality 27, 41 -- Thread-Topic: [Microscopy] RE: viaWWW:Resharpened knife quality 27, 41 -- Thread-Index: AQHUygFYIRWqpUgZmEiUF1y8vjwHP6XqdIKN 27, 41 -- Date: Thu, 21 Feb 2019 16:46:48 +0000 27, 41 -- Message-ID: {1550767608480.16437-at-inra.fr} 27, 41 -- References: {201902211611.x1LGBWFd022081-at-microscopy.com} 27, 41 -- In-Reply-To: {201902211611.x1LGBWFd022081-at-microscopy.com} 27, 41 -- Accept-Language: fr-FR, en-US 27, 41 -- Content-Language: fr-FR 27, 41 -- X-MS-Has-Attach: 27, 41 -- X-MS-TNEF-Correlator: 27, 41 -- x-ms-exchange-transport-fromentityheader: Hosted 27, 41 -- x-originating-ip: [138.102.156.18] 27, 41 -- Content-Type: text/plain; charset="iso-8859-1" 27, 41 -- MIME-Version: 1.0 27, 41 -- Content-Transfer-Encoding: 8bit 27, 41 -- X-MIME-Autoconverted: from quoted-printable to 8bit by microscopy.com id x1LGc4fG027255 ==============================End of - Headers==============================
From roddorva8uoea-at-gmail.com Thu Feb 21 12:07:03 2019 Return-Path: {roddorva8uoea-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.138] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x1LI71sr005342 for {microscopylistserverarchive7-at-microscopy.com} ; Thu, 21 Feb 2019 12:07:02 -0600 Received: from qnx.mdrost.com ([7.52.177.47]) by relay.2yahoo.com with NNFMP; Thu, 21 Feb 2019 12:58:57 -0500 Message-ID: {522F0691.85DEE73B-at-gmail.com}
Dear All,
.... I am absolutely astonished by the (few) answers/comments from "disappointed" users of Diatome knifes.
I bought, inherited and used regularly and intensively new and resharpened diamond knifes from Diatome ( TEM and semithin knifes) from 1975 to 2018 ( i.e. for over 40 years),
all in all I estimate that more than 20 knifes went through my hands and to sum it up: ALL were perfect without the smallest fault !
I can't understand the complaints when using a new knive in detecting "bad" areas, when I received a new or resharpened knive from Diatome I immediately inspected the edge at the highest possible magnification at my cutting machine ( Reichert Ultracut ), in my opinion any flaw(s) should have become visible in the "dark field" mode of its binocular, and, as said, there were never any flaws in praxi ...
by the way: one time I privately bought at ebay-USA a "new and unused" Diatome knive, when receiving it the seal of the storage box was broken and the knife was dull and useless...
although by the way: all my (few) mail and phone contacts with Diatome in Switzerland were positive and helpful.
greetings,
Peter Heimann
( Cell Biology, Univ. of Bielefeld, Germany; retired in 2017 )
==============================Original Headers============================== 12, 20 -- From peter.heimann-at-uni-bielefeld.de Thu Feb 21 13:29:27 2019 12, 20 -- Received: from smtp.uni-bielefeld.de (uhrz-exch-pmb10.ad.uni-bielefeld.de [129.70.208.136]) 12, 20 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1LJTQFs010471 12, 20 -- for {Microscopy-at-microscopy.com} ; Thu, 21 Feb 2019 13:29:27 -0600 12, 20 -- Received: from [192.168.188.34] (188.154.212.144) by 12, 20 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) with Microsoft SMTP 12, 20 -- Server (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_128_GCM_SHA256) id 12, 20 -- 15.1.1591.10; Thu, 21 Feb 2019 20:38:11 +0100 12, 20 -- To: {Microscopy-at-microscopy.com} 12, 20 -- From: Peter Heimann {peter.heimann-at-uni-bielefeld.de} 12, 20 -- Subject: Re: re-sharpened knife ( Peter Heimann ) 12, 20 -- Message-ID: {c807d7d6-6e27-1ade-ec6c-dfa0acc3148c-at-uni-bielefeld.de} 12, 20 -- Date: Thu, 21 Feb 2019 20:38:10 +0100 12, 20 -- User-Agent: Mozilla/5.0 (Windows NT 10.0; WOW64; rv:60.0) Gecko/20100101 12, 20 -- Thunderbird/60.5.1 12, 20 -- MIME-Version: 1.0 12, 20 -- Content-Type: text/plain; charset="utf-8"; format=flowed 12, 20 -- Content-Transfer-Encoding: 8bit 12, 20 -- X-ClientProxiedBy: uhrz-exch-pmb01.ad.uni-bielefeld.de (129.70.208.127) To 12, 20 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) ==============================End of - Headers==============================
Yes, I've also had lots of problems with Diatome diamond knives recently. We've had several resharpened and they produced knife marks and some areas on new knives are no better. I haven't complained to Diatome (but I should have done that). I, too, have been a loyal customer for 30+ years. It is sad to see the quality of their knives go to hell. They were always the best knives on the market. I now spend time apologizing to customers about the knife marks and re-section if necessary. I've even thought about making glass knives again (horrors!) but I'm too spoiled to go that route.
Hello all -- I don't have as much experience as many here (I've only been doing ultramicrotomy for 15 years or so) but my experience with Diatome knives has been the same as Peter Heimann's. I've used 3 Diatomes (all acquired new in different labs, the first probably in 2003 and the most recent in 2014), and they've all been flawless. The first of these was resharpened by them after years of use (in 2010, I think), and came back similarly flawless.
In a rare moment of more-than-adequate funding, I also acquired a MicroStar knife at the same time as the most recent Diatome. The quality of the MicroStar diamond edge has been just as good the Diatomes. However, the MicroStar's diamond was not set as precisely as any of the Diatomes. To be specific, the diamond is very slightly (a few micrometres) inset, such that in some cases the edges of the knife cannot be used without the specimen hitting the trough. (I apologise here: it's a bit hard to describe exactly how that works, but it is a problem.) The Diatomes I've used have never had this problem.
To be fair, I haven't contacted MicroStar about this issue; I don't know how common this problem is, or what their response would be. In my case, getting the problem fixed hasn't been necessary, since as long as I have two good diamond knives available, I want to use one for large survey sections (~1.2-1.5 mm wide, 70 nm thick) and one for much smaller and more delicate serial sections (~300 um wide, 50 nm thick). The MicroStar's fitting issues aren't a problem for survey-section work, while the Diatome's perfectly-set diamond is better for the serial work.
But most relevantly to this thread, and just to reiterate, I've had no reason to complain about Diatome knives, and have found them to be comparable in diamond and superior in setting to MicroStar's.
Aaron A. Heiss, Ph.D. Research Scientist and Simons Foundation Fellow Eunsoo Kim Laboratory Department of Invertebrate Zoology American Museum of Natural History Central Park West at 79th Street New York, NY 10024 USA
________________________________________ X-from: peter.heimann-at-uni-bielefeld.de {peter.heimann-at-uni-bielefeld.de} Sent: 21 February 2019 14:31 To: Aaron Heiss
Dear All,
.... I am absolutely astonished by the (few) answers/comments from "disappointed" users of Diatome knifes.
I bought, inherited and used regularly and intensively new and resharpened diamond knifes from Diatome ( TEM and semithin knifes) from 1975 to 2018 ( i.e. for over 40 years),
all in all I estimate that more than 20 knifes went through my hands and to sum it up: ALL were perfect without the smallest fault !
I can't understand the complaints when using a new knive in detecting "bad" areas, when I received a new or resharpened knive from Diatome I immediately inspected the edge at the highest possible magnification at my cutting machine ( Reichert Ultracut ), in my opinion any flaw(s) should have become visible in the "dark field" mode of its binocular, and, as said, there were never any flaws in praxi ...
by the way: one time I privately bought at ebay-USA a "new and unused" Diatome knive, when receiving it the seal of the storage box was broken and the knife was dull and useless...
although by the way: all my (few) mail and phone contacts with Diatome in Switzerland were positive and helpful.
greetings,
Peter Heimann
( Cell Biology, Univ. of Bielefeld, Germany; retired in 2017 )
==============================Original Headers============================== 12, 20 -- From peter.heimann-at-uni-bielefeld.de Thu Feb 21 13:29:27 2019 12, 20 -- Received: from smtp.uni-bielefeld.de (uhrz-exch-pmb10.ad.uni-bielefeld.de [129.70.208.136]) 12, 20 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1LJTQFs010471 12, 20 -- for {Microscopy-at-microscopy.com} ; Thu, 21 Feb 2019 13:29:27 -0600 12, 20 -- Received: from [192.168.188.34] (188.154.212.144) by 12, 20 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) with Microsoft SMTP 12, 20 -- Server (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_128_GCM_SHA256) id 12, 20 -- 15.1.1591.10; Thu, 21 Feb 2019 20:38:11 +0100 12, 20 -- To: {Microscopy-at-microscopy.com} 12, 20 -- From: Peter Heimann {peter.heimann-at-uni-bielefeld.de} 12, 20 -- Subject: Re: re-sharpened knife ( Peter Heimann ) 12, 20 -- Message-ID: {c807d7d6-6e27-1ade-ec6c-dfa0acc3148c-at-uni-bielefeld.de} 12, 20 -- Date: Thu, 21 Feb 2019 20:38:10 +0100 12, 20 -- User-Agent: Mozilla/5.0 (Windows NT 10.0; WOW64; rv:60.0) Gecko/20100101 12, 20 -- Thunderbird/60.5.1 12, 20 -- MIME-Version: 1.0 12, 20 -- Content-Type: text/plain; charset="utf-8"; format=flowed 12, 20 -- Content-Transfer-Encoding: 8bit 12, 20 -- X-ClientProxiedBy: uhrz-exch-pmb01.ad.uni-bielefeld.de (129.70.208.127) To 12, 20 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) ==============================End of - Headers==============================
indeed ( I did not comment on this) is the fine positioning of the diamond within the aluminum trough and the resin "glue" perfect whereas two other knifes from different maufacturers made problems in this respect when trying to cut difficult positioned re-embedded specimen blocks ( i.e. the block surface made contact with the resin cement before contact with the diamond) ...
another (positive) characteristic point is that the knife edge of Diatome knifes (at least in my hands) allowed for the water level to be lowered extremely without "breaking away" or "ripping off" from the knife edge and this pleasant feature was consistent over total life-time
best regards,
Peter ( Heimann )
#####################################
Am 21.02.2019 um 22:07 schrieb aheiss-at-amnh.org: } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html } ---------------------------------------------------------------------------- } } Hello all -- I don't have as much experience as many here (I've only been doing ultramicrotomy for 15 years or so) but my experience with Diatome knives has been the same as Peter Heimann's. I've used 3 Diatomes (all acquired new in different labs, the first probably in 2003 and the most recent in 2014), and they've all been flawless. The first of these was resharpened by them after years of use (in 2010, I think), and came back similarly flawless. } } In a rare moment of more-than-adequate funding, I also acquired a MicroStar knife at the same time as the most recent Diatome. The quality of the MicroStar diamond edge has been just as good the Diatomes. However, the MicroStar's diamond was not set as precisely as any of the Diatomes. To be specific, the diamond is very slightly (a few micrometres) inset, such that in some cases the edges of the knife cannot be used without the specimen hitting the trough. (I apologise here: it's a bit hard to describe exactly how that works, but it is a problem.) The Diatomes I've used have never had this problem. } } To be fair, I haven't contacted MicroStar about this issue; I don't know how common this problem is, or what their response would be. In my case, getting the problem fixed hasn't been necessary, since as long as I have two good diamond knives available, I want to use one for large survey sections (~1.2-1.5 mm wide, 70 nm thick) and one for much smaller and more delicate serial sections (~300 um wide, 50 nm thick). The MicroStar's fitting issues aren't a problem for survey-section work, while the Diatome's perfectly-set diamond is better for the serial work. } } But most relevantly to this thread, and just to reiterate, I've had no reason to complain about Diatome knives, and have found them to be comparable in diamond and superior in setting to MicroStar's. } } } Aaron A. Heiss, Ph.D. } Research Scientist and Simons Foundation Fellow } Eunsoo Kim Laboratory } Department of Invertebrate Zoology } American Museum of Natural History } Central Park West at 79th Street } New York, NY 10024 USA } } phone: 212-769-5838 } fax: 212-769-5277 } aheiss-at-amnh.org } } } ________________________________________ } X-from: peter.heimann-at-uni-bielefeld.de {peter.heimann-at-uni-bielefeld.de} } Sent: 21 February 2019 14:31 } To: Aaron Heiss } Subject: [Microscopy] Re: re-sharpened knife ( Peter Heimann ) } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- https://na01.safelinks.protection.outlook.com/?url=http%3A%2F%2Fwww.microscopy.com%2FMicroscopyListserver&data=01%7C01%7Caheiss%40amnh.org%7C171a4294cc90422e334108d698346589%7Cbe0003e8c6b9496883aeb34586974b76%7C0&sdata=Tt6V3Sb4FFAeZT2QrlwsJdFCdQ5UkzmWzCpiEvZvjUE%3D&reserved=0 } On-Line Help https://na01.safelinks.protection.outlook.com/?url=http%3A%2F%2Fwww.microscopy.com%2FMicroscopyListserver%2FFAQ.html&data=01%7C01%7Caheiss%40amnh.org%7C171a4294cc90422e334108d698346589%7Cbe0003e8c6b9496883aeb34586974b76%7C0&sdata=8RWFdlgM637Qc1fYxvG84LyulJ25ZmpFLo%2FFIqPENXU%3D&reserved=0 } ---------------------------------------------------------------------------- } } Dear All, } } .... I am absolutely astonished by the (few) answers/comments from } "disappointed"� users of Diatome knifes. } } I bought, inherited and used regularly and intensively new and } resharpened diamond knifes from Diatome ( TEM and semithin knifes) from } 1975 to 2018 ( i.e. for over 40 years), } } all in all I estimate that more than 20 knifes went through my hands and } to sum it up: ALL were perfect without the smallest fault ! } } I can't understand the complaints when using a new knive in detecting } "bad" areas, when I received a new or resharpened knive from Diatome I } immediately inspected the edge at the highest possible magnification at } my cutting machine ( Reichert Ultracut ), in my opinion any flaw(s) } should have become visible in the "dark field" mode of its binocular, } and, as said, there were never any flaws in praxi ... } } by the way: one time I privately bought at ebay-USA a "new and unused" } Diatome knive, when receiving it the seal of the storage box was broken } and the knife was dull and useless... } } although by the way: all my (few) mail and phone contacts with Diatome } in Switzerland were positive and helpful. } } greetings, } } Peter Heimann } } ( Cell Biology, Univ. of Bielefeld, Germany; retired in 2017 ) } } } } ==============================Original Headers============================== } 12, 20 -- From peter.heimann-at-uni-bielefeld.de Thu Feb 21 13:29:27 2019 } 12, 20 -- Received: from smtp.uni-bielefeld.de (uhrz-exch-pmb10.ad.uni-bielefeld.de [129.70.208.136]) } 12, 20 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1LJTQFs010471 } 12, 20 -- for {Microscopy-at-microscopy.com} ; Thu, 21 Feb 2019 13:29:27 -0600 } 12, 20 -- Received: from [192.168.188.34] (188.154.212.144) by } 12, 20 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) with Microsoft SMTP } 12, 20 -- Server (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_128_GCM_SHA256) id } 12, 20 -- 15.1.1591.10; Thu, 21 Feb 2019 20:38:11 +0100 } 12, 20 -- To: {Microscopy-at-microscopy.com} } 12, 20 -- From: Peter Heimann {peter.heimann-at-uni-bielefeld.de} } 12, 20 -- Subject: Re: re-sharpened knife ( Peter Heimann ) } 12, 20 -- Message-ID: {c807d7d6-6e27-1ade-ec6c-dfa0acc3148c-at-uni-bielefeld.de} } 12, 20 -- Date: Thu, 21 Feb 2019 20:38:10 +0100 } 12, 20 -- User-Agent: Mozilla/5.0 (Windows NT 10.0; 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==============================Original Headers============================== 7, 22 -- From peter.heimann-at-uni-bielefeld.de Thu Feb 21 15:24:51 2019 7, 22 -- Received: from smtp.uni-bielefeld.de (uhrz-exch-pmb10.ad.uni-bielefeld.de [129.70.208.136]) 7, 22 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1LLOogG001516 7, 22 -- for {Microscopy-at-microscopy.com} ; Thu, 21 Feb 2019 15:24:51 -0600 7, 22 -- Received: from [192.168.188.34] (188.154.212.144) by 7, 22 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) with Microsoft SMTP 7, 22 -- Server (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_128_GCM_SHA256) id 7, 22 -- 15.1.1591.10; Thu, 21 Feb 2019 22:33:35 +0100 7, 22 -- Subject: Re: [Microscopy] re-sharpened knife ( Peter Heimann ) 7, 22 -- To: {aheiss-at-amnh.org} , {Microscopy-at-microscopy.com} 7, 22 -- References: {201902212107.x1LL7bQh030268-at-microscopy.com} 7, 22 -- From: Peter Heimann {peter.heimann-at-uni-bielefeld.de} 7, 22 -- Message-ID: {59ea9564-3771-8c34-45e7-52035c058e37-at-uni-bielefeld.de} 7, 22 -- Date: Thu, 21 Feb 2019 22:33:34 +0100 7, 22 -- User-Agent: Mozilla/5.0 (Windows NT 10.0; WOW64; rv:60.0) Gecko/20100101 7, 22 -- Thunderbird/60.5.1 7, 22 -- MIME-Version: 1.0 7, 22 -- In-Reply-To: {201902212107.x1LL7bQh030268-at-microscopy.com} 7, 22 -- Content-Type: text/plain; charset="utf-8"; format=flowed 7, 22 -- Content-Transfer-Encoding: 8bit 7, 22 -- X-ClientProxiedBy: uhrz-exch-pmb09.ad.uni-bielefeld.de (129.70.208.135) To 7, 22 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) ==============================End of - Headers==============================
Just to add - we have used new and resharpened Diatome knives for 30+ years with no complaint at all. We send our knives back to Diatome for resharpening through an excellent and reliable agent here in Australia.
I don't disbelieve the dissatisfied people, but I am surprised, this is quite different from our experience.
cheers, Rosemary
Dr Rosemary White CSIRO Black Mountain GPO Box 1700 Canberra, ACT 2601 Australia
T 61 2 6246 5475 M 61 468 966 713 ________________________________________ X-from: peter.heimann-at-uni-bielefeld.de [peter.heimann-at-uni-bielefeld.de] Sent: Friday, 22 February 2019 8:25 a.m. To: White, Rosemary (A&F, Black Mountain)
thanks Aaron for your comment!
indeed ( I did not comment on this) is the fine positioning of the diamond within the aluminum trough and the resin "glue" perfect whereas two other knifes from different maufacturers made problems in this respect when trying to cut difficult positioned re-embedded specimen blocks ( i.e. the block surface made contact with the resin cement before contact with the diamond) ...
another (positive) characteristic point is that the knife edge of Diatome knifes (at least in my hands) allowed for the water level to be lowered extremely without "breaking away" or "ripping off" from the knife edge and this pleasant feature was consistent over total life-time
best regards,
Peter ( Heimann )
#####################################
Am 21.02.2019 um 22:07 schrieb aheiss-at-amnh.org: } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html } ---------------------------------------------------------------------------- } } Hello all -- I don't have as much experience as many here (I've only been doing ultramicrotomy for 15 years or so) but my experience with Diatome knives has been the same as Peter Heimann's. I've used 3 Diatomes (all acquired new in different labs, the first probably in 2003 and the most recent in 2014), and they've all been flawless. The first of these was resharpened by them after years of use (in 2010, I think), and came back similarly flawless. } } In a rare moment of more-than-adequate funding, I also acquired a MicroStar knife at the same time as the most recent Diatome. The quality of the MicroStar diamond edge has been just as good the Diatomes. However, the MicroStar's diamond was not set as precisely as any of the Diatomes. To be specific, the diamond is very slightly (a few micrometres) inset, such that in some cases the edges of the knife cannot be used without the specimen hitting the trough. (I apologise here: it's a bit hard to describe exactly how that works, but it is a problem.) The Diatomes I've used have never had this problem. } } To be fair, I haven't contacted MicroStar about this issue; I don't know how common this problem is, or what their response would be. In my case, getting the problem fixed hasn't been necessary, since as long as I have two good diamond knives available, I want to use one for large survey sections (~1.2-1.5 mm wide, 70 nm thick) and one for much smaller and more delicate serial sections (~300 um wide, 50 nm thick). The MicroStar's fitting issues aren't a problem for survey-section work, while the Diatome's perfectly-set diamond is better for the serial work. } } But most relevantly to this thread, and just to reiterate, I've had no reason to complain about Diatome knives, and have found them to be comparable in diamond and superior in setting to MicroStar's. } } } Aaron A. Heiss, Ph.D. } Research Scientist and Simons Foundation Fellow } Eunsoo Kim Laboratory } Department of Invertebrate Zoology } American Museum of Natural History } Central Park West at 79th Street } New York, NY 10024 USA } } phone: 212-769-5838 } fax: 212-769-5277 } aheiss-at-amnh.org } } } ________________________________________ } X-from: peter.heimann-at-uni-bielefeld.de {peter.heimann-at-uni-bielefeld.de} } Sent: 21 February 2019 14:31 } To: Aaron Heiss } Subject: [Microscopy] Re: re-sharpened knife ( Peter Heimann ) } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- https://na01.safelinks.protection.outlook.com/?url=http%3A%2F%2Fwww.microscopy.com%2FMicroscopyListserver&data=01%7C01%7Caheiss%40amnh.org%7C171a4294cc90422e334108d698346589%7Cbe0003e8c6b9496883aeb34586974b76%7C0&sdata=Tt6V3Sb4FFAeZT2QrlwsJdFCdQ5UkzmWzCpiEvZvjUE%3D&reserved=0 } On-Line Help https://na01.safelinks.protection.outlook.com/?url=http%3A%2F%2Fwww.microscopy.com%2FMicroscopyListserver%2FFAQ.html&data=01%7C01%7Caheiss%40amnh.org%7C171a4294cc90422e334108d698346589%7Cbe0003e8c6b9496883aeb34586974b76%7C0&sdata=8RWFdlgM637Qc1fYxvG84LyulJ25ZmpFLo%2FFIqPENXU%3D&reserved=0 } ---------------------------------------------------------------------------- } } Dear All, } } .... I am absolutely astonished by the (few) answers/comments from } "disappointed"� users of Diatome knifes. } } I bought, inherited and used regularly and intensively new and } resharpened diamond knifes from Diatome ( TEM and semithin knifes) from } 1975 to 2018 ( i.e. for over 40 years), } } all in all I estimate that more than 20 knifes went through my hands and } to sum it up: ALL were perfect without the smallest fault ! } } I can't understand the complaints when using a new knive in detecting } "bad" areas, when I received a new or resharpened knive from Diatome I } immediately inspected the edge at the highest possible magnification at } my cutting machine ( Reichert Ultracut ), in my opinion any flaw(s) } should have become visible in the "dark field" mode of its binocular, } and, as said, there were never any flaws in praxi ... } } by the way: one time I privately bought at ebay-USA a "new and unused" } Diatome knive, when receiving it the seal of the storage box was broken } and the knife was dull and useless... } } although by the way: all my (few) mail and phone contacts with Diatome } in Switzerland were positive and helpful. } } greetings, } } Peter Heimann } } ( Cell Biology, Univ. of Bielefeld, Germany; retired in 2017 ) } } } } ==============================Original Headers============================== } 12, 20 -- From peter.heimann-at-uni-bielefeld.de Thu Feb 21 13:29:27 2019 } 12, 20 -- Received: from smtp.uni-bielefeld.de (uhrz-exch-pmb10.ad.uni-bielefeld.de [129.70.208.136]) } 12, 20 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1LJTQFs010471 } 12, 20 -- for {Microscopy-at-microscopy.com} ; Thu, 21 Feb 2019 13:29:27 -0600 } 12, 20 -- Received: from [192.168.188.34] (188.154.212.144) by } 12, 20 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) with Microsoft SMTP } 12, 20 -- Server (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_128_GCM_SHA256) id } 12, 20 -- 15.1.1591.10; Thu, 21 Feb 2019 20:38:11 +0100 } 12, 20 -- To: {Microscopy-at-microscopy.com} } 12, 20 -- From: Peter Heimann {peter.heimann-at-uni-bielefeld.de} } 12, 20 -- Subject: Re: re-sharpened knife ( Peter Heimann ) } 12, 20 -- Message-ID: {c807d7d6-6e27-1ade-ec6c-dfa0acc3148c-at-uni-bielefeld.de} } 12, 20 -- Date: Thu, 21 Feb 2019 20:38:10 +0100 } 12, 20 -- User-Agent: Mozilla/5.0 (Windows NT 10.0; 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==============================Original Headers============================== 7, 22 -- From peter.heimann-at-uni-bielefeld.de Thu Feb 21 15:24:51 2019 7, 22 -- Received: from smtp.uni-bielefeld.de (uhrz-exch-pmb10.ad.uni-bielefeld.de [129.70.208.136]) 7, 22 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x1LLOogG001516 7, 22 -- for {Microscopy-at-microscopy.com} ; Thu, 21 Feb 2019 15:24:51 -0600 7, 22 -- Received: from [192.168.188.34] (188.154.212.144) by 7, 22 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) with Microsoft SMTP 7, 22 -- Server (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_128_GCM_SHA256) id 7, 22 -- 15.1.1591.10; Thu, 21 Feb 2019 22:33:35 +0100 7, 22 -- Subject: Re: [Microscopy] re-sharpened knife ( Peter Heimann ) 7, 22 -- To: {aheiss-at-amnh.org} , {Microscopy-at-microscopy.com} 7, 22 -- References: {201902212107.x1LL7bQh030268-at-microscopy.com} 7, 22 -- From: Peter Heimann {peter.heimann-at-uni-bielefeld.de} 7, 22 -- Message-ID: {59ea9564-3771-8c34-45e7-52035c058e37-at-uni-bielefeld.de} 7, 22 -- Date: Thu, 21 Feb 2019 22:33:34 +0100 7, 22 -- User-Agent: Mozilla/5.0 (Windows NT 10.0; WOW64; rv:60.0) Gecko/20100101 7, 22 -- Thunderbird/60.5.1 7, 22 -- MIME-Version: 1.0 7, 22 -- In-Reply-To: {201902212107.x1LL7bQh030268-at-microscopy.com} 7, 22 -- Content-Type: text/plain; charset="utf-8"; format=flowed 7, 22 -- Content-Transfer-Encoding: 8bit 7, 22 -- X-ClientProxiedBy: uhrz-exch-pmb09.ad.uni-bielefeld.de (129.70.208.135) To 7, 22 -- uhrz-exch-pmb10.ad.uni-bielefeld.de (129.70.208.136) ==============================End of - Headers==============================
I would like to add my "official" comments on the knife matter. I am not upset with Diatome or EMS as they have always bent over backwards to make right any problem I've had, and most often to their vast expense. But back to the issue of diamond knives.
Yes I have had problems with Diatome knives from time to time, but with diligence Diatome has always re-sharpened or replaced my knives no problem. At one point a few months ago I still had very confusing problems with brand new knives being scored or damaged seemingly as opened or after using only one time. It looked like they were shipped to me that way. I even sent images to Diatome and EMS to show the scraping and marks I was getting. Helmut Gnaegi came all the way from Switzerland just to visit our lab and check the issues with the diamond knives we were experiencing.
It turned out after an hour or so of testing different samples and parameters, the clearance angle on my microtome was not accurate. The factory settings had been tweaked somehow. The clearance angle was no longer correct at the setting it showed. So instead of the knife clearance angle being 6 degrees, it was actually more like 3 degrees. That in itself would cause major scraping all along the knife and also damage the knife edge. We had to adjust the knife clearance angle up to 9 degrees in order for the water level and knife to cut properly. None of us would have thought that the clearance angle setting would be off. It's not something that I change. Helmut noticed it when he looked at the boat. The water was not level as it should be.
In the Leica UC7 microtome, the lighting is so good that I didn't even notice a difference in the water level lines. I was actually still able to cut at the wrong angle it just damaged the knife right away. Thereby making me think that I received damaged or insufficiently sharpened knives for months. Since Helmut's visit and the clearance angle revelation, I've had no other issues with the scraping or heavy knife marks. I am grateful to Helmut and to EMS for his visit. I relayed this information to others I knew too in the field. Whether they used it or not I don't know.
We work extensively with Drosophila tissue. The exoskeleton makes for us many problems in sectioning. So we know that we have to use Histo knives for making light slides, and only Ultra knives for TEM imaging. The two knives are sharpened differently it seems. We even have to request deeper sharpening at times which has helped. Diatome has had their own issues on the industrial level that affect manufacturing too. It's just the nature of this intricate business. For us, we cut up dead things, and dead things can be hard to deal with at times!
My advice to others is that if you are experiencing problems, take pictures, send micrographs, explain what is happening and systematically investigate the issue. Then perhaps an agreement can be made that will be profitable for both sides.
Thank you,
Lita Duraine Certified TEM Specialist HHMI- Molecular Genetics Duncan Neurological Research Institute Baylor College of Medicine 1250 Moursund St. Houston, TX 77030 Office: 832-824-8704 MS: N1125.50
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I am surprised at the current thread of complaints about Diatome Diamond knives. I have been in EM since the early 1970's and have used many different brands of diamond knives, some of which are no longer around. When I took over my current facility in 2001, I had the resources to finally buy Diatome knives which I did in a heartbeat. They are the best. Here in the U.S. Stacie Kirsch owner of Electron Microscopy Sciences will make sure things are corrected, if you have a problem. I am not saying the people having bad experiences are to be discounted, but I hope they all have tried to work with the vendor. I also caution about airing complaints in a public forum such as the MSA listserver. Like any public medium these days one needs to be careful of what is said. I have asked for feedback on products, but have asked that people respond privately. Remember, what is said can be misconstrued and there is always two sides (sometimes more) to a story.
Tom Bargar UNMC Electron Microscopy Core Facility 986395 Nebraska Medical Center Omaha, NE 68198-6395 402-559-7347 tbargar-at-unmc.edu
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My apologies to Diatome for my earlier post. I should have consulted with them as Lita Duraine did and worked out the knife issues. Her post was very helpful/informative. I will definitely test the knife angle on the ultramicrotome (it is never taken off 6 degrees).
Beth Richardson, Georgia Electron Microscopy
X-from: duraine-at-bcm.edu {duraine-at-bcm.edu} Sent: Thursday, February 21, 2019 5:04 PM To: Beth Richardson
Hello all,
I would like to add my "official" comments on the knife matter. I am not upset with Diatome or EMS as they have always bent over backwards to make right any problem I've had, and most often to their vast expense. But back to the issue of diamond knives.
Yes I have had problems with Diatome knives from time to time, but with diligence Diatome has always re-sharpened or replaced my knives no problem. At one point a few months ago I still had very confusing problems with brand new knives being scored or damaged seemingly as opened or after using only one time. It looked like they were shipped to me that way. I even sent images to Diatome and EMS to show the scraping and marks I was getting. Helmut Gnaegi came all the way from Switzerland just to visit our lab and check the issues with the diamond knives we were experiencing.
It turned out after an hour or so of testing different samples and parameters, the clearance angle on my microtome was not accurate. The factory settings had been tweaked somehow. The clearance angle was no longer correct at the setting it showed. So instead of the knife clearance angle being 6 degrees, it was actually more like 3 degrees. That in itself would cause major scraping all along the knife and also damage the knife edge. We had to adjust the knife clearance angle up to 9 degrees in order for the water level and knife to cut properly. None of us would have thought that the clearance angle setting would be off. It's not something that I change. Helmut noticed it when he looked at the boat. The water was not level as it should be.
In the Leica UC7 microtome, the lighting is so good that I didn't even notice a difference in the water level lines. I was actually still able to cut at the wrong angle it just damaged the knife right away. Thereby making me think that I received damaged or insufficiently sharpened knives for months. Since Helmut's visit and the clearance angle revelation, I've had no other issues with the scraping or heavy knife marks. I am grateful to Helmut and to EMS for his visit. I relayed this information to others I knew too in the field. Whether they used it or not I don't know.
We work extensively with Drosophila tissue. The exoskeleton makes for us many problems in sectioning. So we know that we have to use Histo knives for making light slides, and only Ultra knives for TEM imaging. The two knives are sharpened differently it seems. We even have to request deeper sharpening at times which has helped. Diatome has had their own issues on the industrial level that affect manufacturing too. It's just the nature of this intricate business. For us, we cut up dead things, and dead things can be hard to deal with at times!
My advice to others is that if you are experiencing problems, take pictures, send micrographs, explain what is happening and systematically investigate the issue. Then perhaps an agreement can be made that will be profitable for both sides.
Thank you,
Lita Duraine Certified TEM Specialist HHMI- Molecular Genetics Duncan Neurological Research Institute Baylor College of Medicine 1250 Moursund St. Houston, TX 77030 Office: 832-824-8704 MS: N1125.50
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Email: slockledge-at-tiptek.com Name: Scott P Lockledge
Organization: Tiptek, LLC
Title-Subject: [Filtered] Zeiss SEM Joystick Controller Lubricants
Message: Recently, we have experienced the joystick of a Zeiss SEM controller "sticking" and not releasing. The Zeiss service representative suggested trying a lubricant, but had no specific suggestions. I found this one online to be used successfully by gamers: Dow Corning Molykote 44 Medium Grease Lubricant.
Any experience with "sticking" joysticks, cleaning, or lubrication of them? Any suggestions would be appreciated.
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Email: leunissen-at-xtra.co.nz Name: Jan Leunissen
I have been following the correspondence re diamond knife issues and I feel the need to add a few words. No doubt mistakes are made, by everyone, everywhere and all the time, and like Rosemary White wrote, it is certainly not such that I disbelieve the dissatisfied people". Being in business myself I value criticism as it gives people a chance to seriously look into issues and see where improvements can be made or how users/scientists can be supported to get better results. Feedback is key. But also: negative public messages can easily make a big dent in a companys reputation, deservedly or not. Diatome to almost all of us is Helmut Gnaegi, If there is one person in business who really does everything he can to solve issues, to help research projects, then I would have to say it is Helmut. As far as experience is concerned: his 50th work anniversary with Diatome was just 3 weeks ago.
I admit, we do have some commercial interest in Diatome, since we proudly represent them in The Netherlands but there is more than business, there is also friendship and compassion.
I would urge everyone with questions or comments to contact Helmut, he is very approachable and will leave no stone unturned.
Jan Leunissen Dunedin, New Zealand
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The 7 lecture course on Piezoresponse Force Microscopy and Nanoelectromechanics is now available on the YouTube. The course is based on tutorials given at the PFM workshops in } 20 locations worldwide since 2006 (see https://pfm-workshop.weebly.com/ for partial information, or https://www.facebook.com/PFM.Workshop.Network for more recent updates), and includes the primers on PFM techniques developed at the Center for Nanophase Materials Sciences (www.cnms.ornl.gov).
The course includes ~350+ slides and ~7 hours of recording, and covers topics:
Lecture 1: Principles of PFM and electromechanics https://youtu.be/UsyRW2_Kp-Y
Lecture 2: Voltage-dependent contact mechanics and resolution theory https://youtu.be/BDmXUt4OOuY
Lecture 3: Dynamics in PFM https://youtu.be/XKx1wSs4 {https://youtu.be/XKx1wSs4uXM} uXM {https://youtu.be/XKx1wSs4uXM}
Lecture 4: PFM of ferroelectrics, polarization switching and patterning https://youtu.be/mYeZQ8d3Mjk
I would say to be careful and use very sparingly as a "wet" lube will just attract more dirt/dust which will end up further gumming things up. In the past on an Amray I used a Teflon based dry lubricant and a paraffin wax (not together). Have not had the issue on my Zeiss yet but would do the same if it came up. We clean it and dust weekly to prevent the problem and it seems to be working at least since 2011 when we bought her. Considered a graphite on the Amray but was wary of electrically bridging contacts as I didn't know how the controller worked at the time.
Scott Whittaker Lab Manager Imaging P.O. Box 37012 MRC-104 Room W150 Washington, DC 20013-7012 w 202.633.0891 whittaks-at-si.edu
SMITHSONIAN INSTITUTION NATIONAL MUSEUM OF NATURAL HISTORY Facebook | Twitter | Instagram
-----Original Message----- X-from: microscopy.listserver-at-gmail.com {microscopy.listserver-at-gmail.com} Sent: Thursday, February 21, 2019 8:01 PM To: Whittaker, Scott {WHITTAKS-at-si.edu}
-------- Forwarded Message --------
X-from: slockledge-at-tiptek.com
This Question/Comment was submitted to the Microscopy Listserver using the WWW based Form at http://microscopy.com/MicroscopyListserver/MLFormMail.html --------------------------------------------------------------------------- Remember this posting is most likely not from a Subscriber, so when replying please copy to both slockledge-at-tiptek.com, Microscopy-at-Microscopy.com so that all Microscopy Listserver Subscribers can benefit from our collective wisdom ---------------------------------------------------------------------------
Email: slockledge-at-tiptek.com Name: Scott P Lockledge
Organization: Tiptek, LLC
Title-Subject: [Filtered] Zeiss SEM Joystick Controller Lubricants
Message: Recently, we have experienced the joystick of a Zeiss SEM controller "sticking" and not releasing. The Zeiss service representative suggested trying a lubricant, but had no specific suggestions. I found this one online to be used successfully by gamers: Dow Corning Molykote 44 Medium Grease Lubricant.
Any experience with "sticking" joysticks, cleaning, or lubrication of them? Any suggestions would be appreciated.
Login Host: 100.14.74.18 Listserver Email Form V - 20120416 ---------------------------------------------------------------------------
CeB6 is a little bit more expensive than a LaB6, this would be the only disadvantage I could think about… It is less sensitive to contamination than LaB6, yet you will still need a clean ultra high-vacuum in the gun (although not as low as a FEG). CeB6 has the advantage that it requires a lower evaporation temperature and it has a lower work function (2.7 eV for LaB6 vs 2.4 eV for CeB6). Therefore, you will get a longer lifetime of CeB6 over LaB6, and a slightly better brightness.
If you can afford a CeB6, go for it! You can also contact Mike Jercinovic at UMass Amherst (USA), he has more experience than I do with LaB6 vs CeB6 - I actually got all the information listed above from him when I was a postdoc at UMass Amherst :)
Julien
########################### *Dr. Julien Allaz *Head assistant for SEM/EPMA Inst. für Geochemie und Petrologie ETH Zürich NW E 84 Clausiusstrasse 25 8092 Zürich Switzerland
From solizbula031ioi-at-gmail.com Fri Feb 22 21:38:46 2019 Return-Path: {solizbula031ioi-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.136] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x1N3cjXq017563 for {microscopylistserverarchive7-at-microscopy.com} ; Fri, 22 Feb 2019 21:38:46 -0600 Received: from unknown (HELO mxs.perenter.com) (Sat, 23 Feb 2019 07:38:43 +0400) by smtp4.cyberemailings.com with QMQP; Sat, 23 Feb 2019 07:38:43 +0400 Received: from unknown (195.134.152.5) by mail.webhostings4u.com with QMQP; Sat, 23 Feb 2019 07:34:42 +0400 Received: from unknown (HELO webmail.halftomorrow.com) (Sat, 23 Feb 2019 07:20:46 +0400) by m1.gns.snv.thisdomainl.com with LOCAL; Sat, 23 Feb 2019 07:20:46 +0400 Message-ID: {EA958D7E.E33F5042-at-gmail.com}
Arunas,
In addition to the HV alignment that you did, I am going to assume that you did the whole alignment for the JEOL 2100F. If you don't have the full alignment procedure, send me an email at scott dot d dot walck2 dot ctr at mail dot mil and I will send you my alignment procedure that I require every user to perform at the beginning of their session.
Follow these steps to get your SAED pattern on the phosphor screen(s): 1) In TEM mode without the SAD aperture in (you can also do this without the Obj aperture in), hit the Std focus button. 2) Above 40kX (200kX is better), raise/lower the sample to get minimum contrast (Your sample is now focused and the diffraction pattern is formed in the back focal plane of the objective lens.) Use a live FFT to help you find the minimum contrast. 3) Lower your TEM magnification to the desired value and center your sample area. 4) Put in the appropriate SAD aperture and center it. 5) Turn the Brightness Knob fully clockwise. If you can read the JEOLS Hex values, they should read "FFFF". Regardless, you will hear a beep when you have turned it fully clockwise. 6) Press the SA DIFF button and select the desired cameral length. 7) Center the Transmitted spot with the PLA button selected and using the Def controls. (This is the step that I think that you are missing in your procedure.) 8) Focus the Diffraction spot with Diff Focus (while using the binoculars). This is adjusting the Intermediate 1 lens to grab the back focal plane of the objective lens for the projector lens system. The back focal plane is where the diffraction pattern is formed. 9) If while focusing the IL1, you see astigmatism in the spot, correct it. You have to select IL stig on the TEMCON screen, there is no button for it on the control pads. Now this gets tricky. You have to turn the Dif Focus button continuously through focus while adjusting first the X DEF control and then the Y DEF control to get rid of the IL astigmatism while all the time watching through the binoculars. You can look like a monkey while doing it, so consider not having anybody around who might witness you doing it.
This is actually the basic procedure for any microscope, not just the JEOL 2100F (other than the names of the specific controls.) You should have done exactly this procedure one time for each camera length with your calibration standard (gold or aluminum polycrystalline evaporated films) and saved them in Digital Micrograph. You need to follow this procedure for every unknown sample so that you have duplicated what was done for your standard at the selected camera length. The key to success is reproducibility. You should have about a 1-2% error or better. Note: not only have I done this in DM for every camera length, I also use Dave Mitchell's DiffTools script and have calibrated all of the camera lengths in that as well. The good thing is that you can use the same patterns for both.
Recording patterns using a digital camera: 10) If you are using a digital camera to record the pattern, lower the exposure time to protect the camera. 11) In Digital Micrograph, draw two lines from corner to opposite corner to find the center of the micrograph. 12) Put the controls in PLA mode and get ready to quickly center the diffraction pattern by putting the transmitted spot at the center cross 13) Lift the screen and center the beam at the cross, QUICKLY. Then lower the screen. 14) Now, use the beam block and center it while using the binoculars. Note: if the beam block drifts on you, you need to call the service engineer and have him tighten it so that it is stiff and takes effort to move it. That way it will not move during collection of your diffraction pattern. 15) Lift the screen. If you are using DM and View with Bin3, put your exposure at about 0.1 sec. You may have to adjust the beam block carefully to make sure that any brightness around it is uniform on both sides. Do this very carefully so that you don't expose the camera to the full spot. 16) Using the mouse, read the intensity of the brightest spots to find the maximum intensity in the pattern by reading the values in DM. 17) Using the intensity that you found, increase the exposure until that spot that you found is just under the saturation point of the camera. 16-17 alternative) Write a DM script that finds the maximum value in the pattern and calculates the appropriate Record exposure. EASY TO DO. 18) Lower the exposure of the View to very low again. 19) Set your record exposure and take an image. Depending on what aperture you have in, this can be a few seconds to more than 60 seconds. Avoid the temptation to increase the brightness to get faster patterns. You want the brightness fully clockwise because you want the beam as parallel as possible.
This gives you a very good diffraction pattern image with the beam block in, but you don't have the center of the pattern.
On older machines, it was easy to double expose a pattern a second time with a shorter exposure and with the beam block out to record the transmitted spot. It is a little more involved to do it with a digital camera. 20) While you are recording the long exposure in DM, change the Record exposure to something like 0.02 to 0.08 s depending on how bright your transmitted spot is. 21) When the recording is finished, quickly remove the beam block (that is why you changed the exposure to a short one in the View) and press the Record button to take another pattern with the short exposure. 22) When it is finished, immediately press the F6 button (this should be the Beam Blank if it hasn't been changed from the default setting) to blank the beam, lower the screen, and then press F6 again to un-blank the beam. 23) You have two patterns now. Save, but do not close the first one. You have options how you want to use the second pattern with the transmitted spot. You can find the X,Y coordinate with the maximum intensity and note that on the first pattern. You can add the two patterns together. (If you do this, then you also have to copy the tags from the first pattern to the resultant image.) What I did was write a little script that selects and copies a center square from the second image that includes the transmitted spot and pastes it into the image of the first. I then add a "+" to the name and save it in the directory where the first image was saved. With the transmitted beam marked, it is very easy to center the pattern for diffraction analysis software.
I hope this helps. -Scott
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Title-Subject: [Filtered] Tips for TEM SAED JEOL 2100F
Message: Hello,
I would like to ask some practical tips on performing SAED on a JEOL 2100F TEM. I am a complete newbie to TEM diffraction and the "2100 user manual" diffraction chapter is rather limited in describing influence of various settings (or recommendation of it) on the outcome of the diffraction patterns i.e. use of condenser lenses, alpha, spot values, required/suggested alignment/correction procedures. I usually (1)focus on the sample in question at about 100kx, (2) perform voltage centering alignment (HT WOB), (3) WOB Y/X correction. And then switch to the SAED procedure in chapter 5.5.1 of the manual.
My samples are micron sized fly ash particles (silicates, aluminosilicates). Fixed on holey carbon films on copper mesh. The TEM is operated at 200kV. So far one of the most notable "problems" I have is: (1)After selecting/centering the area of interest on the fluorescent screen (SA MAG mode, field limiting aperture inserted) I switch to SA DIFF mode and the beam shifts position to the top left (midway radius) on the fluorescent screen which makes navigation on the sample very difficult. (2)Using the DIFF FOCUS knob to focus the beam into a small spot, the diffraction patterns do not appear completely spherical (mild ellipse).
Any practical tips/steps on setting up the scope for the best SAED experience would be greatly appreciated.
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Message: Hi, I am trying to cut retinal longitudinal sections with a glass knives on a brand new ultramicrotome. I am using both 6.4 mm and 10 mm thick glass. I get chatter and shredding with 70-90 nm, although the sections look better at 90 nm. When I do semi-thins for LM, the viewing is fine with Toluidine blue O staining. Any suggestions? Thanks! Vickie
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I would say to be careful and use very sparingly as a "wet" lube will just attract more dirt/dust which will end up further gumming things up. In the past on an Amray I used a Teflon based dry lubricant and a paraffin wax (not together). Have not had the issue on my Zeiss yet but would do the same if it came up. We clean it and dust weekly to prevent the problem and it seems to be working at least since 2011 when we bought her. Considered a graphite on the Amray but was wary of electrically bridging contacts as I didn't know how the controller worked at the time.
Scott Whittaker Lab Manager Imaging P.O. Box 37012 MRC-104 Room W150 Washington, DC 20013-7012 w 202.633.0891 whittaks-at-si.edu
SMITHSONIAN INSTITUTION NATIONAL MUSEUM OF NATURAL HISTORY Facebook | Twitter | Instagram
-----Original Message----- X-from: microscopy.listserver-at-gmail.com {microscopy.listserver-at-gmail.com} Sent: Thursday, February 21, 2019 8:01 PM To: Whittaker, Scott {WHITTAKS-at-si.edu}
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Email: slockledge-at-tiptek.com Name: Scott P Lockledge
Organization: Tiptek, LLC
Title-Subject: [Filtered] Zeiss SEM Joystick Controller Lubricants
Message: Recently, we have experienced the joystick of a Zeiss SEM controller "sticking" and not releasing. The Zeiss service representative suggested trying a lubricant, but had no specific suggestions. I found this one online to be used successfully by gamers: Dow Corning Molykote 44 Medium Grease Lubricant.
Any experience with "sticking" joysticks, cleaning, or lubrication of them? Any suggestions would be appreciated.
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CeB6 is a little bit more expensive than a LaB6, this would be the only disadvantage I could think about… It is less sensitive to contamination than LaB6, yet you will still need a clean ultra high-vacuum in the gun (although not as low as a FEG). CeB6 has the advantage that it requires a lower evaporation temperature and it has a lower work function (2.7 eV for LaB6 vs 2.4 eV for CeB6). Therefore, you will get a longer lifetime of CeB6 over LaB6, and a slightly better brightness.
If you can afford a CeB6, go for it! You can also contact Mike Jercinovic at UMass Amherst (USA), he has more experience than I do with LaB6 vs CeB6 - I actually got all the information listed above from him when I was a postdoc at UMass Amherst :)
Julien
########################### *Dr. Julien Allaz *Head assistant for SEM/EPMA Inst. für Geochemie und Petrologie ETH Zürich NW E 84 Clausiusstrasse 25 8092 Zürich Switzerland
Thanks for your reply. We have been used LaB6 emmiter in our TEM Tecnai ST20. We used Denka and Kimball. We had a look at the LaB6 and CeB6 specs in EMS website and found out they are pretty much they same, but CeB6 has a lower vapour pressure, and perhaps a lower work funcion, and it might have a longer life. But what puzzled us is that neither Kimball nor Denka produce CeB6, so we are wondering about its quality, though we would like to give it a try. But want to hear few more opinions before make our decision.
Regards,
On Thu, 21 Feb 2019, 19:10 Straszheim, Warren E [BIOTC], {wesaia-at-iastate.edu {mailto:wesaia-at-iastate.edu} } wrote:
I have not used one, but I think it would be quite comparable. I am used to LaB6 filaments in higher end research microscopes. I have only ever heard of CeB6 in desktop microscopes. CeB6 should be better than tungsten and maybe just a little worse than LaB6. If it is in a desktop microscope, I would be more concerned about the other design details. How is the rest of the column? How does it compare to a regular research microscope?
For our service lab, we run a field emitter on an FEI Quanta that is now rated at 1 nm resolution. We routinely push 100kx (based on a 5-inch Polaroid reference). If you based it on the image enlarged to the computer monitor, we would be pushing 300kx. How does that compare to your spec?
Warren Straszheim
-----Original Message----- From: microscopy.listserver-at-gmail.com {mailto:microscopy.listserver-at-gmail.com} [mailto:microscopy.listserver-at-gmail.com {mailto:microscopy.listserver-at-gmail.com} ] Sent: Thursday, February 21, 2019 3:47 PM To: Straszheim, Warren E [BIOTC] Subject: [Microscopy] Fwd: LaB6 or CeB6?
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I would like to hear from the pros and cons of the cathode CeB6 in comparison to the LaB6?
Kind regards,
-- Erico Freitas
Physicist/Microscopist at Center of Microscopy Universidade Federal de Minas Gerais (UFMG) Av. Antônio Carlos, 6627, Campus Pampulha, Belo Horizonte, MG, Brazil. ZIP Code 31270-901. +55-31-3409-7573 +55-31-3409-7575
Coordinator:Transmission Electron Microscopy laboratory
Electron Microscope Operator (f/m) FULL TIME (40h)
IST Austria is a constantly growing international institute for conducting frontier research in the life, physical, and formal sciences, located in Klosterneuburg on the outskirts of Vienna in Austria. Electron Microscopy facility at IST Austria is expanding. To strengthen our team, we are looking for person, who will be highly motivated to take over EM related responsibility in a challenging international environment.
Responsibilities . Operating of EM and data acquisition by means of EMs (SEMs, S/TEMs). . Monitoring of EMs, regular system check including systems alignment and maintenance. . Training, assistance, on-site support and supervision of users. . Monitoring of compliance with rules. . EM Image/data processing. . Active contribution to the development of the EM facility. Requirements . Deep understanding of EM principle, image formation and practical experience with S/TEM and SEM. . Experience with tomography data collection and data processing. . Experience with EDS (SEM & STEM) . Practical experience with FIB and/or cryo-EM applications is an advantage. . Knowledge of EM image/data processing. . Excellent team player that can also work independently. . High degree of reliability, organizational and interpersonal skills. . Service oriented approach towards researches. . Very good communication, presentation and writing skills in English.
To apply for this position send your application in one combined pdf (including CV, certificates and references) by e-mail to: recruiting-at-ist.ac.at Contact Ludek Lovicar Manager of Electron Microscopy Facility Phone: +43-(0)2243 9000 1066 Email: ludek.lovicar-at-ist.ac.at Website: www.ist.ac.at
================================= Ludek Lovicar, PhD Manager of Electron Microscopy Facility Scientific Services Unit Institute of Science and Technology Austria Am Campus 1 3400 Klosterneuburg Austria
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Email: slc6-at-lehigh.edu Name: Sharon Coe
Organization: Lehigh University
Title-Subject: [Filtered] Lehigh University Microscopy School 2019
Message: Now accepting registrations for the 49th annual Lehigh Microscopy School which will be held on the campus of Lehigh University, Bethlehem, PA, June 2-7, 2019. All courses, lecturers and instrumentation will be together for what promises to be a phenomenal week! Course offering include: SEM and X-ray Microanalysis Introduction to SEM and EDS for the New Operator Introduction to TEM (new Course) Transmission Electron Microscopy Focused Ion Beam: Instrumentation and Applications Problem Solving: Interpretation and Analysis of SEM/EDS/EBSD Data Quantitative X-ray Microanalysis: Problem Solving Using EDS and WDS Techniques. Register and pay in full by April 12 for an early bird discount! Contact: Sharon Coe (sharon.coe-at-Lehigh.edu) or Nikki Rump (nikki.rump-at-Lehigh.edu). See www.Lehigh.edu/microscopy for registration form, prices, and details about courses, lecturers, and instrument suppliers. Scholarships available for full-time graduate students.
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Email: tskrzypek-at-kul.pl Name: Tomasz
Organization: Laboratory of Electron Microscopy, Lublin
Title-Subject: [Filtered] EM 900 Zeiss
Message: Dear Colleagues, please help me with the problem of water flow in the Zeiss EM900 microscope. During work, a colleague felt the smell of burning and the message "check water" appeared (red lamp). Flow and water pressure are fine. Probably it is about a sensor that has been destroyed, maybe a short circuit on the board? Please help and best regards.
Tomasz
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Email: nikd-at-vsl.cua.edu Name: Nikolaus J. Deems
Organization: Vitreous State Laboratory
Title-Subject: [Filtered] AZtec 4.0
Message: Does anyone know how, when copying an image, how to change scale bar/font size relative to the image resolution?
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Join us for the webinar series on X-ray Computed Tomography for Materials Science to find out how X-ray CT can help your research.
When: Apr 3, 2019 11:00 AM Pacific Time Part 1: X-ray Computed Tomography for Materials Science: Introduction
You will learn during the first webinar: - What X-ray CT is - How X-ray CT works - How X-ray CT can be applied to materials science
The webinar series will cover image analysis and a number of application examples of food, pharmaceutical, composite materials etc.
To lean more, visit: https://www.rigaku.com/en/webinars/x-ray_ct_introduction
Recording of the webinar will be available for registered attendees.
Hope to see you there.
Aya Takase . Senior Scientist Rigaku Americas Corporation 9009 New Trails Drive . The Woodlands, TX 77381 USA T: 281-362-2300ex 208 . F: 281-364-3628
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Greetings,
The Monash Centre for Electron Microscopy (MCEM, see https://www.monash.edu/researchinfrastructure/mcem) is seeking to employ an Electron Microscopist to manage and develop MCEM's focussed ion beam capability and provide advanced expertise and training to support and enable the work of researchers using the centre.
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Email: tong.wang-at-asrc.cuny.edu Name: Tong Wang
Organization: ASRC at GC of CUNY
Title-Subject: [Filtered] Research Faculty - Nanoscience Initiative - Advanced Science Research Center in New York, New York
Message: Dear Colleagues, The Nanoscience Initiative (nanoscience.asrc.cuny.edu) at the CUNY Advanced Science Research Center (ASRC) invites applications for a full-time research faculty (open rank). Research Faculty hold full-time, non-tenure track positions and may serve as principal or co-principal investigators on grants or contracts, manage postdoctoral fellows and their research projects or supervise graduate or undergraduate student research. While they may participate in instructional programs, such as lectures or demonstrations, they are not assigned regular teaching duties. For further information and/or application please see:
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From wandaver2uruvo-at-gmail.com Tue Mar 5 16:57:30 2019 Return-Path: {wandaver2uruvo-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.206] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x25MvSIF010328 for {microscopylistserverarchive7-at-microscopy.com} ; Tue, 5 Mar 2019 16:57:29 -0600 Received: from rly04.hottestmile.com ([Wed, 06 Mar 2019 10:03:24 +1100]) by qnx.mdrost.com with SMTP; Wed, 06 Mar 2019 10:03:24 +1100 Received: from unknown (119.89.219.180) by mtu23.bigping.com with ASMTP; Wed, 06 Mar 2019 10:00:08 +1100 Received: from smtp4.cyberemailings.com ([80.19.129.164]) by webmail.halftomorrow.com with SMTP; Wed, 06 Mar 2019 09:58:13 +1100 Received: from mail.naihautsui.co.kr [86.44.15.97] by group21.345mail.com with ASMTP; Wed, 06 Mar 2019 09:49:51 +1100 Received: from smtp.endend.nl ([65.163.141.208]) by public.micromail.com.au with QMQP; Wed, 06 Mar 2019 09:35:05 +1100 Message-ID: {42831392.667C4BC0-at-gmail.com}
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Message: We have large pieces of human brain samples taken during surgery that need to be processed for high contrast TEM. The remaining blood in the samples causes problems with the osmium and thiocarbohydrazide reactions.Does anyone know what can be used to "quench" the blood so it becomes less reactive. thanks in advance JoAnn
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Email: rvancamp-at-kettering.edu Name: R. Van Camp
Organization: Kettering University
Title-Subject: [Filtered] Questions: How to drying oils on Formvar
Message: I am currently working with a few fatty acids as a component of samples. I am finding oleic acid to be problematic and suspect I need to find a better way to dry the sample prior to placing it in the TEM.
Formvar coated grids are usually prepared with a layer or two of KimWipe behind them placed on top of my business card for additional moisture removal capacity, if necessary, and convenience in handling the grid. Samples are deposited onto each grid by dispensing a few drops from a disposable glass pipette (emphasize few). My practice is to place each grid in a desiccator cabinet for at least 24 hours before it is examined in our TEM.
This is materials science research performed at 200 kV in a JEM-2100 Plus using a W-hairpin filament. Beam current is ~15 uA.
I have observed sample vanish or, potentially grossly relocate, while attempting to focus on a specimen. As I decreased magnification to scan for a new site I observed dark rings surrounding the current specimen. I have never burned through a grid coating regardless of its composition so, I suspect the oleic acid is interacting with the electrons and enabling some currently unknown phenomena manifesting itself with the oleic acid or the acid/Formvar. Perhaps the heat deposited into the oil is warming or deteriorating the Formvar in some way.
Please let me know if you have suggestions for treating these oily grids before they are placed in the TEM.
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Thank you everyone for the suggestions to use sodium metaperiodate or hydrogen peroxide to quench the activity of blood cells during the processing. I am concerned that those chemicals may affect the quality of the ultrastructure, especially the sodium metaperiodate.
I am processing large blocks- greater than i.2 mm in thickness for connectomics study. I need to amplify the osmium staining and everything is done en bloc using THC to amplify the reduced osmium staining. This is followed by UA and lead acetate en bloc. We are not doing any post staining or immuno. Perhaps a low concentration of sodium peroxide will do the trick. I can try it on 1 or 2 of the slices and we can try to target the areas that have the clots.
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Title-Subject: [Filtered] Looking for Application specialist
Message: Hello, TESCAN USA is looking for FIB/SEM application specialist. If anybody is interested, please fill free to contact ldumas-at-tescan-usa.com. Thanks
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From infoihioa-at-ns2.mgdots.co Mon Mar 11 03:47:07 2019 Return-Path: {infoihioa-at-ns2.mgdots.co} Received: from alexapackages.cc (hn.kd.ny.adsl [42.231.161.203] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x2B8l4H6027055 for {microscopylistserverarchive7-at-microscopy.com} ; Mon, 11 Mar 2019 03:47:06 -0500 DomainKey-Signature: a=rsa-sha1; q=dns; c=nofws; s=key66; d=alexapackages.cc; h=Received:Received:Received:Received:Message-ID:Date:Reply-To:From:User-Agent:X-Accept-Language:MIME-Version:To:Subject:Content-Type:Content-Transfer-Encoding; b=LvIK9fd9Pdhs/QxNwURKqDiZBuaNTPwhBFid5LtRVDQEoqdA6RglIFnS0Z98VvAhI6HQ3ZeUW4tHmtClyCRi8+fNlLt5dVFOgwWwe9eGBx6JUcKaNehVgI4cjml3njwtHmUa/kMBp8gKNbwuvLZVZLd7sWeZtYjCzRbj0cC6P+4=; Received: from [24.231.106.31] by mail.gimmicc.net with SMTP; Mon, 11 Mar 2019 11:41:00 +0300 Received: from qrx.quickslick.com [79.7.64.23] by smtp.endend.nl with SMTP; Mon, 11 Mar 2019 11:28:42 +0300 Received: from mx.reskind.net ([132.162.245.194]) by mtu23.bigping.com with SMTP; Mon, 11 Mar 2019 11:28:12 +0300 Received: from nntp.pinxodet.net ([5.18.90.25]) by rsmail.alkoholic.net with ESMTP; Mon, 11 Mar 2019 11:23:26 +0300 Message-ID: {737DAA4D.0F3E1631-at-alexapackages.cc}
The Center for Advanced Materials Characterization in Oregon (CAMCOR) at the University of Oregon (UO) is looking for a new FIB-SEM Lab Manager. The Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) Lab Manager is involved in all activity within the FIB-SEM facility at the Center for Advanced Material Characterization in Oregon (CAMCOR). This includes providing professional technical management and services to support shared equipment in the CAMCOR laboratories; user training and technical support on SEM, FIB-SEM, and related equipment; overseeing instrument upgrades and maintenance; assisting with course development and teaching of laboratory components; providing analytical services for internal and external clients; and maintaining and conducting facility tours and demonstrations.
Review of applications begins on April 1, 2019 and will remain open until the position is filled. More information about required and preferred qualifications and working at UO can be found at: http://careers.uoregon.edu/cw/en-us/job/523598/fibsem-lab-manager
-Julie
Julie Chouinard CAMCOR Surface Analytical and Microanalytical Facilities 1241 University of Oregon Eugene, OR 97403 jbarkman-at-uoregon.edu (541)-346-4580
==============================Original Headers============================== 5, 46 -- From jbarkman-at-uoregon.edu Mon Mar 11 10:44:45 2019 5, 46 -- Received: from mx0a-000bfd01.pphosted.com (mx0a-000bfd01.pphosted.com [148.163.145.154]) 5, 46 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x2BFijEF016420 5, 46 -- for {Microscopy-at-microscopy.com} ; Mon, 11 Mar 2019 10:44:45 -0500 5, 46 -- Received: from pps.filterd (m0158912.ppops.net [127.0.0.1]) 5, 46 -- by mx0a-000bfd01.pphosted.com (8.16.0.27/8.16.0.27) with SMTP id x2BFjHax030556 5, 46 -- for {Microscopy-at-microscopy.com} ; Mon, 11 Mar 2019 15:54:29 GMT 5, 46 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; d=uoregon.edu; h=mime-version : 5, 46 -- content-type : content-transfer-encoding : date : from : to : subject : 5, 46 -- message-id; s=uoregon.edu; 5, 46 -- bh=f35Qd3TVKtRKEwWEWh83352uNNgrkoHA7acCbNWjTx0=; 5, 46 -- b=WzN7WsPEKAs1O70ZuCRfeUZCnEIxg6/h/6jLLa6HZkasfkETNvL0sE8pncAt4CBSB0W5 5, 46 -- e7b2JV7VwN1hXckPiKOrEl4FGGM+LuvtUasdLqsc7hlT9u7YrQjGQtbT7Y0P4D00e187 5, 46 -- b5R7ymH/sjPYpSa7YJw9xxES/WdItpIujo7HT/Gk7C9A0bL6TLV9YDkDHqzQYlwX8rPl 5, 46 -- 4QkdtkXErQmTys/vIE7HyHO9KpOFpS3R9vhjfdol5677/zYjlilzt77m591i07HFOyiC 5, 46 -- 0SFISeD2B+T+LHbgNN/mWN0RQok7EeDATfpwnX2e1GA7xzJJR4b8ougaY0q/Ju92TvjQ iw== 5, 46 -- Received: from smtp.uoregon.edu (cc-smtp2.uoregon.edu [184.171.108.230]) 5, 46 -- by mx0a-000bfd01.pphosted.com with ESMTP id 2r4512mert-1 5, 46 -- (version=TLSv1.2 cipher=ECDHE-RSA-AES256-GCM-SHA384 bits=256 verify=NOT) 5, 46 -- for {Microscopy-at-microscopy.com} ; Mon, 11 Mar 2019 15:54:29 +0000 5, 46 -- Received: from webmail.uoregon.edu (webmail1.uoregon.edu [128.223.143.235] (may be forged)) 5, 46 -- (authenticated bits=0) 5, 46 -- by smtp.uoregon.edu (8.14.4/8.14.4) with ESMTP id x2BFsS88031528 5, 46 -- (version=TLSv1/SSLv3 cipher=DHE-RSA-AES256-GCM-SHA384 bits=256 verify=NOT) 5, 46 -- for {Microscopy-at-microscopy.com} ; Mon, 11 Mar 2019 08:54:28 -0700 5, 46 -- Received: from 2607:8400:20c6:2:69d6:96cb:d6ef:806e 5, 46 -- by webmail.uoregon.edu 5, 46 -- with HTTP (HTTP/1.1 POST); Mon, 11 Mar 2019 08:54:28 -0700 5, 46 -- MIME-Version: 1.0 5, 46 -- Content-Type: text/plain; charset=US-ASCII; 5, 46 -- format=flowed 5, 46 -- Content-Transfer-Encoding: 7bit 5, 46 -- Date: Mon, 11 Mar 2019 08:54:28 -0700 5, 46 -- From: Julie Chouinard {jbarkman-at-uoregon.edu} 5, 46 -- To: Microscopy-at-microscopy.com 5, 46 -- Subject: FIB-SEM Lab Manager Wanted 5, 46 -- Message-ID: {dcd025d496505729f7658a3743c13b2a-at-uoregon.edu} 5, 46 -- X-Sender: jbarkman-at-uoregon.edu 5, 46 -- User-Agent: Roundcube Webmail/1.1.10 5, 46 -- X-Proofpoint-Virus-Version: vendor=fsecure engine=2.50.10434:,, definitions=2019-03-11_12:,, 5, 46 -- signatures=0 5, 46 -- X-Proofpoint-Spam-Details: rule=notspam policy=default score=0 priorityscore=1501 malwarescore=0 5, 46 -- suspectscore=1 phishscore=0 bulkscore=0 spamscore=0 clxscore=1015 5, 46 -- lowpriorityscore=0 mlxscore=0 impostorscore=0 mlxlogscore=957 adultscore=0 5, 46 -- classifier=spam adjust=-40 reason=mlx scancount=1 engine=8.0.1-1810050000 5, 46 -- definitions=main-1903110113 ==============================End of - Headers==============================
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Email: ralvaradojr-at-ufl.edu Name: Rudy
Organization: University of Florida Title-Subject: [Filtered] LAMP1 antibody on HM20 resin
Message: Has anyone tried immunoEM labeling using LAMP1 antibody on HM20 resin? If you were successful, can you please send me information from that antibody (e.g., brand, type, etc.). Thank you
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Message: Dear Fellow Microscopists: This is to inform you that Southern California Society for Microscopy and Microanalysis (SCSMM) 2019 spring symposium is scheduled for Friday, April 12, 2019 at Cali2 Auditorium, UC Irvine campus. In the past decade microscopy and spectroscopy made major advancements reflected in few recent Nobel Prizes in Chemistry: in 2008 for the discovery and development of the green fluorescent protein; 2014 for the development of super-resolved fluorescence microscopy; 2017 for the cryo electron microscopy and 2018 for the directed evolution of enzymes. We are proud that among contributors to those great achievements are representatives of California: Roger Y. Tsien (2008), Howard Hughes Medical Institute, University of California, San Diego, La Jolla; William E. Moerner (2014) Stanford University, Stanford, CA; Frances H. Arnold (2018) California Institute of Technology, Pasadena. We would like to mark those achievements and are pleased that in our spring symposium we have contribution of the leading hubs representing life sciences in California. We are proud to have Bruce Cohen from Lawrence Berkeley National Laboratory (LBNL, Berkeley) as our 2019 MSA tour speaker. We also have Daniela Boassa from National Center for Microscopy and Imaging Research (NCMIR, San Diego) and Mark Herzik from UCSD (San Diego). Please register no later than 5 p.m. Friday, April 5th: https://imri.uci.edu/content/2019-spring-meeting-registration#overlay-context Check the Next Meeting updates on the website (www.scsmm.org). Annual regular membership is $25 (student $10) and this includes our Spring symposium and fall meeting. On-line registration is required. At the symposium we will have both student platform talks and poster presentations. Please send us your abstracts by March 15, 2019. Students are encouraged to contribute with presentation at the SCSMM meeting. You'll get the chance 1) to win up to $500; 2) become a member of professional society; 3) build up your network; 4) get your presentation at scientific meeting. This year we continue to hold the SCSMM Image Contest. Please send us your images by April 6, 2019. We also have a few prizes for the image contest. For more details, please see SCSMM website (www.scsmm.org) and also follow SCSMM Facebook page. We look forward to seeing you all at the symposium. Sincerely, SCSMM board www.scsmm.org https://www.facebook.com/microscopymicroanalysis
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We pleased to announce that registration is now open for the second annual Next-Generation Transmission Electron Microscopy (NexTEM) workshop, which will be held as a pre-meeting congress for Microscopy and Microanalysis 2019. This event will bring together researchers from diverse backgrounds to present the state-of-the-art in cutting edge electron microscopy tools and related applications. We are excited to again feature distinguished speakers from across the microscopy field.
Specific areas of interest include advanced detector designs for all states of matter, recent developments in electron and phonon optics/instrumentation, in situ and ultrafast TEM, cryo TEM, as well as data analytics and computational methods. Stimulating discussion and presentation of electron microscopy tools at the intersection of these fields will set the stage for advancement in these areas, as well as collaborative approaches to critical scientific issues in materials science, biology and medicine, physics, and chemistry.
Please visit the following link to register: https://www.microscopy.org/MandM/2019/program/congress.cfm
Workshop Topics Include:
Advanced Detector and Spectroscopy Developments * Design and use of novel detectors to investigate material structure and functionality, including 4D STEM and ptychography. * Vibrational and phonon spectroscopies at unprecedented spatial and energy resolution. * Methods to conduct high-resolution imaging and spectroscopy of beam-sensitive samples. * Examination of materials structure and chemistry at cryogenic temperatures.
Frontiers of In Situ / Operando Microscopy * Advances in S/TEM methods and instrumentation to capture the dynamics of complex materials systems, including alloys, thin films, nanoparticles, and liquids. * Investigation of materials under stimulus across a range of sample environments and temperatures. * New workflows for in situ experimentation to ensure reliability, reproducibility, and improve data quality.
Data-Driven Microscopy and Analysis * Machine learning-based analysis of materials structure, dynamics, and defects. * Integration of multiple large-scale imaging and spectroscopic data streams to elucidate physical descriptors of complex systems and phenomena. * High-throughput simulation approaches to guide the interpretation of experimental datasets.
Confirmed Invited Speakers * David Muller, Cornell University * Naoya Shibata, University of Tokyo * Stig Helveg, Haldor Topsoe * Chongmin Wang, Pacific Northwest National Laboratory * Quentin Ramasse, SuperSTEM * Luiz Tizei, Université Paris Sud * Paul Voyles, University of Wisconsin–Madison * Hamish Brown, Lawrence Berkeley National Laboratory * Rama Vasudevan, Oak Ridge National Laboratory
On behalf of the organizers, we look forward to seeing you in Portland!
Steven Spurgeon, Pacific Northwest National Laboratory Demie Kepaptsoglou, SuperSTEM Mitra Taheri, Drexel University
______________________________________ Steven R. Spurgeon, Ph.D. Staff Scientist Energy and Environment Directorate
Pacific Northwest National Laboratory 902 Battelle Boulevard P.O. Box 999 MSIN:P7-25 Richland, WA 99352
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Email: ycding-at-g.ucla.edu Name: Yichen
Organization: UCLA
Title-Subject: [Filtered] Postdoc position
Message: We are now recruiting one postdoc who is interested in optical microscopy, especially light-sheet fluorescence imaging in the Department of Medicine at UCLA. The potential candidate will be responsible for system construction, system control, image analysis and biomedical applications.
For more details, please send your CV and a brief introduction to your background to Tzung (THsiai-at-mednet.ucla.edu) or Yichen (ycding-at-g.ucla.edu). Thank you! Login Host: 149.142.103.215 Listserver Email Form V - 20120416 ---------------------------------------------------------------------------
From buviregi380boha-at-gmail.com Tue Mar 12 19:53:55 2019 Return-Path: {buviregi380boha-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.194] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x2D0rrC7004017 for {microscopylistserverarchive7-at-microscopy.com} ; Tue, 12 Mar 2019 19:53:54 -0500 Received: from unknown (HELO mx.reskind.net) (Wed, 13 Mar 2019 12:46:28 +1200) by smtp.doneohx.com with SMTP; Wed, 13 Mar 2019 12:46:28 +1200 Received: from mxs.perenter.com ([72.36.87.107]) by mx03.listsystemsf.net with SMTP; Wed, 13 Mar 2019 12:33:47 +1200 Received: from smtp.mixedthings.net ([Wed, 13 Mar 2019 12:28:40 +1200]) by mail.naihautsui.co.kr with NNFMP; Wed, 13 Mar 2019 12:28:40 +1200 Received: from [195.33.250.117] by smtp.endend.nl with SMTP; Wed, 13 Mar 2019 12:11:26 +1200 Message-ID: {0D7FC94B.C9273E0D-at-gmail.com}
NIST PML (Physical Measurements Laboratory, Nanoscale Imaging Group) has an active research program on development of in situ scanning electron microscopy characterization and microfabrication of objects and devices in liquids and dense gaseous environments using environmental (micro-) fluidic (flow) cells equipped with electron transparent windows (including graphene). We have excellent experimental opportunities to conduct this research line including an array of dedicated SEM microscopes: JEOL VP 7800 (equipped with: TTL SE, SED, BSE, transmitted electrons, ions detector, EDX, EBIC/EBAC, X-ray microtomography, cooling/ heating stages, flow cells etc), UHV Zeiss SEM (part of Omicron multiprobe UHV system) coupled with AES , XPS, FIB capabilities, Zeiss EVO coupled with micro-Raman spectrometer), clean room micro-fabrication facilities, in-lab sample preparation facilities (Leica 600 sputter/evaporator, AJA sputter/evaporator, UV/plasma cleaning/ashing and etc.
Currently, a postdoctoral position for highly motivated and experienced experimentalist is available.
US citizens are welcomed to explore the related NRC postdoctoral fellowship opportunity: https://na01.safelinks.protection.outlook.com/?url=http%3A%2F%2Fnrc58.nas.edu%2FRAPLab10%2FOpportunity%2FOpportunity.aspx%3FLabCode%3D50%26ROPCD%3D506201%26RONum%3DB8512&data=02%7C01%7Candrei.kolmakov%40nist.gov%7C94654693292e41d2733208d6905af30e%7C2ab5d82fd8fa4797a93e054655c61dec%7C1%7C0%7C636855117643524885&sdata=PFtVSmxf%2BzSAGK%2B7hsz72bRhZznnSePJLqO83VWeEgI%3D&reserved=0
The preferable set of skills includes but not limited to: liquid /atmospheric pressure SEM/TEM, electrochemistry, EBIC, XPS, AES, AFM, UHV surface science protocols, clean room experience, excellent writing and teamwork skills. The letter of interest, CV, with a publication record and contact names of 3-4 references should be sent to Dr. Andrei Kolmakov, andrei.kolmakov-at-nist.gov
Thank you for your interest _______________________________ Andrei Kolmakov Ph.D. Project Leader, Nanoscale Imaging Group Nanoscale Device Characterization Div. Physical Measurements Laboratory,
NIST 100 Bureau Drive Gaithersburg, MD 20899 MS 6204
==============================Original Headers============================== 12, 60 -- From andrei.kolmakov-at-nist.gov Wed Mar 13 09:21:25 2019 12, 60 -- Received: from GCC01-CY1-obe.outbound.protection.outlook.com (mail-eopbgr830124.outbound.protection.outlook.com [40.107.83.124]) 12, 60 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x2DELOrR005328 12, 60 -- for {Microscopy-at-microscopy.com} ; Wed, 13 Mar 2019 09:21:25 -0500 12, 60 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; d=nist.gov; s=selector1; 12, 60 -- h=From:Date:Subject:Message-ID:Content-Type:MIME-Version:X-MS-Exchange-SenderADCheck; 12, 60 -- bh=OqEX7HRdPzKMhwFRtFlN8kUp1HAY57r9jfM0tM5wDrw=; 12, 60 -- b=Q67aI+D/xV+j+zYagseEoRlEc4fdBCfaKv+9avcQqDKdzEqi5kVNlQKqt57FgTy2rOZh3uPCZpW6477rnc9neCBuJkKwYo8UaW06flzmyo+k3JL7oM4EweSsb3LVpzj/kePXiiop71vSLK5I7PUbWFGbYlqwCT9hdYhUVYb/29w= 12, 60 -- Received: from DM2PR09MB0590.namprd09.prod.outlook.com (10.161.252.24) by 12, 60 -- DM2PR09MB0591.namprd09.prod.outlook.com (10.161.252.25) with Microsoft SMTP 12, 60 -- Server (version=TLS1_2, cipher=TLS_ECDHE_RSA_WITH_AES_256_GCM_SHA384) id 12, 60 -- 15.20.1709.13; Wed, 13 Mar 2019 14:31:13 +0000 12, 60 -- Received: from DM2PR09MB0590.namprd09.prod.outlook.com 12, 60 -- ([fe80::8892:8a04:fa1:373f]) by DM2PR09MB0590.namprd09.prod.outlook.com 12, 60 -- ([fe80::8892:8a04:fa1:373f%4]) with mapi id 15.20.1686.021; Wed, 13 Mar 2019 12, 60 -- 14:31:13 +0000 12, 60 -- From: "Kolmakov, Andrei A. (Fed)" {andrei.kolmakov-at-nist.gov} 12, 60 -- To: "Microscopy-at-microscopy.com" {Microscopy-at-microscopy.com} 12, 60 -- Subject: in situ electron microscopy postdoc at NIST 12, 60 -- Thread-Topic: in situ electron microscopy postdoc at NIST 12, 60 -- Thread-Index: AdTZqRGOlf0LdYzCRx6uK5PC/oWpjA== 12, 60 -- Date: Wed, 13 Mar 2019 14:31:13 +0000 12, 60 -- Message-ID: 12, 60 -- {DM2PR09MB059054A3C2AD56B285836C2B874A0-at-DM2PR09MB0590.namprd09.prod.outlook.com} 12, 60 -- Accept-Language: en-US 12, 60 -- Content-Language: en-US 12, 60 -- X-MS-Has-Attach: 12, 60 -- X-MS-TNEF-Correlator: 12, 60 -- authentication-results: spf=none (sender IP is ) 12, 60 -- smtp.mailfrom=andrei.kolmakov-at-nist.gov; 12, 60 -- x-originating-ip: [129.6.135.102] 12, 60 -- x-ms-publictraffictype: Email 12, 60 -- x-ms-office365-filtering-correlation-id: 89cebcf7-cc3f-40da-1555-08d6a7c08b7a 12, 60 -- x-ms-office365-filtering-ht: Tenant 12, 60 -- x-microsoft-antispam: 12, 60 -- BCL:0;PCL:0;RULEID:(2390118)(7020095)(4652040)(8989299)(4534185)(4627221)(201703031133081)(201702281549075)(8990200)(5600127)(711020)(4605104)(4618075)(2017052603328)(7153060)(7193020);SRVR:DM2PR09MB0591; 12, 60 -- x-ms-traffictypediagnostic: DM2PR09MB0591: 12, 60 -- x-ms-exchange-purlcount: 2 12, 60 -- x-microsoft-antispam-prvs: 12, 60 -- {DM2PR09MB0591803773786ABA77C3C822874A0-at-DM2PR09MB0591.namprd09.prod.outlook.com} 12, 60 -- x-forefront-prvs: 09752BC779 12, 60 -- x-forefront-antispam-report: 12, 60 -- SFV:NSPM;SFS:(10019020)(366004)(346002)(136003)(376002)(396003)(39860400002)(199004)(189003)(8936002)(966005)(486006)(476003)(478600001)(14454004)(86362001)(33656002)(2906002)(6116002)(3846002)(316002)(68736007)(4743002)(53936002)(25786009)(6436002)(305945005)(7736002)(5640700003)(6306002)(74316002)(9686003)(6916009)(7696005)(66066001)(81156014)(26005)(8676002)(6506007)(102836004)(186003)(81166006)(52536013)(99286004)(71190400001)(71200400001)(5660300002)(45080400002)(105586002)(106356001)(256004)(2351001)(97736004)(55016002)(2501003);DIR:OUT;SFP:1102;SCL:1;SRVR:DM2PR09MB0591;H:DM2PR09MB0590.namprd09.prod.outlook.com;FPR:;SPF:None;LANG:en;PTR:InfoNoRecords;A:1;MX:1; 12, 60 -- received-spf: None (protection.outlook.com: nist.gov does not designate 12, 60 -- permitted sender hosts) 12, 60 -- x-ms-exchange-senderadcheck: 1 12, 60 -- x-microsoft-antispam-message-info: 12, 60 -- OkovQaQboY6G/nO2f3hzNLgGgzZLMxH5LvVXA8Oema12Vk94/xsF8X8yPxiC3Qe1tjiPppnybj+Cc0cm7829z45c8wy7DTW++iaaHYIEf9y0oxBmAnRnlnvR7Fb6hj6SCD679j9NEbhnS1fykG7eYFqCFU35ZTYJ9k4MfVkKGZVsPexuKEgTjCDno5q1zkq+pUPoUIhBTC6V2B7hul1qBuXhtKjaufL7X5MG/gipqcMpLi++m+F5l9tZmz+ZTUoDlIQAte2GUAhdQ7iL7G2aBf1OVordCDSEfYVvd8bsUkIw5FtpRshnGuwS2AvitfYSEMSKbogbHbnIDIV7z+MenQEc3ymQaDqxP5t0OfD5v3YpdAN42nBDGrvY2n3J10pRANb3e/hvh2bcVmJzk/4xlHWdS0YWYM0B4o9JmWz0hyg= 12, 60 -- Content-Type: text/plain; charset="us-ascii" 12, 60 -- MIME-Version: 1.0 12, 60 -- X-OriginatorOrg: nist.gov 12, 60 -- X-MS-Exchange-CrossTenant-Network-Message-Id: 89cebcf7-cc3f-40da-1555-08d6a7c08b7a 12, 60 -- X-MS-Exchange-CrossTenant-originalarrivaltime: 13 Mar 2019 14:31:13.3676 12, 60 -- (UTC) 12, 60 -- X-MS-Exchange-CrossTenant-fromentityheader: Hosted 12, 60 -- X-MS-Exchange-CrossTenant-id: 2ab5d82f-d8fa-4797-a93e-054655c61dec 12, 60 -- X-MS-Exchange-CrossTenant-mailboxtype: HOSTED 12, 60 -- X-MS-Exchange-Transport-CrossTenantHeadersStamped: DM2PR09MB0591 12, 60 -- Content-Transfer-Encoding: 8bit 12, 60 -- X-MIME-Autoconverted: from quoted-printable to 8bit by microscopy.com id x2DELOrR005328 ==============================End of - Headers==============================
From tammyhoward072mfiec-at-gmail.com Fri Mar 15 05:11:59 2019 Return-Path: {tammyhoward072mfiec-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.161.202] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x2FABuBJ013818 for {microscopylistserverarchive7-at-microscopy.com} ; Fri, 15 Mar 2019 05:11:58 -0500 Received: from relay-x.misswldrs.com ([Fri, 15 Mar 2019 07:13:44 -0300]) by qnx.mdrost.com with SMTP; Fri, 15 Mar 2019 07:13:44 -0300 Message-ID: {E442FAF2.8D784469-at-gmail.com}
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Email: whiteto-at-missouri.edu Name: Tommi White
Organization: University of Missouri Electron Microscopy Core
Title-Subject: [Filtered] Structural Electron Microsocpy: Missouri Symposium for Molecular Biophysics
Message: Dear Microscopy ListServer members
Please join us for the 3rd Missouri Symposium in Molecular Biophysics with a focus on "Structural Electron Microscopy" on April 25-26th, 2019 at the University of Missouri?s Bond Life Sciences Center. University of Missouri System anticipates building our facilities and efforts in the near future in structural electron microscopy. http://emc.missouri.edu/missourisymposium/
The Missouri Symposium will host many leaders in structural biology and electron microscopy. This symposium is targeted both towards the life and material scientist to educate them on the possibilities utilizing future electron microscopy investments and how they can further your research interests. On Thursday April 25th we will have a welcome dinner, participant poster session and keynote address from Dr. Wah Chiu from the SLAC-Stanford CryoEM Center and Friday April 26th will include a day filled with seminars from leaders in this emerging field. Please register in advance ($100/non-student; $50/student) and see our website for more details. We hope you can join us! Below is a very brief summary of the speakers and a representative DOI-link of their work. Please reach out to me with any questions.
Tommi Tommi A. White, Ph.D. Assistant Professor of Biochemistry Director, Electron Microscopy Core Facility University of Missouri W117 Veterinary Medicine Building 1600 East Rollins Street Columbia, MO 65211 573-882-8304 WhiteTo-at-missouri.edu http://emc.missouri.edu
~~~~~~~~~~~~~ Wah Chiu (KEYNOTE) - For over 3 decades Dr. Chiu has lead methodology development for electron cryo-microscopy. His work has made multiple transformational contributions in developing single particle electron cryo-microscopy as a tool for the structural determination of molecular machines towards atomic resolution (DOI:10.1016/j.molcel.2018.02.006).
Elizabeth Wright - has developed novel methods to perform correlative light and electron microscopy at cryogenic temperatures, preserving ultrastructural details to visualize events occurring during viral infection at the micro- and nanoscales, with light and electrons respectively (DOI:10.1017/S1431927618012382).
Todd Yeates - The structure of a protein much smaller than 50 kDa can be successfully visualized when it is attached to a large protein scaffold designed to hold 12 copies of the attached protein in symmetric and rigidly defined orientation (DOI:10.1073/pnas.1718825115).
Tamir Gonen - pioneered the field of "Micro Electron Diffraction" that is garnering much interest from numerous fields for quick high resolution structure determination of crystalline small molecules as well as crystalline proteins (DOI:10.1021/acscentsci.8b00760).
Lena Kourkoutis - develops and applies novel electron microscopy techniques to advance the fundamental understanding of materials and devices, extending the reach of aberration corrected STEM to cryogenic temperature. Operating at low temperatures provides access to a broad range of electronic phases that emerge during cooling of quantum materials and also allows the study of processes that occur at liquid-solid interfaces (DOI:10.1038/s41586-018-0397-3).
Phoebe Stewart - using cryoEM to characterize targeted gene therapy and other nanoscale treatments including viruses, viral/host factor complexes, engineered adenovirus-based vaccines, DNA double-strand break repair complexes, and circadian clock protein complexes (DOI:10.1039/c6nr06948g).
Michael Stowell - studies how neurons communicate and their subsequent alteration upon disease using structural methods (X-ray crystallography, cryoEM and tomography). Recently, he has determined the structure of an ion transporter (DOI:10.1101/505453)
Jeffrey Lengyel - Lead Principal Scientist for Thermofisher Scientific (formerly FEI Company) educating his customers on their microscopy tools and other related cutting-edge technologies (DOI:10.1007/s10969-014-9179-9).
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Dear All: I was wondering if any of you could help with an oft reoccurring problem we have in our facility. We are unfortunate to be in a building where the heating is not well controlled in winter. The temperature our microscopes are in can vary from 60 - 80++ F (well roughly). Ideally, we would like them to be at a temperature of around 74 F, and for that temperature to be as constant as possible. We have managed this in the past by running window AC's but this is not a good solution as the temperature outside can be below freezing, and normal AC's don't work well in those conditions. Opening a window or using a fan is not a good solution as we want the temperature to be stable.
I have looked at all season AC units, but these just seem to be regular ACs with heaters in them, they don't address the problem of how to keep the room cool when the building as a whole is hot and the outside weather is cold.
Suggestions.
Thanks Lloyd Williams
Director Bio-Imaging & Network Core Facilities Hunter College, City University of New York Department of Biological Sciences Rm. 826 HN 695 Park Ave New York, NY 10065 212 650 3872; fax: 212 650-3656
Director Bio-Imaging & Network Core Facilities Hunter College, City University of New York Department of Biological Sciences Rm. 826 HN 695 Park Ave New York, NY 10065 212 650 3872; fax: 212 650-3656
==============================Original Headers============================== 9, 23 -- From Williams-at-GENECTR.HUNTER.CUNY.EDU Fri Mar 15 17:30:40 2019 9, 23 -- Received: from gcmail.hunter.cuny.edu (genemx.hunter.cuny.edu [146.95.150.49]) 9, 23 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x2FMUePr018482 9, 23 -- for {Microscopy-at-Microscopy.Com} ; Fri, 15 Mar 2019 17:30:40 -0500 9, 23 -- Received: from gcmail.bio.hunter.cuny.edu ([169.254.1.88]) by 9, 23 -- genemx.bio.hunter.cuny.edu ([fe80::9481:a04e:9f1c:f509%9]) with mapi id 9, 23 -- 14.03.0439.000; Fri, 15 Mar 2019 18:40:38 -0400 9, 23 -- From: Lloyd Williams {Williams-at-GENECTR.HUNTER.CUNY.EDU} 9, 23 -- To: "Microscopy-at-Microscopy.Com" {Microscopy-at-Microscopy.Com} 9, 23 -- Subject: Cooling A Microscopy Room In Winter 9, 23 -- Thread-Topic: Cooling A Microscopy Room In Winter 9, 23 -- Thread-Index: AdTbf/Fs3Bp382R4TaeabD1MxVkk2Q== 9, 23 -- Date: Fri, 15 Mar 2019 22:40:38 +0000 9, 23 -- Message-ID: {82442657AE7F624586F6FCBFF78E80400127F6F140-at-gcmail.bio.hunter.cuny.edu} 9, 23 -- Accept-Language: en-US 9, 23 -- Content-Language: en-US 9, 23 -- X-MS-Has-Attach: 9, 23 -- X-MS-TNEF-Correlator: 9, 23 -- x-originating-ip: [146.95.148.144] 9, 23 -- Content-Type: text/plain; charset="iso-8859-1" 9, 23 -- MIME-Version: 1.0 9, 23 -- Content-Transfer-Encoding: 8bit 9, 23 -- X-MIME-Autoconverted: from quoted-printable to 8bit by microscopy.com id x2FMUePr018482 ==============================End of - Headers==============================
Department of Physics The University of Illinois at Chicago
845 W Taylor Street, M/C 273 Chicago, IL 60607 Tel: (312) 996-6064 Fax: (312) 996-9016
==============================Original Headers============================== 8, 38 -- From rfklie-at-uic.edu Fri Mar 15 18:08:25 2019 8, 38 -- Received: from mail-wm1-f47.google.com (mail-wm1-f47.google.com [209.85.128.47]) 8, 38 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x2FN8PJb026278 8, 38 -- for {Microscopy-at-microscopy.com} ; Fri, 15 Mar 2019 18:08:25 -0500 8, 38 -- Received: by mail-wm1-f47.google.com with SMTP id x10so7503505wmg.2 8, 38 -- for {Microscopy-at-microscopy.com} ; Fri, 15 Mar 2019 16:18:23 -0700 (PDT) 8, 38 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; 8, 38 -- d=uic.edu; s=google; 8, 38 -- h=mime-version:from:date:message-id:subject:to; 8, 38 -- bh=QrWFtsptjZy0QQUrn5DY4ZGco89tyi1kQN0wSYAgokU=; 8, 38 -- b=evaGX+ueT1kmSY4lDS9yXdOllahgnsKoznhfeZAhoFUQ8f1kUJ8WxF1HxacOZKSCUx 8, 38 -- t+buuMsAlHUEpDoPESZfIjy7vDVwVBM/1sTBcLxQPOFP38o7LpO8e8u/uJk97EfZ0/xf 8, 38 -- HjlZNsSfcUV+Nkvt9lmpB/+QLMGdv9OZaF4tY8svXi3zJ4TU1AV2WwgY9GPxLeWyngHo 8, 38 -- S9U+j9CiyikAxyWI9ftGsr82+F0KHCnJzoN+svcySzpj5sfStg+BuNB8+qMZnOdHJKJz 8, 38 -- 4kvBqzh0Ze9EKnUTWoRMgQUbepm2w6II8hlhkpMcrqiD8ngCe8mzEoa/CKJfl9fxyVDV 8, 38 -- HjzA== 8, 38 -- X-Google-DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; 8, 38 -- d=1e100.net; s=20161025; 8, 38 -- h=x-gm-message-state:mime-version:from:date:message-id:subject:to; 8, 38 -- bh=QrWFtsptjZy0QQUrn5DY4ZGco89tyi1kQN0wSYAgokU=; 8, 38 -- b=Q7HgrwOKQg8VjiLeBlkxttTBAU0RqaITTHAs2rFn6djlNb6Ye6Ty8d9uuEzpRKANRw 8, 38 -- zHPpkqpgjoAp3Wk4MGUR2tR4SZKmc2s+Ae0q/jmDS8sh4rwfKirAgNz2EEdRghGikwkR 8, 38 -- IQLqrw85w+zhdSu2Qpt7XFfX4Q1bn4xNQsifsfVn/U8T82tohinOieivMVboFAnFPTp6 8, 38 -- +tXHSHfewb6CrZE6g6mj43NfArzGkLG0LPOivF4s+5nB3O2GLBovThuVujgnfE5myhws 8, 38 -- 3hPiylRTEEjgKCQ2wstjHneowb/HRSnBWjDQCv6eByMWApJFK28q+qL1OFuX50uY1OjL 8, 38 -- LwbQ== 8, 38 -- X-Gm-Message-State: APjAAAXPF+8uGawm/YQqbqiNjnxh4I+qRMlCOfpEu62t0xyJD21pPy3o 8, 38 -- NQhlVtzEA5ftgNf2d7fSXB4fgwLJLUa9B1UF89nAc9NIO0g= 8, 38 -- X-Google-Smtp-Source: APXvYqygcb7le4bNOiDxKJcwXjdZGhXkIudV0Ve+YONbDU0swBC34L2xzDGfmqLP4cQnzgGgAFG0hQz7Ea7PoNSy2hI= 8, 38 -- X-Received: by 2002:a1c:2ec4:: with SMTP id u187mr3425204wmu.29.1552691902592; 8, 38 -- Fri, 15 Mar 2019 16:18:22 -0700 (PDT) 8, 38 -- MIME-Version: 1.0 8, 38 -- From: Robert Klie {rfklie-at-uic.edu} 8, 38 -- Date: Fri, 15 Mar 2019 18:18:10 -0500 8, 38 -- Message-ID: {CAC9P5VZ=irVzr7OHMNn7YM98WtU4rPfp69-oaVbSUj_8XXj=ZQ-at-mail.gmail.com} 8, 38 -- Subject: Post-doc position in in-situ STEM at the University of Illinois at Chicago 8, 38 -- To: Microscopy-at-microscopy.com 8, 38 -- Content-Type: text/plain; charset="UTF-8" ==============================End of - Headers==============================
From jeverett397ruvde-at-gmail.com Sun Mar 17 13:24:01 2019 Return-Path: {jeverett397ruvde-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.163.198] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x2HIO0lR031598 for {microscopylistserverarchive7-at-microscopy.com} ; Sun, 17 Mar 2019 13:24:01 -0500 Received: from [213.184.241.122] by smtp-server1.cfdenselr.com with SMTP; Mon, 18 Mar 2019 05:27:03 +1100 Received: from unknown (26.80.49.142) by smtp.mixedthings.net with ASMTP; Mon, 18 Mar 2019 05:15:30 +1100 Received: from external.newsubdomain.com ([Mon, 18 Mar 2019 05:09:26 +1100]) by snmp.otwaloow.com with ESMTP; Mon, 18 Mar 2019 05:09:26 +1100 Received: from mtu23.bigping.com [35.85.87.50] by webmail.halftomorrow.com with QMQP; Mon, 18 Mar 2019 04:54:14 +1100 Received: from mtu67.syds.piswix.net ([Mon, 18 Mar 2019 04:48:51 +1100]) by m1.gns.snv.thisdomainl.com with ESMTP; Mon, 18 Mar 2019 04:48:51 +1100 Message-ID: {7222D254.C1C3EFA9-at-gmail.com}
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Quantitative Microanalysis 2019 will be held at the University of Minnesota, Minneapolis June 24-27th. This four day MAS Topical Conference consists of user group meetings followed by a three day plenary meeting covering quantitative microanalysis for beginners to experts, and focusing on EPMA, SEM, and advances in microanalysis. The conference includes tutorials, invited and contributed presentations, laboratory demos, and group discussion.
Our invited speakers to date include: Ben Buse (University of Bristol, UK): Overview of EPMA-WDS and field emission gun EPMA. John Donovan (Probe Software, USA): Compositional mapping. Karsten Goemann (University of Tasmania, Hobart, Australia): Fine tuning SEM for quantitative analysis and combined EDS-WDS Mike Jercinovic (University of Massachusetts, Amherst, USA), EPMA trace element analysis Colin MacRae (CSIRO Mineral Resources, Clayton, Australia): Cathodoluminescence and hydrated mineral analyses William Nachlas (Syracuse University, USA): Standards and reference materials
Early Career Scholar student financial support deadline has been extended to April 1. Reimbursement will be prioritized for those students and early career professionals who submit an abstract for a platform or poster presentation prior to April 1 followed by those students attending the topical conference.
Early bird registration for professionals ends March 31. Register before rates go up!
Look forward to seeing you at QMA 2019!
The QMA 2019 committee
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From trojlita384fagov-at-gmail.com Tue Mar 19 13:38:36 2019 Return-Path: {trojlita384fagov-at-gmail.com} Received: from gmail.com (hn.kd.ny.adsl [42.231.163.193] (may be forged)) by microscopy.com (8.12.11.20060308/8.12.8) with SMTP id x2JIcZLe014654 for {microscopylistserverarchive7-at-microscopy.com} ; Tue, 19 Mar 2019 13:38:36 -0500 Received: from smtp.endend.nl ([Wed, 20 Mar 2019 03:42:37 +0900]) by mtu23.bigping.com with SMTP; Wed, 20 Mar 2019 03:42:37 +0900 Message-ID: {5739F748.287A3EAA-at-gmail.com}
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X-from: Beavers, Roy {rbeavers-at-mail.smu.edu}
Looking for good companies that deal in used petrographic microscopes.
Prefer Nikon or Zeiss scopes that can accommodate high resolution cameras.
I'm working with a sample that is really sensitive to temperatures above room temperature.
I need to polish the sample to make a wedge sample for TEM imaging. I need to glue the sample onto a polisher holder, however i need to find a M-bond, wax, or glue that can be cured at room temperature and will be hard enough so the sample stays in the holder while polishing! Also, easy to be removed with a simple solvent.
The sample is a InSb (semiconductor) substrate. Really brittle and soft as well.
Please let me know if you know of any product and thanks in advance.
Rosa
/─────────//─────────//─────────//───────//─/ /Rosa E. Diaz, PhD/ /Electron Microscopy Research Scientist / /Birck Nanotechnology Center/ /Purdue University/ /1205 W. State Street, West Lafayette, IN 47907-2057 / /Office: BRK-1272 Tel ://765-496-1075/ /─────────//─────────//─────────//───────//─/
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Email: becks-at-ncc.edu Name: Stephen Beck
Organization: Nassau Community College
Title-Subject: [Filtered] Critical Point Dryer Problem
Message: Dear Colleagues,
I have just received a Tousimis 931 critical point dryer to replace a vintage 1992 Polaron Jumbo CPD. I am having problems with residual ethanol in the chamber (large 3.5 diameter) after the completion of the critical point process. Samples are therefore wet and subject to surface tension distortion/collapse. Has anyone else had a similar problem? I have been working with the company tech support and have verified my liquid CO2 tank volume and syphon tube, increased the AUTO purge time from 10 to 15 minutes and verified the metering valve factory settings. Any suggestions are appreciated!
Steve
Stephen J. Beck Professor Coordinator, Bio-Imaging Center Electron Microscopy Department of Biology Nassau Community College Garden City, NY 11530
Login Host: 173.77.159.14 Listserver Email Form V - 20120416 ---------------------------------------------------------------------------
I've had good luck using Loctite 460 super glue. It cures at room temperature in seconds or minutes and can be removed by soaking sample and stub in acetone. Shear strength should be sufficient for tripod/wedge polishing; if not, there is a Loctite 454 super glue that's a bit stronger in shear (from what I understand).
Good luck with your InSb sample. That's not a fun material system to polish.
Cheers, Chris
On Tue, Mar 19, 2019 at 8:49 PM {microscopy.listserver-at-gmail.com} wrote: } } } } } ---------------------------------------------------------------------------- } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html } ---------------------------------------------------------------------------- } } } } } -------- Forwarded Message -------- } } } X-from: Rosa Diaz {rdiazri-at-purdue.edu} } } } } } Hello, } } I'm working with a sample that is really sensitive to temperatures above room temperature. } } I need to polish the sample to make a wedge sample for TEM imaging. I need to glue the sample onto a } polisher holder, however i need to find a M-bond, wax, or glue that can be cured at room temperature } and will be hard enough so the sample stays in the holder while polishing! Also, easy to be removed } with a simple solvent. } } The sample is a InSb (semiconductor) substrate. Really brittle and soft as well. } } } Please let me know if you know of any product and thanks in advance. } } Rosa } } /─────────//─────────//─────────//───────//─/ } /Rosa E. Diaz, PhD/ } /Electron Microscopy Research Scientist / } /Birck Nanotechnology Center/ } /Purdue University/ } /1205 W. State Street, West Lafayette, IN 47907-2057 / } /Office: BRK-1272 Tel ://765-496-1075/ } /─────────//─────────//─────────//───────//─/ } } ==============================Original Headers============================== } 17, 54 -- From microscopy.listserver-at-gmail.com Tue Mar 19 19:37:37 2019 } 17, 54 -- Received: from mail-io1-f51.google.com (mail-io1-f51.google.com [209.85.166.51]) } 17, 54 -- by microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id x2K0bbio031373 } 17, 54 -- for {microscopy-at-microscopy.com} ; Tue, 19 Mar 2019 19:37:37 -0500 } 17, 54 -- Received: by mail-io1-f51.google.com with SMTP id x7so446941ioh.4 } 17, 54 -- for {microscopy-at-microscopy.com} ; Tue, 19 Mar 2019 17:47:49 -0700 (PDT) } 17, 54 -- DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 17, 54 -- d=gmail.com; s=20161025; } 17, 54 -- h=subject:references:to:from:message-id:date:user-agent:mime-version } 17, 54 -- :in-reply-to:content-language:content-transfer-encoding; } 17, 54 -- bh=0tausKRgqohi8nbYstZQ2CU727olIfkNh20AHnkaO5E=; } 17, 54 -- b=CAPwMLPNLrUdiAxVJPYiHeBQv4VW7eteK5NTTVxqQIFZj4hv2lX593fL+V4GtctAbM } 17, 54 -- wudNJ1PNU60Cbu1LIPuegkUXr39t0HgJhFIjzJixuN+xbEHJAyPZWvWN/G7TDo9/Z+Ac } 17, 54 -- u+5R+tUjBf5FSbWeb5xQmlwExI077wlHZd7lXqSXibhJiY0nVFB0mh/l6S83pWk5H7pS } 17, 54 -- A2V7Viix6mXt2SQZFg0F3C9ipAZUMIFrsQKkrVyfyvTt3gtEpfQo8I4hq38TTq/2ZxBO } 17, 54 -- mJXmvrr71RQsUw3qE5ZJ2d5jv7X2OHmr7UV7XP+SA/qzmBpy91noqlvn2EfxaWsJVHg0 } 17, 54 -- imbg== } 17, 54 -- X-Google-DKIM-Signature: v=1; a=rsa-sha256; c=relaxed/relaxed; } 17, 54 -- d=1e100.net; s=20161025; } 17, 54 -- h=x-gm-message-state:subject:references:to:from:message-id:date } 17, 54 -- :user-agent:mime-version:in-reply-to:content-language } 17, 54 -- :content-transfer-encoding; } 17, 54 -- bh=0tausKRgqohi8nbYstZQ2CU727olIfkNh20AHnkaO5E=; } 17, 54 -- b=FV73M5qi+fDAotcK81J/NiqUft65SRhY9osZ0+ob6aJbnv2H27YgwhipJk5rDrGkfB } 17, 54 -- gf/7puUpsE9nDUUzaUVxIVb0VfLEfrogUKP2ExlQzrMrqoBFYTrdlxqvxXqX1rUH2gV5 } 17, 54 -- k0jM6BwiLEU2KXjU41Ou46L4iCZj15yRlNm4z+4fPZK2YSaJMthBTDfeqJXCPZyFZjn3 } 17, 54 -- oXYZfKYz7MJbSt4yJO9T5OJaWngEZxTVr1DpRcvsU7gWz3nYFZNbNFmLSgENUzTkQkOT } 17, 54 -- MWxzwRlMsXodPTX79xiondekkWIVGzVWQPCXEQqp7IQ9Ks8JEkP/dWCVL8o7MareCbo1 } 17, 54 -- BpuQ== } 17, 54 -- X-Gm-Message-State: APjAAAVqOd+HbRo86wnkPbGvpzqP0+2q954n76UwV19fcwkFDDykk1OX } 17, 54 -- KRYhr32wdcsiILCE5c3Kqj/5XNgY } 17, 54 -- X-Google-Smtp-Source: APXvYqx4/gQu3rI1HshczdKuHzIXepkz7bBxBxShoUu7LX+aJJdbBy8404PKStOTKEC/pZAWg9Ta5A== } 17, 54 -- X-Received: by 2002:a6b:4e10:: with SMTP id c16mr3306167iob.18.1553042868516; } 17, 54 -- Tue, 19 Mar 2019 17:47:48 -0700 (PDT) } 17, 54 -- Received: from 96-65-115-77-static.hfc.comcastbusiness.net ([2603:300a:f04:7100:1513:8f3a:6d4a:b63]) } 17, 54 -- by smtp.googlemail.com with ESMTPSA id o129sm2715126ito.0.2019.03.19.17.47.47 } 17, 54 -- for {microscopy-at-microscopy.com} } 17, 54 -- (version=TLS1_2 cipher=ECDHE-RSA-AES128-GCM-SHA256 bits=128/128); } 17, 54 -- Tue, 19 Mar 2019 17:47:47 -0700 (PDT) } 17, 54 -- Subject: Fwd: Help finding a wax, glue, or M-bond that works at room } 17, 54 -- temperature } 17, 54 -- References: {CAC05CpJFuLGjqRRC0CxtnuXmDzx59pR8hg9Yg+Z=YSj7-X2dQQ-at-mail.gmail.com} } 17, 54 -- To: MicroscopyListServer-Forward {microscopy-at-microscopy.com} } 17, 54 -- From: MIcroscopyListserver {microscopy.listserver-at-gmail.com} } 17, 54 -- X-Forwarded-Message-Id: {CAC05CpJFuLGjqRRC0CxtnuXmDzx59pR8hg9Yg+Z=YSj7-X2dQQ-at-mail.gmail.com} } 17, 54 -- Message-ID: {efb6f871-3839-042e-d8b7-732232facb1c-at-gmail.com} } 17, 54 -- Date: Tue, 19 Mar 2019 19:47:47 -0500 } 17, 54 -- User-Agent: Mozilla/5.0 (Macintosh; Intel Mac OS X 10.14; rv:60.0) } 17, 54 -- Gecko/20100101 Thunderbird/60.5.3 } 17, 54 -- MIME-Version: 1.0 } 17, 54 -- In-Reply-To: {CAC05CpJFuLGjqRRC0CxtnuXmDzx59pR8hg9Yg+Z=YSj7-X2dQQ-at-mail.gmail.com} } 17, 54 -- Content-Type: text/plain; charset=utf-8; format=flowed } 17, 54 -- Content-Language: en-US } 17, 54 -- Content-Transfer-Encoding: 8bit } ==============================End of - Headers==============================
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I'd recommend trying a considerably longer purge time. We have an older Tousimis 815 with a smaller chamber (1.25 inches), and our standard purge time is 20 min, extended to 30-35 min for larger samples. By "large" I mean maybe 60x40x30 mm dimensions. It does mean you chew through the liquid CO2, but better than losing precious samples.
cheers, Rosemary
Dr Rosemary White CSIRO Black Mountain GPO Box 1700 Canberra, ACT 2601 Australia
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X-from: becks-at-ncc.edu
This Question/Comment was submitted to the Microscopy Listserver using the WWW based Form at http://wwww.microscopy.com/MLFormMail.html --------------------------------------------------------------------------- Remember this posting is most likely not from a Subscriber, so when replying please copy to both becks-at-ncc.edu, Microscopy-at-Microscopy.com so that all Microscopy Listserver Subscribers can benefit from our collective wisdom ---------------------------------------------------------------------------
Email: becks-at-ncc.edu Name: Stephen Beck
Organization: Nassau Community College
Title-Subject: [Filtered] Critical Point Dryer Problem
Message: Dear Colleagues,
I have just received a Tousimis 931 critical point dryer to replace a vintage 1992 Polaron Jumbo CPD. I am having problems with residual ethanol in the chamber (large 3.5” diameter) after the completion of the critical point process. Samples are therefore wet and subject to surface tension distortion/collapse. Has anyone else had a similar problem? I have been working with the company tech support and have verified my liquid CO2 tank volume and syphon tube, increased the AUTO purge time from 10 to 15 minutes and verified the metering valve factory settings. Any suggestions are appreciated!
Steve
Stephen J. Beck Professor Coordinator, Bio-Imaging Center Electron Microscopy Department of Biology Nassau Community College Garden City, NY 11530
Login Host: 173.77.159.14 Listserver Email Form V - 20120416 ---------------------------------------------------------------------------
Keep checking on eBay. I’ve seen great petrographic and ore microscopes made by Leitz and Zeiss for $1,500. And don’t overlook your local university surplus auctions. The parts for all these scopes will be available for decades via surplus inventories.
Sent from Mail {https://go.microsoft.com/fwlink/?LinkId=550986} for Windows 10
*From: *microscopy.listserver-at-gmail.com {mailto:microscopy.listserver-at-gmail.com} *Sent: *Tuesday, March 19, 2019 5:49 PM *To: *cannonmp-at-comcast.net {mailto:cannonmp-at-comcast.net} *Subject: *[Microscopy] Fwd: Good source for used petrographic microscopes
Hello Steve, We had similar problem some years ago, when we have to replace our old Balzers 010 CPD unit. In the new unit there was a minor leak in one valve. We find it out, after careful searching of the drying process. Due to the leak the pressure in the chamber was just bellow or oscillating around the critical pressure value. The unit has an analog pressure meter and it was hard to see it on the analog meter. After replacement of the leaky fitting, all is working fine.
Regards
Oldrich
-- Oldřich Benada Institute of Microbiology, Czech Acad. Sci. Laboratory of Molecular Structure Characterization Electron Microscopy Group Vídeňská 1083 142 20 Prague 4 Czech Republic
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